A convolutional neural network (CNN) for defect detection of additively manufactured parts

“Additive manufacturing (AM) is a layer-by-layer deposition process to fabricate parts with complex geometries. The formation of defects within AM components is a major concern for critical structural and cyclic loading applications. Understanding the mechanisms of defect formation and identifying the defects play an important role in improving the product lifecycle. The convolutional neural network (CNN) has been demonstrated to be an effective deep learning tool for automated detection of defects for both conventional and AM processes. A network with optimized parameters including proper data processing and sampling can improve the performance of the architecture. In this study, for the detection of good deposition quality and defects such as lack of fusion, gas porosity, and cracks in a fusion-based AM process, a CNN architecture is presented comparing the classification report and evaluation of different architectural settings and obtaining the optimized result from them. Since data set preparation, visualization, and balancing are very important aspects in deep learning to improve the performance and accuracy of neural network architectures, exploratory data analysis was performed for data visualization and the up-sampling method was implemented to balance the data set for each class. By comparing the results for different architectures, the optimal CNN network was chosen for further investigation. To tune the hyperparameters and to achieve an optimized parameter set, a design of experiments was implemented to improve the performance of the network. The performance of the network with optimized parameters was compared with the results from the previous study. The overall accuracy ( \u3e 97%) for both training and testing the CNN network presented in this work transcends the current state of the art (92%) for AM defect detection”--Abstract, page iv

Classification of Contaminated Insulators Using k-Nearest Neighbors Based on Computer Vision

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Big data analytics:Computational intelligence techniques and application areas

Big Data has significant impact in developing functional smart cities and supporting modern societies. In this paper, we investigate the importance of Big Data in modern life and economy, and discuss challenges arising from Big Data utilization. Different computational intelligence techniques have been considered as tools for Big Data analytics. We also explore the powerful combination of Big Data and Computational Intelligence (CI) and identify a number of areas, where novel applications in real world smart city problems can be developed by utilizing these powerful tools and techniques. We present a case study for intelligent transportation in the context of a smart city, and a novel data modelling methodology based on a biologically inspired universal generative modelling approach called Hierarchical Spatial-Temporal State Machine (HSTSM). We further discuss various implications of policy, protection, valuation and commercialization related to Big Data, its applications and deployment

Applications of Computational Intelligence to Power Systems

In power system operation and control, the basic goal is to provide users with quality electricity power in an economically rational degree for power systems, and to ensure their stability and reliability. However, the increased interconnection and loading of the power system along with deregulation and environmental concerns has brought new challenges for electric power system operation, control, and automation. In the liberalised electricity market, the operation and control of a power system has become a complex process because of the complexity in modelling and uncertainties. Computational intelligence (CI) is a family of modern tools for solving complex problems that are difficult to solve using conventional techniques, as these methods are based on several requirements that may not be true all of the time. Developing solutions with these “learning-based” tools offers the following two major advantages: the development time is much shorter than when using more traditional approaches, and the systems are very robust, being relatively insensitive to noisy and/or missing data/information, known as uncertainty

A Review and Analysis of Automatic Optical Inspection and Quality Monitoring Methods in Electronics Industry

Electronics industry is one of the fastest evolving, innovative, and most competitive industries. In order to meet the high consumption demands on electronics components, quality standards of the products must be well-maintained. Automatic optical inspection (AOI) is one of the non-destructive techniques used in quality inspection of various products. This technique is considered robust and can replace human inspectors who are subjected to dull and fatigue in performing inspection tasks. A fully automated optical inspection system consists of hardware and software setups. Hardware setup include image sensor and illumination settings and is responsible to acquire the digital image, while the software part implements an inspection algorithm to extract the features of the acquired images and classify them into defected and non-defected based on the user requirements. A sorting mechanism can be used to separate the defective products from the good ones. This article provides a comprehensive review of the various AOI systems used in electronics, micro-electronics, and opto-electronics industries. In this review the defects of the commonly inspected electronic components, such as semiconductor wafers, flat panel displays, printed circuit boards and light emitting diodes, are first explained. Hardware setups used in acquiring images are then discussed in terms of the camera and lighting source selection and configuration. The inspection algorithms used for detecting the defects in the electronic components are discussed in terms of the preprocessing, feature extraction and classification tools used for this purpose. Recent articles that used deep learning algorithms are also reviewed. The article concludes by highlighting the current trends and possible future research directions.Framework of the IQONIC Project; European Union’s Horizon 2020 Research and Innovation Program

