Low-Voltage Ultra-Low-Power Current Conveyor Based on Quasi-Floating Gate Transistors

The field of low-voltage low-power CMOS technology has grown rapidly in recent years; it is an essential prerequisite particularly for portable electronic equipment and implantable medical devices due to its influence on battery lifetime. Recently, significant improvements in implementing circuits working in the low-voltage low-power area have been achieved, but circuit designers face severe challenges when trying to improve or even maintain the circuit performance with reduced supply voltage. In this paper, a low-voltage ultra-low-power current conveyor second generation CCII based on quasi-floating gate transistors is presented. The proposed circuit operates at a very low supply voltage of only ±0.4 V with rail-to-rail voltage swing capability and a total quiescent power consumption of mere 9.5 µW. Further, the proposed circuit is not only able to process the AC signal as it's usual at quasi-floating gate transistors but also the DC which extends the applicability of the proposed circuit. In conclusion, an application example of the current-mode quadrature oscillator is presented. PSpice simulation results using the 0.18 µm TSMC CMOS technology are included to confirm the attractive properties of the proposed circuit

A Survey of Non-conventional Techniques for Low-voltage Low-power Analog Circuit Design

Designing integrated circuits able to work under low-voltage (LV) low-power (LP) condition is currently undergoing a very considerable boom. Reducing voltage supply and power consumption of integrated circuits is crucial factor since in general it ensures the device reliability, prevents overheating of the circuits and in particular prolongs the operation period for battery powered devices. Recently, non-conventional techniques i.e. bulk-driven (BD), floating-gate (FG) and quasi-floating-gate (QFG) techniques have been proposed as powerful ways to reduce the design complexity and push the voltage supply towards threshold voltage of the MOS transistors (MOST). Therefore, this paper presents the operation principle, the advantages and disadvantages of each of these techniques, enabling circuit designers to choose the proper design technique based on application requirements. As an example of application three operational transconductance amplifiers (OTA) base on these non-conventional techniques are presented, the voltage supply is only ±0.4 V and the power consumption is 23.5 µW. PSpice simulation results using the 0.18 µm CMOS technology from TSMC are included to verify the design functionality and correspondence with theory

Low-voltage Low-power Bulk-driven CMOS Op-Amp Using Negative Miller Compensation for ECG

Two bulk-driven CMOS (Complementary Metal Oxide Semiconductor) operational amplifier (op-amp) designs for electrocardiogram (ECG) application are presented and compared in this paper. Both op-amps are based on two-stage amplification, where bulk-driven differential input is the first stage, while additional DC gain is the second stage. Different compensation techniques were integrated in each op-amp design. Standard Miller compensation was used for the first op-amp parallel with the second stage. The novelty of the second op-amp is that it utilizes negative Miller compensation between the bulk-driven input node and the output node of the first stag, while standard Miller compensation was used in the second stage. The purpose of this work was to compare DC gain, phase margin (PM) and unit gain frequency (UGF) obtained through different simulated compensation strategies and test results. The op-amps were simulated using 0.25 μm CMOS technology. The simulation results are presented using the standard model libraries from Tanner EDA tools, operating on a single rail +0.8V power supply

Low-voltage Low-power Bulk-driven CMOS Op-Amp Using Negative Miller Compensation for ECG

Two bulk-driven CMOS (Complementary Metal Oxide Semiconductor) operational amplifier (op-amp) designs for electrocardiogram (ECG) application are presented and compared in this paper. Both op-amps are based on two-stage amplification, where bulk-driven differential input is the first stage, while additional DC gain is the second stage. Different compensation techniques were integrated in each op-amp design. Standard Miller compensation was used for the first op-amp parallel with the second stage. The novelty of the second op-amp is that it utilizes negative Miller compensation between the bulk-driven input node and the output node of the first stag, while standard Miller compensation was used in the second stage. The purpose of this work was to compare DC gain, phase margin (PM) and unit gain frequency (UGF) obtained through different simulated compensation strategies and test results. The op-amps were simulated using 0.25 μm CMOS technology. The simulation results are presented using the standard model libraries from Tanner EDA tools, operating on a single rail +0.8V power supply

