An empirical analysis of optimization techniques for terminological representation systems : or: \u27Making KRIS get a move on\u27

We consider different methods of optimizing the classification process of terminological representation systems, and evaluate their effect on three different types of test data. Though these techniques can probably be found in many existing systems, until now there has been no coherent description of these techniques and their impact on the performance of a system. One goal of this paper is to make such a description available for future implementors of terminological systems. Building the optimizations that came off best into the KRIS system greatly enhanced its efficiency

Scalable algorithms for software based self test using formal methods

textTransistor scaling has kept up with Moore's law with a doubling of the number of transistors on a chip. More logic on a chip means more opportunities for manufacturing defects to slip in. This, in turn, has made processor testing after manufacturing a significant challenge. At-speed functional testing, being completely non-intrusive, has been seen as the ideal way of testing chips. However for processor testing, generating instruction level tests for covering all faults is a challenge given the issue of scalability. Data-path faults are relatively easier to control and observe compared to control-path faults. In this research we present a novel method to generate instruction level tests for hard to detect control-path faults in a processor. We initially map the gate level stuck-at fault to the Register Transfer Level (RTL) and build an equivalent faulty RTL model. The fault activation and propagation constraints are captured using Control and Data Flow Graphs of the RTL as a Liner Temporal Logic (LTL) property. This LTL property is then negated and given to a Bounded Model Checker based on a Bit-Vector Satisfiability Module Theories (SMT) solver. From the counter-example to the property we can extract a sequence of instructions that activates the gate level fault and propagates the fault effect to one of the observable points in the design. Other than the user supplying instruction constraints, this approach is completely automatic and does not require any manual intervention. Not all the design behaviors are required to generate a test for a fault. We use this insight to scale our previous methodology further. Underapproximations are design abstractions that only capture a subset of the original design behaviors. The use of RTL for test generation affords us two types of under-approximations: bit-width reduction and operator approximation. These are abstractions that perform reductions based on semantics of the RTL design. We also explore structural reductions of the RTL, called path based search, where we search through error propagation paths incrementally. This approach increases the size of the test generation problem step by step. In this way the SMT solver searches through the state space piecewise rather than doing the entire search at once. Experimental results show that our methods are robust and scalable for generating functional tests for hard to detect faults.Electrical and Computer Engineerin

The ciao logic programming environment: A tutorial

Abstract is not available

Understanding Phase Transitions with Local Optima Networks: Number Partitioning as a Case Study

Phase transitions play an important role in understanding search difficulty in combinatorial optimisation. However, previous attempts have not revealed a clear link between fitness landscape properties and the phase transition. We explore whether the global landscape structure of the number partitioning problem changes with the phase transition. Using the local optima network model, we analyse a number of instances before, during, and after the phase transition. We compute relevant network and neutrality metrics; and importantly, identify and visualise the funnel structure with an approach (monotonic sequences) inspired by theoretical chemistry. While most metrics remain oblivious to the phase transition, our results reveal that the funnel structure clearly changes. Easy instances feature a single or a small number of dominant funnels leading to global optima; hard instances have a large number of suboptimal funnels attracting the search. Our study brings new insights and tools to the study of phase transitions in combinatorial optimisation

Resolution cannot polynomially simulate compressed-BFS

Many algorithms for Boolean satisfiability (SAT) work within the framework of resolution as a proof system, and thus on unsatisfiable instances they can be viewed as attempting to find proofs by resolution. However it has been known since the 1980s that every resolution proof of the pigeonhole principle (PHP n m ), suitably encoded as a CNF instance, includes exponentially many steps [18]. Therefore SAT solvers based upon the DLL procedure [12] or the DP procedure [13] must take exponential time. Polynomial-sized proofs of the pigeonhole principle exist for different proof systems, but general-purpose SAT solvers often remain confined to resolution. This result is in correlation with empirical evidence. Previously, we introduced the Compressed-BFS algorithm to solve the SAT decision problem. In an earlier work [27], an implementation of a Compressed-BFS algorithm empirically solved instances in Θ( n 4 ) time. Here, we add to this claim, and show analytically that these instances are solvable in polynomial time by Compressed-BFS. Thus the class of tautologies efficiently provable by Compressed-BFS is different than that of any resolution-based procedure. We hope that the details of our complexity analysis shed some light on the proof system implied by Compressed-BFS. Our proof focuses on structural invariants within the compressed data structure that stores collections of sets of open clauses during the Compressed-BFS algorithm. We bound the size of this data structure, as well as the overall memory, by a polynomial. We then use this to show that the overall runtime is bounded by a polynomial.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/41774/1/10472_2004_Article_5379427.pd