Image Quality Improvement of Medical Images using Deep Learning for Computer-aided Diagnosis

Retina image analysis is an important screening tool for early detection of multiple dis eases such as diabetic retinopathy which greatly impairs visual function. Image analy sis and pathology detection can be accomplished both by ophthalmologists and by the use of computer-aided diagnosis systems. Advancements in hardware technology led to more portable and less expensive imaging devices for medical image acquisition. This promotes large scale remote diagnosis by clinicians as well as the implementation of computer-aided diagnosis systems for local routine disease screening. However, lower cost equipment generally results in inferior quality images. This may jeopardize the reliability of the acquired images and thus hinder the overall performance of the diagnos tic tool. To solve this open challenge, we carried out an in-depth study on using different deep learning-based frameworks for improving retina image quality while maintaining the underlying morphological information for the diagnosis. Our results demonstrate that using a Cycle Generative Adversarial Network for unpaired image-to-image trans lation leads to successful transformations of retina images from a low- to a high-quality domain. The visual evidence of this improvement was quantitatively affirmed by the two proposed validation methods. The first used a retina image quality classifier to confirm a significant prediction label shift towards a quality enhance. On average, a 50% increase of images being classified as high-quality was verified. The second analysed the perfor mance modifications of a diabetic retinopathy detection algorithm upon being trained with the quality-improved images. The latter led to strong evidence that the proposed solution satisfies the requirement of maintaining the images’ original information for diagnosis, and that it assures a pathology-assessment more sensitive to the presence of pathological signs. These experimental results confirm the potential effectiveness of our solution in improving retina image quality for diagnosis. Along with the addressed con tributions, we analysed how the construction of the data sets representing the low-quality domain impacts the quality translation efficiency. Our findings suggest that by tackling the problem more selectively, that is, constructing data sets more homogeneous in terms of their image defects, we can obtain more accentuated quality transformations

Edge Intelligence with Light Weight CNN Model for Surface Defect Detection in Manufacturing Industry

Surface defect identification is essential for maintaining and improving the quality of industrial products. However, numerous environmental factors, including reflection, radiance, light, and material, affect the defect detection process, considerably increasing the difficulty of detecting surface defects. Deep Learning, a part of Artificial intelligence, can detect surface defects in the industrial sector. However, conventional deep learning techniques are heavy in terms of expensive GPU requirements to support massive computations during the defect detection process.CondenseNetV2, a Lightweight CNN-based model, which performs well on microscopic defect inspection, and can be operated on low-frequency edge devices, was proposed in this research. It provides sufficient feature extractions with little computational overhead by reusing a set of the existing Sparse Feature Reactivation module. The training data are subjected to data augmentation techniques, and the hyper-parameters of the proposed model are fine-tuned with transfer learning. The model was tested extensively with two real datasets while running on an edge device (NVIDIA Jetson Xavier Nx SOM). The experiment results confirm that the projected model can efficiently detect the faults in the real-world environment while reliably and robustly diagnosing them

The Use of a Convolutional Neural Network in Detecting Soldering Faults from a Printed Circuit Board Assembly

Automatic Optical Inspection (AOI) is any method of detecting defects during a Printed Circuit Board (PCB) manufacturing process. Early AOI methods were based on classic image processing algorithms using a reference PCB. The traditional methods require very complex and inflexible preprocessing stages. With recent advances in the field of deep learning, especially Convolutional Neural Networks (CNN), automating various computer vision tasks has been established. Limited research has been carried out in the past on using CNN for AOI. The present systems are inflexible and require a lot of preprocessing steps or a complex illumination system to improve the accuracy. This paper studies the effectiveness of using CNN to detect soldering bridge faults in a PCB assembly. The paper presents a method for designing an optimized CNN architecture to detect soldering faults in a PCBA. The proposed CNN architecture is compared with the state-of-the-art object detection architecture, namely YOLO, with respect to detection accuracy, processing time, and memory requirement. The results of our experiments show that the proposed CNN architecture has a 3.0% better average precision, has 50% less number of parameters and infers in half the time as YOLO. The experimental results prove the effectiveness of using CNN in AOI by using images of a PCB assembly without any reference image, any complex preprocessing stage, or a complex illumination system. Doi: 10.28991/HIJ-2022-03-01-01 Full Text: PD