A BULK-DRIVEN CMOS OTA WITH 68 dB DC GAIN

An ultra-low voltage rail-to-rail operational transconductance amplifier (OTA) based on a standard digital 0.18 �m CMOS process is described in this paper. Techniques for designing a 0.8 volt fully differential OTA are discussed including bias and reference current generator circuits. To achieve rail-to-rail operation, complementary input differential pairs are used, where the bulk-driven technique is applied to reduce the threshold limitation of the MOSFET transistors. The OTA gain is increased by using auxiliary gain boosting amplifiers. This additional circuitry enables the OTA to operate at 0.8 volts, achieving an open loop gain of 68 dB while consuming 94 �W. The DC gain of the amplifier is the highest gain achieved to date in bulk-driven amplifiers. 1

Low-Voltage Bulk-Driven Amplifier Design and Its Application in Implantable Biomedical Sensors

The powering unit usually represents a significant component of the implantable biomedical sensor system since the integrated circuits (ICs) inside for monitoring different physiological functions consume a great amount of power. One method to reduce the volume of the powering unit is to minimize the power supply voltage of the entire system. On the other hand, with the development of the deep sub-micron CMOS technologies, the minimum channel length for a single transistor has been scaled down aggressively which facilitates the reduction of the chip area as well. Unfortunately, as an inevitable part of analytic systems, analog circuits such as the potentiostat are not amenable to either low-voltage operations or short channel transistor scheme. To date, several proposed low-voltage design techniques have not been adopted by mainstream analog circuits for reasons such as insufficient transconductance, limited dynamic range, etc. Operational amplifiers (OpAmps) are the most fundamental circuit blocks among all analog circuits. They are also employed extensively inside the implantable biosensor systems. This work first aims to develop a general purpose high performance low-voltage low-power OpAmp. The proposed OpAmp adopts the bulk-driven low-voltage design technique. An innovative low-voltage bulk-driven amplifier with enhanced effective transconductance is developed in an n-well digital CMOS process operating under 1-V power supply. The proposed circuit employs auxiliary bulk-driven input differential pairs to achieve the input transconductance comparable with the traditional gate-driven amplifiers, without consuming a large amount of current. The prototype measurement results show significant improvements in the open loop gain (AO) and the unity-gain bandwidth (UGBW) compared to other works. A 1-V potentiostat circuit for an implantable electrochemical sensor is then proposed by employing this bulk-driven amplifier. To the best of the author’s knowledge, this circuit represents the first reported low-voltage potentiostat system. This 1-V potentiostat possesses high linearity which is comparable or even better than the conventional potentiostat designs thanks to this transconductance enhanced bulk-driven amplifier. The current consumption of the overall potentiostat is maintained around 22 microampere. The area for the core layout of the integrated circuit chip is 0.13 mm2 for a 0.35 micrometer process

Circuit solutions to compensate for device degradation in analog design in scaled technologies

The continued aggressive scaling of semiconductor devices has had detrimental effects on the performance of those devices as used in analog circuitry. Specifically, the maximum intrinsic gain (MIG) of the devices continues to degrade as the device channel lengths are reduced below 100 nm and beyond. MIG is shown to degrade from 21.6 dB in a 180 nm technology to 12.2 dB in a 65 nm technology despite the application of traditional design techniques including device size scaling and bias voltage increases. This reduction in MIG along with other process scaling effects significantly complicates the design of linear amplifiers in these technologies. This work proposes the use of positive feedback to compensate for MIG degradation in linear amplifier design in scaled technologies. Criteria for stable and process tolerant design are derived and examined in the context of amplifier models of varying degrees of complexity. This analysis defines an all-encompassing positive feedback design methodology for use in linear amplifier design of low-gain high-frequency amplifier design. Additionally, the effects of positive feedback are compared and contrasted to the effects of the commonly studied negative feedback design methodology. Finally, the methodology is applied to a differential amplifier stage in TSMC\u27s 65 nm process using standard threshold voltage, thin oxide CMOS devices. These amplifiers were fabricated and tested to validate the positive feedback design methodology. Simulation shows that 98.4% of positive feedback amplifiers have improved gain over the baseline differential amplifier with an average improvement in gain of 10.3 dB. Silicon measurements of the amplifier gain show improvements of 17.1 dB on average. Similar to the application of negative feedback, gain improvement is achieved at the cost of frequency response. The gain-bandwidth product of the amplifier is reduced by an average of 18.4 GHz from 44.6 GHz. The circuitry required to implement this technique represent a meager 6% increase in silicon area from 460 μm2 to 488 μm2

