Computationally efficient modeling and simulation of large scale systems

A method of simulating operation of a VLSI interconnect structure having capacitive and inductive coupling between nodes thereof. A matrix X and a matrix Y containing different combinations of passive circuit element values for the interconnect structure are obtained where the element values for each matrix include inductance L and inverse capacitance P. An adjacency matrix A associated with the interconnect structure is obtained. Numerical integration is used to solve first and second equations, each including as a factor the product of the inverse matrix X.sup.1 and at least one other matrix, with first equation including X.sup.1Y, X.sup.1A, and X.sup.1P, and the second equation including X.sup.1A and X.sup.1P

Modeling multi-layer via structure using PEEC method

In this dissertation, a new integral equation formulation for via structures is developed for the capacitance extraction between vias and planes. The proposed method can be used to calculate the shared-antipad via structure which is widely used in highspeed differential signal interconnects. In addition, we use the image theory to handle inhomogeneous media. Further, a new technique is given to reduce computational resources for via-to-plane structures based on properties of the matrix coefficient. The extracted capacitance is also incorporated into the physics-based circuit model to characterize the overall performance of the via transition. In the second paper, a rigorous modeling of the shared-antipad via structure is developed using surface partial element equivalent circuit (PEEC). The cavity Green\u27s function is used to evaluate the equivalent circuit elements, thereby requiring fewer cells for numerical computation. The non-orthogonal, quadrilateral cell is used in the mesh to better accommodate the non-rectangular shape of the via and the antipad. A novel wave port excitation method is applied to the equivalent circuit to obtain the network parameters of the via transition. The Z-parameters of the via structure are calculated using the proposed method, and the results are validated with the finite element solution obtained from commercial software. In the third paper, an effective methodology is proposed to estimate the RF interference received by an antenna due to near-field coupling using divide-and-conquer based on reciprocity. The proposed methodology fits well with engineering practice, and is particularly suitable for pre-layout wireless system design and planning --Abstract, page iv

A divide-and-conquer method for 3D capacitance extraction

This thesis describes a divide-and-conquer algorithm to improve the 3D boundary element method (BEM) for capacitance extraction. We divide large interconnect structures into small sections, set new boundary conditions using the borderfor each section, solve each section, and then combine the results to derive the capacitance. The target application is critical nets where 3D accuracy is required. The new algorithm is a significant improvement over the traditional BEMs and their enhancements, such as the "window" method where conductors far away are dropped, and the "shield" method where conductors hidden behind other conductors are dropped. Experimental results show that our algorithm is 25 times faster than the traditional BEM and 5 times faster than the window+shield method, for medium to large structures. The error of the capacitance computed by the new algorithm is within 2% for self capacitance and 7% for coupling capacitance, compared with the results obtained by solving the entire system using BEM. Furthermore, our algorithms gives accurate distributed RC, where none of the previous 3D BEM algorithms and their enhancements can

Computationally Efficient Modeling and Simulation of Large Scale Systems

A system for simulating operation of a VLSI interconnect structure having capacitive and inductive coupling between nodes thereof, including a processor, and a memory, the processor configured to perform obtaining a matrix X and a matrix Y containing different combinations of passive circuit element values for the interconnect structure, the element values for each matrix including inductance L and inverse capacitance P, obtaining an adjacency matrix A associated with the interconnect structure, storing the matrices X, Y, and A in the memory, and performing numerical integration to solve first and second equations

Early warning fault detection using artificial intelligent methods

This paper describes a research investigation to access the feasibility of using an Artificial Intelligence (AI) method to predict and detect faults at an early stage in power systems. An AI based detector has been developed to monitor and predict faults at an early stage on particular sections of power systems. The detector for this early warning fault detection device only requires external measurements taken from the input and output nodes of the power system. The AI detection system is capable of rapidly predicting a malfunction within the system. Artificial Neural Networks (ANNs) are being used as the core of the fault detector. A simulated medium length transmission line has been tested by the detector and the results demonstrate the capability of the detector. Furthermore, comments on an evolutionary technique as the optimisation strategy for ANNs are included in this paper

On Co-Optimization Of Constrained Satisfiability Problems For Hardware Software Applications

