Empirical timing analysis of CPUs and delay fault tolerant design using partial redundancy

The operating clock frequency is determined by the longest signal propagation delay, setup/hold time, and timing margin. These are becoming less predictable with the increasing design complexity and process miniaturization. The difficult challenge is then to ensure that a device operating at its clock frequency is error-free with quantifiable assurance. Effort at device-level engineering will not suffice for these circuits exhibiting wide process variation and heightened sensitivities to operating condition stress. Logic-level redress of this issue is a necessity and we propose a design-level remedy for this timing-uncertainty problem. The aim of the design and analysis approaches presented in this dissertation is to provide framework, SABRE, wherein an increased operating clock frequency can be achieved. The approach is a combination of analytical modeling, experimental analy- sis, hardware /time-redundancy design, exception handling and recovery techniques. Our proposed design replicates only a necessary part of the original circuit to avoid high hardware overhead as in triple-modular-redundancy (TMR). The timing-critical combinational circuit is path-wise partitioned into two sections. The combinational circuits associated with long paths are laid out without any intrusion except for the fan-out connections from the first section of the circuit to a replicated second section of the combinational circuit. Thus only the second section of the circuit is replicated. The signals fanning out from the first section are latches, and thus are far shorter than the paths spanning the entire combinational circuit. The replicated circuit is timed at a subsequent clock cycle to ascertain relaxed timing paths. This insures that the likelihood of mistiming due to stress or process variation is eliminated. During the subsequent clock cycle, the outcome of the two logically identical, yet time-interleaved, circuit outputs are compared to detect faults. When a fault is detected, the retry sig- nal is triggered and the dynamic frequency-step-down takes place before a pipe flush, and retry is issued. The significant timing overhead associated with the retry is offset by the rarity of the timing violation events. Simulation results on ISCAS Benchmark circuits show that 10% of clock frequency gain is possible with 10 to 20 % of hardware overhead of replicated timing-critical circuit

Time-efficient fault detection and diagnosis system for analog circuits

Time-efficient fault analysis and diagnosis of analog circuits are the most important prerequisites to achieve online health monitoring of electronic equipments, which are involving continuing challenges of ultra-large-scale integration, component tolerance, limited test points but multiple faults. This work reports an FPGA (field programmable gate array)-based analog fault diagnostic system by applying two-dimensional information fusion, two-port network analysis and interval math theory. The proposed system has three advantages over traditional ones. First, it possesses high processing speed and smart circuit size as the embedded algorithms execute parallel on FPGA. Second, the hardware structure has a good compatibility with other diagnostic algorithms. Third, the equipped Ethernet interface enhances its flexibility for remote monitoring and controlling. The experimental results obtained from two realistic example circuits indicate that the proposed methodology had yielded competitive performance in both diagnosis accuracy and time-effectiveness, with about 96% accuracy while within 60 ms computational time.Peer reviewedFinal Published versio

Microfluidic cartridge with integrated array of amorphous silicon photosensors for chemiluminescence detection of viral DNA

Portable and simple analytical devices based on microfluidics with chemiluminescence detection are particularly attractive for point-of-care applications, offering high detectability and specificity in a simple and miniaturized analytical format. Particularly relevant for infectious disease diagnosis is the ability to sensitively and specifically detect target nucleic acid sequences in biological fluids. To reach the goal of real-life applications for such devices, however, several technological challenges related to full device integration are still to be solved, one key aspect regarding on-chip integration of the chemiluminescence signal detection device. Nowadays, the most promising approach is on-chip integration of thin-film photosensors. We recently proposed a portable cartridge with microwells aligned with an array of hydrogenated amorphous silicon (a-Si:H) photosensors, reaching attomole level limits of detection for different chemiluminescence model reactions. Herein, we explore its applicability and performance for multiplex and quantitative detection of viral DNA. In particular, the cartridge was modified to accommodate microfluidic channels and, upon immobilization of three oligonucleotide probes in different positions along each channel, each specific for a genotype of Parvovirus B19, viral nucleic acid sequences were captured and detected. With this system, taking advantage of oligoprobes specificity, chemiluminescence detectability, and photosensor sensitivity, accurate quantification of target analytes down to 70 pmol L-1 was obtained for each B19 DNA genotype, with high specificity and multiplexing ability. Results confirm the good detection capabilities and assay applicability of the proposed system, prompting the development of innovative portable analytical devices with enhanced sensitivity and multiplexed capabilities