Circuits for Analog Signal Processing Employing Unconventional Active Elements

Disertační práce se zabývá zaváděním nových struktur moderních aktivních prvků pracujících v napěťovém, proudovém a smíšeném režimu. Funkčnost a chování těchto prvků byly ověřeny prostřednictvím SPICE simulací. V této práci je zahrnuta řada simulací, které dokazují přesnost a dobré vlastnosti těchto prvků, přičemž velký důraz byl kladen na to, aby tyto prvky byly schopny pracovat při nízkém napájecím napětí, jelikož poptávka po přenosných elektronických zařízeních a implantabilních zdravotnických přístrojích stále roste. Tyto přístroje jsou napájeny bateriemi a k tomu, aby byla prodloužena jejich životnost, trend navrhování analogových obvodů směřuje k stále většímu snižování spotřeby a napájecího napětí. Hlavním přínosem této práce je návrh nových CMOS struktur: CCII (Current Conveyor Second Generation) na základě BD (Bulk Driven), FG (Floating Gate) a QFG (Quasi Floating Gate); DVCC (Differential Voltage Current Conveyor) na základě FG, transkonduktor na základě nové techniky BD_QFG (Bulk Driven_Quasi Floating Gate), CCCDBA (Current Controlled Current Differencing Buffered Amplifier) na základě GD (Gate Driven), VDBA (Voltage Differencing Buffered Amplifier) na základě GD a DBeTA (Differential_Input Buffered and External Transconductance Amplifier) na základě BD. Dále je uvedeno několik zajímavých aplikací užívajících výše jmenované prvky. Získané výsledky simulací odpovídají teoretickým předpokladům.The dissertation thesis deals with implementing new structures of modern active elements working in voltage_, current_, and mixed mode. The functionality and behavior of these elements have been verified by SPICE simulation. Sufficient numbers of simulated plots are included in this thesis to illustrate the precise and strong behavior of those elements. However, a big attention to implement active elements by utilizing LV LP (Low Voltage Low Power) techniques is given in this thesis. This attention came from the fact that growing demand of portable electronic equipments and implantable medical devices are pushing the development towards LV LP integrated circuits because of their influence on batteries lifetime. More specifically, the main contribution of this thesis is to implement new CMOS structures of: CCII (Current Conveyor Second Generation) based on BD (Bulk Driven), FG (Floating Gate) and QFG (Quasi Floating Gate); DVCC (Differential Voltage Current Conveyor) based on FG; Transconductor based on new technique of BD_QFG (Bulk Driven_Quasi Floating Gate); CCCDBA (Current Controlled Current Differencing Buffered Amplifier) based on conventional GD (Gate Driven); VDBA (Voltage Differencing Buffered Amplifier) based on GD. Moreover, defining new active element i.e. DBeTA (Differential_Input Buffered and External Transconductance Amplifier) based on BD is also one of the main contributions of this thesis. To confirm the workability and attractive properties of the proposed circuits many applications were exhibited. The given results agree well with the theoretical anticipation.

