Noise shaping techniques for analog and time to digital converters using voltage controlled oscillators

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2008.Includes bibliographical references (p. 175-181).Advanced CMOS processes offer very fast switching speed and high transistor density that can be utilized to implement analog signal processing functions in interesting and unconventional ways, for example by leveraging time as a signal domain. In this context, voltage controlled ring oscillators are circuit elements that are not only very attractive due to their highly digital implementation which takes advantage of scaling, but also due to their ability to amplify or integrate conventional voltage signals into the time domain. In this work, we take advantage of voltage controlled oscillators to implement analog- and time-to-digital converters with first-order quantization and mismatch noise-shaping. To implement a time-to-digital converter (TDC) with noise-shaping, we present a oscillator that is enabled during the measurement of an input, and then disabled in between measurements. By holding the state of the oscillator in between samples, the quantization error is saved and transferred to the following sample, which can be seen as first-order noise-shaping in the frequency domain. In order to achieve good noise shaping performance, we also present key details of a multi-path oscillator topology that is able to reduce the effective delay per stage by a factor of 5 and accurately preserve the quantization error from measurement to measurement. An 11-bit, 50Msps prototype time-to-digital converter (TDC) using a multi-path gated ring oscillator with 6ps of delay per stage demonstrates over 20dB of ist-order noise shaping. At frequencies below 1MHz, the TDC error integrates to 80fsrms for a dynamic range of 95dB with no calibration of differential non-linearity required. The 157x258pm TDC is realized in 0.13ipm CMOS and operates from a 1.5V supply.(cont.) The use of VCO-based quantization within continuous-time (CT) [Epsilon] [Delta] ADC structures is also explored, with a custom prototype in 0.13pm CMOS showing measured performance of 86/72dB SNR/SNDR with 10MHz bandwidth while consuming 40mW from a 1.2V supply and occupying an active area of 640pm X 660pm. A key element of the ADC structure is a 5-bit VCO-based quantizer clocked at 950 MHz which we show achieves first-order noise-shaping of its quantization noise. The quantizer structure allows the second order CT Epsilon] [Delta] ADC topology to achieve third order noise shaping, and direct connection of the VCO-based quantizer to the internal DACs of the ADC provides intrinsic dynamic element matching (DEM) of the DAC elements.by Matthew A. Z. Straayer.Ph.D

A Low-Power Silicon-Photomultiplier Readout ASIC for the CALICE Analog Hadronic Calorimeter

The future e + e − collider experiments, such as the international linear collider, provide precise measurements of the heavy bosons and serve as excellent tests of the underlying fundamental physics. To reconstruct these bosons with an unprecedented resolution from their multi-jet final states, a detector system employing the particle flow approach has been proposed, requesting calorimeters with imaging capabilities. The analog hadron calorimeter based on the SiPM-on-tile technology is one of the highly granular candidates of the imaging calorimeters. To achieve the compactness, the silicon-photomultiplier (SiPM) readout electronics require a low-power monolithic solution. This thesis presents the design of such an application-specific integrated circuit (ASIC) for the charge and timing readout of the SiPMs. The ASIC provides precise charge measurement over a large dynamic range with auto-triggering and local zero-suppression functionalities. The charge and timing information are digitized using channel-wise analog-to-digital and time-to-digital converters, providing a fully integrated solution for the SiPM readout. Dedicated to the analog hadron calorimeter, the power-pulsing technique is applied to the full chip to meet the stringent power consumption requirement. This work also initializes the commissioning of the calorimeter layer with the use of the designed ASIC. An automatic calibration procedure has been developed to optimized the configuration settings for the chip. The new calorimeter base unit with the designed ASIC has been produced and its functionality has been tested

Challenges and Solutions to Next-Generation Single-Photon Imagers

Detecting and counting single photons is useful in an increasingly large number of applications. Most applications require large formats, approaching and even far exceeding 1 megapixel. In this thesis, we look at the challenges of massively parallel photon-counting cameras from all performance angles. The thesis deals with a number of performance issues that emerge when the number of pixels exceeds about 1/4 of megapixels, proposing characterization techniques and solutions to mitigate performance degradation and non-uniformity. Two cameras were created to validate the proposed techniques. The first camera, SwissSPAD, comprises an array of 512 x 128 SPAD pixels, each with a one-bit memory and a gating mechanism to achieve 5ns high precision time windows with high uniformity across the array. With a massively parallel readout of over 10 Gigabit/s and positioning of the integration time window accurate to the pico-second range, fluorescence lifetime imaging and fluorescence correlation spectroscopy imaging achieve a speedup of several orders of magnitude while ensuring high precision in the measurements. Other possible applications include wide-field time-of-flight imaging and the generation of quantum random numbers at highest bit-rates. Lately super-resolution microscopy techniques have also used SwissSPAD. The second camera, LinoSPAD, takes the concepts of SwissSPAD one step further by moving even more 'intelligence' to the FPGA and reducing the sensor complexity to the bare minimum. This allows focusing the optimization of the sensor on the most important metrics of photon efficiency and fill factor. As such, the sensor consists of one line of SPADs that have a direct connection each to the FPGA where complex photon processing algorithms can be implemented. As a demonstration of the capabilities of current lowcost FPGAs we implemented an array of time-to-digital converters that can handle up to 8.5 billion photons per second, measuring each one of them and accounting them in high precision histograms. Using simple laser diodes and a circuit to generate light pulses in the picosecond range, we demonstrate a ubiquitous 3D time-of-flight sensor. The thesis intends to be a first step towards achieving the world's first megapixel SPAD camera, which, we believe, is in grasp thanks to the architectural and circuital techniques proposed in this thesis. In addition, we believe that the applications proposed in this thesis offer a wide variety of uses of the sensors presented in this thesis and in future ones to come