Construction and commissioning of a technological prototype of a high-granularity semi-digital hadronic calorimeter

A large prototype of 1.3m3 was designed and built as a demonstrator of the semi-digital hadronic calorimeter (SDHCAL) concept proposed for the future ILC experiments. The prototype is a sampling hadronic calorimeter of 48 units. Each unit is built of an active layer made of 1m2 Glass Resistive Plate Chamber(GRPC) detector placed inside a cassette whose walls are made of stainless steel. The cassette contains also the electronics used to read out the GRPC detector. The lateral granularity of the active layer is provided by the electronics pick-up pads of 1cm2 each. The cassettes are inserted into a self-supporting mechanical structure built also of stainless steel plates which, with the cassettes walls, play the role of the absorber. The prototype was designed to be very compact and important efforts were made to minimize the number of services cables to optimize the efficiency of the Particle Flow Algorithm techniques to be used in the future ILC experiments. The different components of the SDHCAL prototype were studied individually and strict criteria were applied for the final selection of these components. Basic calibration procedures were performed after the prototype assembling. The prototype is the first of a series of new-generation detectors equipped with a power-pulsing mode intended to reduce the power consumption of this highly granular detector. A dedicated acquisition system was developed to deal with the output of more than 440000 electronics channels in both trigger and triggerless modes. After its completion in 2011, the prototype was commissioned using cosmic rays and particles beams at CERN.Comment: 49 pages, 41 figure

On Co-Optimization Of Constrained Satisfiability Problems For Hardware Software Applications

Manufacturing technology has permitted an exponential growth in transistor count and density. However, making efficient use of the available transistors in the design has become exceedingly difficult. Standard design flow involves synthesis, verification, placement and routing followed by final tape out of the design. Due to the presence of various undesirable effects like capacitive crosstalk, supply noise, high temperatures, etc., verification/validation of the design has become a challenging problem. Therefore, having a good design convergence may not be possible within the target time, due to a need for a large number of design iterations. Capacitive crosstalk is one of the major causes of design convergence problems in deep sub-micron era. With scaling, the number of crosstalk violations has been increasing because of reduced inter-wire distances. Consequently only the most severe crosstalk faults are fixed pre-silicon while the rest are tested post-silicon. Testing for capacitive crosstalk involves generation of input patterns which can be applied post-silicon to the integrated circuit and comparison of the output response. These patterns are generated at the gate/ Register Transfer Level (RTL) of abstraction using Automatic Test Pattern Generation (ATPG) tools. In this dissertation, anInteger Linear Programming (ILP) based ATPG technique for maximizing crosstalk induced delay increase at the victim net, for multiple aggressor crosstalk faults, is presented. Moreover, various solutions for pattern generation considering both zero as well as unit delay models is also proposed. With voltage scaling, power supply switching noise has become one of the leading causes of signal integrity related failures in deep sub-micron designs. Hence, during power supply network design and analysis of power supply switching noise, computation of peak supply current is an essential step. Traditional peak current estimation approaches involve addition of peak current associated with all the CMOS gates which are switching in a combinational circuit. Consequently, this approach does not take the Boolean and temporal relationships of the circuit into account. This work presents an ILP based technique for generation of an input pattern pair which maximizes switching supply currents for a combinational circuit in the presence of integer gate delays. The input pattern pair generated using the above approach can be applied post-silicon for power droop testing. With high level of integration, Multi-Processor Systems on Chip (MPSoC) feature multiple processor cores and accelerators on the same die, so as to exploit the instruction level parallelism in the application. For hardware-software co-design, application programming model is based on a Task Graph, which represents task dependencies and execution/transfer times for various threads and processes within an application. Mapping an application to an MPSoC traditionally involves representing it in the form of a task graph and employing static scheduling in order to minimize the schedule length. Dynamic system behavior is not taken into consideration during static scheduling, while dynamic scheduling requires the knowledge of task graph at runtime. A run-time task graph extraction heuristic to facilitate dynamic scheduling is also presented here. A novel game theory based approach uses this extracted task graph to perform run-time scheduling in order to minimize total schedule length. With increase in transistor density, power density has gone up substantially. This has lead to generation of regions with very high temperature called Hotspots. Hotspots lead to reliability and performance issues and affect design convergence. In current generation Integrated Circuits (ICs) temperature is controlled by reducing power dissipation using Dynamic Thermal Management (DTM) techniques like frequency and/or voltage scaling. These techniques are reactive in nature and have detrimental effects on performance. Here, a look-ahead based task migration technique is proposed, in order to utilize the multitude of cores available in an MPSoC to eliminate thermal emergencies. Our technique is based on temperature prediction, leveraging upon a novel wavelet based thermal modeling approach. Hence, this work addresses several optimization problems that can be reduced to constrained max-satisfiability, involving integer as well as Boolean constraints in hardware and software domains. Moreover, it provides domain specific heuristic solutions for each of them