Manufacturing technology has permitted an exponential growth in transistor count and density. However, making efficient use of the available transistors in the design has become exceedingly difficult. Standard design flow involves synthesis, verification, placement and routing followed by final tape out of the design. Due to the presence of various undesirable effects like capacitive crosstalk, supply noise, high temperatures, etc., verification/validation of the design has become a challenging problem. Therefore, having a good design convergence may not be possible within the target time, due to a need for a large number of design iterations. Capacitive crosstalk is one of the major causes of design convergence problems in deep sub-micron era. With scaling, the number of crosstalk violations has been increasing because of reduced inter-wire distances. Consequently only the most severe crosstalk faults are fixed pre-silicon while the rest are tested post-silicon. Testing for capacitive crosstalk involves generation of input patterns which can be applied post-silicon to the integrated circuit and comparison of the output response. These patterns are generated at the gate/ Register Transfer Level (RTL) of abstraction using Automatic Test Pattern Generation (ATPG) tools. In this dissertation, anInteger Linear Programming (ILP) based ATPG technique for maximizing crosstalk induced delay increase at the victim net, for multiple aggressor crosstalk faults, is presented. Moreover, various solutions for pattern generation considering both zero as well as unit delay models is also proposed. With voltage scaling, power supply switching noise has become one of the leading causes of signal integrity related failures in deep sub-micron designs. Hence, during power supply network design and analysis of power supply switching noise, computation of peak supply current is an essential step. Traditional peak current estimation approaches involve addition of peak current associated with all the CMOS gates which are switching in a combinational circuit. Consequently, this approach does not take the Boolean and temporal relationships of the circuit into account. This work presents an ILP based technique for generation of an input pattern pair which maximizes switching supply currents for a combinational circuit in the presence of integer gate delays. The input pattern pair generated using the above approach can be applied post-silicon for power droop testing. With high level of integration, Multi-Processor Systems on Chip (MPSoC) feature multiple processor cores and accelerators on the same die, so as to exploit the instruction level parallelism in the application. For hardware-software co-design, application programming model is based on a Task Graph, which represents task dependencies and execution/transfer times for various threads and processes within an application. Mapping an application to an MPSoC traditionally involves representing it in the form of a task graph and employing static scheduling in order to minimize the schedule length. Dynamic system behavior is not taken into consideration during static scheduling, while dynamic scheduling requires the knowledge of task graph at runtime. A run-time task graph extraction heuristic to facilitate dynamic scheduling is also presented here. A novel game theory based approach uses this extracted task graph to perform run-time scheduling in order to minimize total schedule length. With increase in transistor density, power density has gone up substantially. This has lead to generation of regions with very high temperature called Hotspots. Hotspots lead to reliability and performance issues and affect design convergence. In current generation Integrated Circuits (ICs) temperature is controlled by reducing power dissipation using Dynamic Thermal Management (DTM) techniques like frequency and/or voltage scaling. These techniques are reactive in nature and have detrimental effects on performance. Here, a look-ahead based task migration technique is proposed, in order to utilize the multitude of cores available in an MPSoC to eliminate thermal emergencies. Our technique is based on temperature prediction, leveraging upon a novel wavelet based thermal modeling approach. Hence, this work addresses several optimization problems that can be reduced to constrained max-satisfiability, involving integer as well as Boolean constraints in hardware and software domains. Moreover, it provides domain specific heuristic solutions for each of them

System level power integrity transient analysis using a physics-based approach

With decreasing supply voltage level and massive demanding current on system chipset, power integrity design becomes more and more critical for system stability. The ultimate goal of well-designed power delivery network (PDN) is to deliver desired voltage level from the source to destination, in other words, to minimize voltage noise delivered to digital devices. The thesis is composed of three parts. The first part focuses on-die level power models including simplified chip power model (CPM) for system level analysis and the worst scenario current profile. The second part of this work introduces the physics-based equivalent circuit model to simplify the passive PDN model to RLC circuit netlist, to be compatible with any spice simulators and tremendously boost simulation speed. Then a novel system/chip level end-to-end transient model is proposed, including the die model and passive PDN model discussed in previous two chapters as well as a SIMPLIS based small signal VRM model. In the last part of the thesis, how to model voltage regulator module (VRM) is explicitly discussed. Different linear approximated VRM modeling approaches have been compared with the SIMPLIS small signal VRM model in both frequency domain and time domain. The comparison provides PI engineers a guideline to choose specific VRM model under specific circumstances. Finally yet importantly, a PDN optimization example was given. Other than previous PDN optimization approaches, a novel hybrid target impedance concept was proposed in this thesis, in order to improve system level PDN optimization process --Abstract, page iv

Study Of The Relationship Between Delta Delay And Adjacent Parallel Wire Length In 45 Nanometer Process Technology

Hierarchical design spans the complete framework of a design flow from Register Transfer Level (RTL), synthesis, place and route, timing closure and various other analyses before sign-off. Finer geometries and increasing interconnect density however have resulted signal integrity becoming the key issue for Deep Sub-Micron design. Post silicon bug due to noise and signal integrity can be prevented and fixed at early stage of the IC design cycle. The purpose of this research is to establish a preventive measurement for adjacent wire that can travel in parallel for 45nm technology. The intention is to ensure that a complex design can be delivered to the market with accurate, fast and trusted analysis and provide sign-off solution. Main approach is to conduct the relationship study between delta delay and adjacent parallel wire in 45 nanometer (nm) process technology and provide a preventive measurement to limit the adjacent wire can travel in parallel. The design is explored thoroughly to study the relationship between delay noise and adjacent parallel wire. The correlation is translated into an equation to estimate the delay noise produced with a certain length of adjacent parallel wire

Macro-model of through silicon vias (tsvs) arrays

As continued scaling down of transistors becomes increasingly difficult due to physical and technical issues like the increase of leakage power and total power consumption, overall, 3D integration is now considered a viable solution to get a higher bandwidth and power efficiency. Use of Through-silicon-vias (TSVs), which connects stacked structures die-to-die, is expected to be one of the most important techniques enabling 3D integration. As the number of through silicon Vias (TSVs) exists in the same chip is increasing, an algorithm to build a macro-model is needed to find inter-relationship between TSVs. There are different coupling parameters that exist between TSVs like: capacitive, inductive and resistive coupling. This work provides an algorithm to build a macro-model of an array of TSVs where only capacitive coupling is considered, as it is expected to be the dominating parameter.Using a simulation based technique, where characterization for bundles of TSVs were done and a scaling equation that can give the variationsoccur to capacitance value with scaling the physical dimensions of the TSV (pitch, radius, length and dielectric thickness (tox)) is proposed. The considered ranges for the physical parameters are: radius (from 1um to 10um), tox (from 0.1um to 0.5 um), length (from 10um to 100um) and pitch (from 10um to 95um). Using theproposed algorithm, a macro model can be built in a negligible time, which provides lots of time saving compared to hours required by other tools such as EM simulators or device simulators. The average error range 3% to 6%and a maximum cumulative error of algorithm and usage of scaling equation is 18.2% that occurs at very few dimensions and in very few capacitances from the extracted capacitance values, for both self and coupling capacitance