Mathematical Estimation of Logical Masking Capability of Majority/Minority Gates Used in Nanoelectronic Circuits

In nanoelectronic circuit synthesis, the majority gate and the inverter form the basic combinational logic primitives. This paper deduces the mathematical formulae to estimate the logical masking capability of majority gates, which are used extensively in nanoelectronic digital circuit synthesis. The mathematical formulae derived to evaluate the logical masking capability of majority gates holds well for minority gates, and a comparison with the logical masking capability of conventional gates such as NOT, AND/NAND, OR/NOR, and XOR/XNOR is provided. It is inferred from this research work that the logical masking capability of majority/minority gates is similar to that of XOR/XNOR gates, and with an increase of fan-in the logical masking capability of majority/minority gates also increases

Improving reconfigurable systems reliability by combining periodical test and redundancy techniques: a case study

This paper revises and introduces to the field of reconfigurable computer systems, some traditional techniques used in the fields of fault-tolerance and testing of digital circuits. The target area is that of on-board spacecraft electronics, as this class of application is a good candidate for the use of reconfigurable computing technology. Fault tolerant strategies are used in order for the system to adapt itself to the severe conditions found in space. In addition, the paper describes some problems and possible solutions for the use of reconfigurable components, based on programmable logic, in space applications

Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space

Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations

Redundant Logic Insertion and Fault Tolerance Improvement in Combinational Circuits

This paper presents a novel method to identify and insert redundant logic into a combinational circuit to improve its fault tolerance without having to replicate the entire circuit as is the case with conventional redundancy techniques. In this context, it is discussed how to estimate the fault masking capability of a combinational circuit using the truth-cum-fault enumeration table, and then it is shown how to identify the logic that can introduced to add redundancy into the original circuit without affecting its native functionality and with the aim of improving its fault tolerance though this would involve some trade-off in the design metrics. However, care should be taken while introducing redundant logic since redundant logic insertion may give rise to new internal nodes and faults on those may impact the fault tolerance of the resulting circuit. The combinational circuit that is considered and its redundant counterparts are all implemented in semi-custom design style using a 32/28nm CMOS digital cell library and their respective design metrics and fault tolerances are compared

Design and Evaluation of Radiation-Hardened Standard Cell Flip-Flops

Use of a standard non-rad-hard digital cell library in the rad-hard design can be a cost-effective solution for space applications. In this paper we demonstrate how a standard non-rad-hard flip-flop, as one of the most vulnerable digital cells, can be converted into a rad-hard flip-flop without modifying its internal structure. We present five variants of a Triple Modular Redundancy (TMR) flip-flop: baseline TMR flip-flop, latch-based TMR flip-flop, True-Single Phase Clock (TSPC) TMR flip-flop, scannable TMR flip-flop and self-correcting TMR flip-flop. For all variants, the multi-bit upsets have been addressed by applying special placement constraints, while the Single Event Transient (SET) mitigation was achieved through the usage of customized SET filters and selection of optimal inverter sizes for the clock and reset trees. The proposed flip-flop variants feature differing performance, thus enabling to choose the optimal solution for every sensitive node in the circuit, according to the predefined design constraints. Several flip-flop designs have been validated on IHP’s 130nm BiCMOS process, by irradiation of custom-designed shift registers. It has been shown that the proposed TMR flip-flops are robust to soft errors with a threshold Linear Energy Transfer (LET) from ( 32.4 (MeV⋅cm2/mg) ) to ( 62.5 (MeV⋅cm2/mg) ), depending on the variant

A run time adaptive architecture to trade-off performance for fault tolerance applied to a DVB on-board processor

Reliability is one of the key issues in space applications. Although highly flexible and generally less expensive than predominantly used ASICs, SRAM-based FPGAs are very susceptible to radiation effects. Hence, various fault tolerant techniques have to be applied in order to handle faults and protect the design. This paper presents a reconfigurable on-board processor capable of run-time adaptation to harsh environmental conditions and different functional demands. Run-time reconfigurability is achieved applying two different reconfiguration methodologies. We propose a novel self-reconfigurable architecture able to on demand duplicate or triplicate part of the design in order to form DMR and TMR structures. Moreover, we introduce two different approaches for voting the correct output. The first one is a traditional voter that adapts to different DMR/TMR domain positions whereas the second implies comparing the captured flip-flop values directly from the configuration memory read through ICAP. The comparison is done periodically by an embedded processor thus completely excluding the voting mechanism in hardware. The proposed run-time reconfiguration methodology provides savings in terms of device utilization, reconfiguration time, power consumption and significant reductions in the amount of rad-hard memory used by partial configurations