Maximizing Crosstalk-Induced Slowdown During Path Delay Test

Capacitive crosstalk between adjacent signal wires in integrated circuits may lead to noise or a speedup or slowdown in signal transitions. These in turn may lead to circuit failure or reduced operating speed. This thesis focuses on generating test patterns to induce crosstalk-induced signal delays, in order to determine whether the circuit can still meet its timing specification. A timing-driven test generator is developed to sensitize multiple aligned aggressors coupled to a delay-sensitive victim path to detect the combination of a delay spot defect and crosstalk-induced slowdown. The framework uses parasitic capacitance information, timing windows and crosstalk-induced delay estimates to screen out unaligned or ineffective aggressors coupled to a victim path, speeding up crosstalk pattern generation. In order to induce maximum crosstalk slowdown along a path, aggressors are prioritized based on their potential delay increase and timing alignment. The test generation engine introduces the concept of alignment-driven path sensitization to generate paths from inputs to coupled aggressor nets that meet timing alignment and direction requirements. By using path delay information obtained from circuit preprocessing, preferred paths can be chosen during aggressor path propagation processes. As the test generator sensitizes aggressors in the presence of victim path necessary assignments, the search space is effectively reduced for aggressor path generation. This helps in reducing the test generation time for aligned aggressors. In addition, two new crosstalk-driven dynamic test compaction algorithms are developed to control the increase in test pattern count. The proposed test generation algorithm is applied to ISCAS85 and ISCAS89 benchmark circuits. SPICE simulation results demonstrate the ability of the alignment-driven test generator to increase crosstalk-induced delays along victim paths

component of this work in other works. Area-Efficient Synthesis of Fault-Secure NoC Switches

This article may be used for research, teaching and private study purposes. Any substantial or systematic reproduction, re-distribution, re-selling, loan or sub-licensing, systematic supply or distribution in any form to anyone is expressly forbidden

Achieving Reliable and Sustainable Next-Generation Memories

Conventional memory technology scaling has introduced reliability challenges due to dysfunctional, improperly formed cells and crosstalk from increased cell proximity. Furthermore, as the manufacturing effort becomes increasingly complex due to these deeply scaled technologies, holistic sustainability is negatively impacted. The development of new memory technologies can help overcome the capacitor scaling limitations of DRAM. However, these technologies have their own reliability concerns, such as limited write endurance in the case of Phase Change Memories (PCM). Moreover, emerging system requirements, such as in-memory encryption to protect sensitive or private data and operation in harsh environments create additional challenges that must be addressed in the context of reliability and sustainability. This dissertation provides new multifactor and ultimately unified solutions to address many of these concerns in the same system. In particular, my contributions toward mitigating these issues are as follows. I present GreenChip and GreenAsic, which together provide the first tools to holistically evaluate new computer architecture, chip, and memory design concepts for sustainability. These tools provide detailed estimates of manufacturing and operational-phase metrics for different computing workloads and deployment scenarios. Using GreenChip, I examined existing DRAM reliability techniques in the context of their holistic sustainability impact, including my own technique to mitigate bitline crosstalk. For PCM, I provided a new reliability technique with no additional storage overhead that substantially increases the lifetime of an encrypted memory system. To provide bit-level error correction, I developed compact linked-list and Bloom-filter-based bit-level fault map structures, that provide unprecedented levels of error tabulation, combined with my own novel error correction and lifetime extension approaches based on these maps for less area than traditional ECC. In particular, FaME, can correct N faults using N bits when utilizing a bit-level fault map. For operation in harsh environments, I created a triple modular redundancy (TMR) pointer-based fault map, HOTH, which specifically protects cells shown to be weak to radiation. Finally, to combine the analyses of holistic sustainability and memory lifetime, I created the LARS technique, which adjusts the GreenChip indifference analysis to account for the additional sustainability benefit provided by increased reliability and lifetime