Architectural Solutions for Analog Imperfections in ΔΣ Analog-to-Digital Based Systems

For today’s ubiquitous portable devices, innovative integrated circuits with high performance yet very low power are necessary. As these devices are used to communicate and sense real world signals in the environment, analog-to-digital converters (ADC) and systems are the key interface circuits needed to digitize the sensed information and they represent one of the most challenging aspects in the overall design. Fundamentally, this is due to the inherent imperfections in integrated circuit process technology because they cause degradations in the ADC performance. In this thesis, noise-shaping techniques are used to mitigate analog inaccuracies such as non-linearity and mismatch. These approaches are applied to ΔΣ analog-to-digital based systems. Two systems are presented in this work. The first is an architectural technique to highlight the benefits of low power, highly digital VCO-based analog-to-digital converters. It overcomes the limited SFDR due to VCO non-linearity. In this approach, a multi-loop delta-sigma (ΔΣ) ADC architecture is introduced that has a multi-rated VCO-based ADC in its second stage. A custom IC prototype of this architecture fabricated in a 130nm 1P8M CMOS process achieves 77.3dB signal-to-noise-ratio (SNR) over a 4MHz signal bandwidth with a power consumption of 13.8mW. The second system includes a new dynamic element matching (DEM) algorithm in the reference generating circuit of a ΔΣ modulator. The most basic DEM algorithm known as data weighted averaging (DWA) increases in-band noise due to intermodulation between the DEM tone and quantization error. In the proposed technique, by completing an integer multiple of the DEM cycles within one ΣΔ cycle, the DEM tone is moved to an integer multiple of the ΣΔ sample rate. As a result, with no additional circuitry or power consumption, the new DEM technique prevents any increase in the in-band noise. To prove its effectiveness, the DEM algorithm is embedded in a temperature-to-digital Converter (TDC) which requires a high precision reference. This TDC consists of a BJT-based temperature sensor followed by a 2nd-order feed-forward ΔΣ ADC as a readout circuit. It is fabricated in an 180nm 1P5M CMOS process consuming 5µA current from 1.4V supply voltage achieving resolution of 25mK/Conversion

Aika-digitaalimuunnin laajakaistaisiin aikapohjaisiin analogia-digitaalimuuntimiin

Modern deeply scaled semiconductor processes make the design of voltage-domain circuits increasingly challenging. On the contrary, the area and power consumption of digital circuits are improving with every new process node. Consequently, digital solutions are designed in place of their purely analog counterparts in applications such as analog-to-digital (A/D) conversion. Time-based analog-to-digital converters (ADC) employ digital-intensive architectures by processing analog quantities in time-domain. The quantization step of the time-based A/D-conversion is carried out by a time-to-digital converter (TDC). A free-running ring oscillator -based TDC design is presented for use in wideband time-based ADCs. The proposed architecture aims to maximize time resolution and full-scale range, and to achieve error resilient conversion performance with minimized power and area consumptions. The time resolution is maximized by employing a high-frequency multipath ring oscillator, and the full-scale range is extended using a high-speed gray counter. The error resilience is achieved by custom sense-amplifier -based sampling flip-flops, gray coded counter and a digital error correction algorithm for counter sampling error correction. The implemented design achieves up to 9-bit effective resolution at 250 MS/s with 4.3 milliwatt power consumption.Modernien puolijohdeteknologioiden skaalautumisen seurauksena jännitetason piirien suunnittelu tulee entistä haasteellisemmaksi. Toisaalta digitaalisten piirirakenteiden pinta-ala sekä tehonkulutus pienenevät prosessikehityksen myötä. Tästä syystä digitaalisia ratkaisuja suunnitellaan vastaavien puhtaasti analogisien rakenteiden tilalle. Analogia-digitaalimuunnos (A/D-muunnos) voidaan toteuttaa jännitetason sijaan aikatasossa käyttämällä aikapohjaisia A/D-muuntimia, jotka ovat rakenteeltaan pääosin digitaalisia. Kvantisointivaihe aikapohjaisessa A/D-muuntimessa toteutetaan aika-digitaalimuuntimella. Työ esittelee vapaasti oskilloivaan silmukkaoskillaattoriin perustuvan aika-digitaalimuuntimen, joka on suunniteltu käytettäväksi laajakaistaisessa aikapohjaisessa A/D-muuntimessa. Esitelty rakenne pyrkii maksimoimaan muuntimen aikaresoluution sekä muunnosalueen, sekä saavuttamaan virhesietoisen muunnostoiminnan minimoidulla tehon sekä pinta-alan kulutuksella. Aikaresoluutio on maksimoitu hyödyntämällä suuritaajuista monipolkuista silmukkaoskillaattoria, ja muunnosalue on maksimoitu nopealla Gray-koodi -laskuripiirillä. Muunnosprosessin virhesietoisuus on saavutettu toteuttamalla näytteistys herkillä kiikkuelementeillä, hyödyntämällä Gray-koodattua laskuria, sekä jälkiprosessoimalla laskurin näytteistetyt arvot virheenkorjausalgoritmilla. Esitelty muunnintoteutus saavuttaa 9 bitin efektiivisen resoluution 250 MS/s näytetaajuudella ja 4.3 milliwatin tehonkulutuksella