Scaling the bulk-driven MOSFET into deca-nanometer bulk CMOS technologies

The International Technology Roadmap for Semiconductors predicts that the nominal power supply voltage, VDD, will fall to 0.7 V by the end of the bulk CMOS era. At that time, it is expected that the long-channel threshold voltage of a MOSFET, VT0, will rise to 35.5% of VDD in order to maintain acceptable off-state leakage characteristics in digital systems. Given the recent push for system-on-a-chip integration, this increasing trend in VT0/VDD poses a serious threat to the future of analog design because it causes traditional analog circuit topologies to experience progressively problematic signal swing limitations in each new process generation. To combat the process-scaling-induced signal swing limitations of analog circuitry, researchers have proposed the use of bulk-driven MOSFETs. By using the bulk terminal as an input rather than the gate, the bulk-driven MOSFET makes it possible to extend the applicability of any analog cell to extremely low power supply voltages because VT0 does not appear in the device\u27s input signal path. Since the viability of the bulk-driven technique was first investigated in a 2 um p-well process, there have been numerous reports of low-voltage analog designs incorporating bulk-driven MOSFETs in the literature - most of which appear in technologies with feature sizes larger than 0.18 um. However, as of yet, no effort has been undertaken to understand how sub-micron process scaling trends have influenced the performance of a bulk-driven MOSFET, let alone make the device more adaptable to the deca-nanometer technologies widely used in the analog realm today. Thus, to further the field\u27s understanding of the bulk-driven MOSFET, this dissertation aims to examine the implications of scaling the device into a standard 90 nm bulk CMOS process. This dissertation also describes how the major disadvantages of a bulk-driven MOSFET - i.e., its reduced intrinsic gain, its limited frequency response and its large layout area requirement - can be mitigated through modifications to the device\u27s vertical doping profile and well structure. To gauge the potency of the proposed process changes, an optimized n-type bulk-driven MOSFET has been designed in a standard 90 nm bulk CMOS process via the 2-D device simulator, ATLAS

Low-frequency noise in downscaled silicon transistors: Trends, theory and practice

By the continuing downscaling of sub-micron transistors in the range of few to one deca-nanometers, we focus on the increasing relative level of the low-frequency noise in these devices. Large amount of published data and models are reviewed and summarized, in order to capture the state-of-the-art, and to observe that the 1/area scaling of low-frequency noise holds even for carbon nanotube devices, but the noise becomes too large in order to have fully deterministic devices with area less than 10nm×10nm. The low-frequency noise models are discussed from the point of view that the noise can be both intrinsic and coupled to the charge transport in the devices, which provided a coherent picture, and more interestingly, showed that the models converge each to other, despite the many issues that one can find for the physical origin of each model. Several derivations are made to explain crossovers in noise spectra, variable random telegraph amplitudes, duality between energy and distance of charge traps, behaviors and trends for figures of merit by device downscaling, practical constraints for micropower amplifiers and dependence of phase noise on the harmonics in the oscillation signal, uncertainty and techniques of averaging by noise characterization. We have also shown how the unavoidable statistical variations by fabrication is embedded in the devices as a spatial “frozen noise”, which also follows 1/area scaling law and limits the production yield, from one side, and from other side, the “frozen noise” contributes generically to temporal 1/f noise by randomly probing the embedded variations during device operation, owing to the purely statistical accumulation of variance that follows from cause-consequence principle, and irrespectively of the actual physical process. The accumulation of variance is known as statistics of “innovation variance”, which explains the nearly log-normal distributions in the values for low-frequency noise parameters gathered from different devices, bias and other conditions, thus, the origin of geometric averaging in low-frequency noise characterizations. At present, the many models generally coincide each with other, and what makes the difference, are the values, which, however, scatter prominently in nanodevices. Perhaps, one should make some changes in the approach to the low-frequency noise in electronic devices, to emphasize the “statistics behind the numbers”, because the general physical assumptions in each model always fail at some point by the device downscaling, but irrespectively of that, the statistics works, since the low-frequency noise scales consistently with the 1/area law