Network-on-Chip

Addresses the Challenges Associated with System-on-Chip Integration Network-on-Chip: The Next Generation of System-on-Chip Integration examines the current issues restricting chip-on-chip communication efficiency, and explores Network-on-chip (NoC), a promising alternative that equips designers with the capability to produce a scalable, reusable, and high-performance communication backbone by allowing for the integration of a large number of cores on a single system-on-chip (SoC). This book provides a basic overview of topics associated with NoC-based design: communication infrastructure design, communication methodology, evaluation framework, and mapping of applications onto NoC. It details the design and evaluation of different proposed NoC structures, low-power techniques, signal integrity and reliability issues, application mapping, testing, and future trends. Utilizing examples of chips that have been implemented in industry and academia, this text presents the full architectural design of components verified through implementation in industrial CAD tools. It describes NoC research and developments, incorporates theoretical proofs strengthening the analysis procedures, and includes algorithms used in NoC design and synthesis. In addition, it considers other upcoming NoC issues, such as low-power NoC design, signal integrity issues, NoC testing, reconfiguration, synthesis, and 3-D NoC design. This text comprises 12 chapters and covers: The evolution of NoC from SoC—its research and developmental challenges NoC protocols, elaborating flow control, available network topologies, routing mechanisms, fault tolerance, quality-of-service support, and the design of network interfaces The router design strategies followed in NoCs The evaluation mechanism of NoC architectures The application mapping strategies followed in NoCs Low-power design techniques specifically followed in NoCs The signal integrity and reliability issues of NoC The details of NoC testing strategies reported so far The problem of synthesizing application-specific NoCs Reconfigurable NoC design issues Direction of future research and development in the field of NoC Network-on-Chip: The Next Generation of System-on-Chip Integration covers the basic topics, technology, and future trends relevant to NoC-based design, and can be used by engineers, students, and researchers and other industry professionals interested in computer architecture, embedded systems, and parallel/distributed systems

Empirical timing analysis of CPUs and delay fault tolerant design using partial redundancy

The operating clock frequency is determined by the longest signal propagation delay, setup/hold time, and timing margin. These are becoming less predictable with the increasing design complexity and process miniaturization. The difficult challenge is then to ensure that a device operating at its clock frequency is error-free with quantifiable assurance. Effort at device-level engineering will not suffice for these circuits exhibiting wide process variation and heightened sensitivities to operating condition stress. Logic-level redress of this issue is a necessity and we propose a design-level remedy for this timing-uncertainty problem. The aim of the design and analysis approaches presented in this dissertation is to provide framework, SABRE, wherein an increased operating clock frequency can be achieved. The approach is a combination of analytical modeling, experimental analy- sis, hardware /time-redundancy design, exception handling and recovery techniques. Our proposed design replicates only a necessary part of the original circuit to avoid high hardware overhead as in triple-modular-redundancy (TMR). The timing-critical combinational circuit is path-wise partitioned into two sections. The combinational circuits associated with long paths are laid out without any intrusion except for the fan-out connections from the first section of the circuit to a replicated second section of the combinational circuit. Thus only the second section of the circuit is replicated. The signals fanning out from the first section are latches, and thus are far shorter than the paths spanning the entire combinational circuit. The replicated circuit is timed at a subsequent clock cycle to ascertain relaxed timing paths. This insures that the likelihood of mistiming due to stress or process variation is eliminated. During the subsequent clock cycle, the outcome of the two logically identical, yet time-interleaved, circuit outputs are compared to detect faults. When a fault is detected, the retry sig- nal is triggered and the dynamic frequency-step-down takes place before a pipe flush, and retry is issued. The significant timing overhead associated with the retry is offset by the rarity of the timing violation events. Simulation results on ISCAS Benchmark circuits show that 10% of clock frequency gain is possible with 10 to 20 % of hardware overhead of replicated timing-critical circuit