Low Power Analog to Digital Converters in Advanced CMOS Technology Nodes

The dissertation presents system and circuit solutions to improve the power efficiency and address high-speed design issues of ADCs in advanced CMOS technologies. For image sensor applications, a high-performance digitizer prototype based on column-parallel single-slope ADC (SS-ADC) topology for readout of a back-illuminated 3D-stacked CMOS image sensor is presented. To address the high power consumption issue in high-speed digital counters, a passing window (PW) based hybrid counter topology is proposed. To address the high column FPN under bright illumination conditions, a double auto-zeroing (AZ) scheme is proposed. The proposed techniques are experimentally verified in a prototype chip designed and fabricated in the TSMC 40 nm low-power CMOS process. The PW technique saves 52.8% of power consumption in the hybrid digital counters. Dark/bright column fixed pattern noise (FPN) of 0.0024%/0.028% is achieved employing the proposed double AZ technique for digital correlated double sampling (CDS). A single-column digitizer consumes total power of 66.8μW and occupies an area of 5.4 µm x 610 µm. For mobile/wireless receiver applications, this dissertation presents a low-power wide-bandwidth multistage noise-shaping (MASH) continuous-time delta-sigma modulator (CT-ΔΣM) employing finite impulse response (FIR) digital-to-analog converters (DACs) and encoder-embedded loop-unrolling (EELU) quantizers. The proposed MASH 1-1-1 topology is a cascade of three single-loop first-order CT-ΔΣM stages, each of which consists of an active-RC integrator, a current-steering DAC, and an EELU quantizer. An FIR filter in the main 1.5-bit DAC improves the modulator’s jitter sensitivity performance. FIR’s effect on the noise transfer function (NTF) of the modulator is compensated in the digital domain thanks to the MASH topology. Instead of employing a conventional analog direct feedback path, a 1.5-bit EELU quantizer based on multiplexing comparator outputs is proposed; this approach is suitable for highspeed operation together with power and area benefits. Fabricated in a 40-nm low-power CMOS technology, the modulator’s prototype achieves a 67.3 dB of signal-to-noise and distortion ratio (SNDR), 68 dB of signal-to-noise ratio (SNR), and 68.2 dB of dynamic range (DR) within 50.5 MHz of bandwidth (BW), while consuming 19 mW of total power (P). The proposed modulator features 161.5 dB of figure-of-merit (FOM), defined as FOM = SNDR + 10 log10 (BW/P)

Techniques for high-performance digital frequency synthesis and phase control

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2008.Includes bibliographical references (p. 183-190).This thesis presents a 3.6-GHz, 500-kHz bandwidth digital [delta][sigma] frequency synthesizer architecture that leverages a recently invented noise-shaping time-to-digital converter (TDC) and an all-digital quantization noise cancellation technique to achieve excellent in-band and out-of-band phase noise, respectively. In addition, a passive digital-to-analog converter (DAC) structure is proposed as an efficient interface between the digital loop filter and a conventional hybrid voltage-controlled oscillator (VCO) to create a digitally-controlled oscillator (DCO). An asynchronous divider structure is presented which lowers the required TDC range and avoids the divide-value-dependent delay variation. The prototype is implemented in a 0.13-am CMOS process and its active area occupies 0.95 mm². Operating under 1.5 V, the core parts, excluding the VCO output buffer, dissipate 26 mA. Measured phase noise at 3.67 GHz achieves -108 dBc/Hz and -150 dBc/Hz at 400 kHz and 20 MHz, respectively. Integrated phase noise at this carrier frequency yields 204 fs of jitter (measured from 1 kHz to 40 MHz). In addition, a 3.2-Gb/s delay-locked loop (DLL) in a 0.18-[mu]m CMOS for chip-tochip communications is presented. By leveraging the fractional-N synthesizer technique, this architecture provides a digitally-controlled delay adjustment with a fine resolution and infinite range. The provided delay resolution is less sensitive to the process, voltage, and temperature variations than conventional techniques. A new [delta][sigma] modulator enables a compact and low-power implementation of this architecture. A simple bang-bang detector is used for phase detection. The prototype operates at a 1.8-V supply voltage with a current consumption of 55 mA. The phase resolution and differential rms clock jitter are 1.4 degrees and 3.6 ps, respectively.by Chun-Ming Hsu.Ph.D