PS-BBICS: Pulse stretching bulk built-in current sensor for on-chip measurement of single event transients

The bulk built-in current sensor (BBICS) is a cost-effective solution for detection of energetic particle strikes in integrated circuits. With an appropriate number of BBICSs distributed across the chip, the soft error locations can be identified, and the dynamic fault-tolerant mechanisms can be activated locally to correct the soft errors in the affected logic. In this work, we introduce a pulse stretching BBICS (PS-BBICS) constructed by connecting a standard BBICS and a custom-designed pulse stretching cell. The aim of PS-BBICS is to enable the on-chip measurement of the single event transient (SET) pulse width, allowing to detect the linear energy transfer (LET) of incident particles, and thus assess more accurately the radiation conditions. Based on Spectre simulations, we have shown that for the LET from 1 to 100 MeV cm2 mg−1, the SET pulse width detected by PS-BBICS varies by 620–800 ps. The threshold LET of PS-BBICS increases linearly with the number of monitored inverters, and it is around 1.7 MeV cm2 mg−1 for ten monitored inverters. On the other hand, the SET pulse width is independent of the number of monitored inverters for LET > 4 MeV cm2 mg−1. It was shown that supply voltage, temperature and process variations have strong impact on the response of PS-BBICS

PS-BBICS: Pulse stretching bulk built-in current sensor for on-chip measurement of single event transients

The bulk built-in current sensor (BBICS) is a cost-effective solution for detection of energetic particle strikes in integrated circuits. With an appropriate number of BBICSs distributed across the chip, the soft error locations can be identified, and the dynamic fault-tolerant mechanisms can be activated locally to correct the soft errors in the affected logic. In this work, we introduce a pulse stretching BBICS (PS-BBICS) constructed by connecting a standard BBICS and a custom-designed pulse stretching cell. The aim of PS-BBICS is to enable the on-chip measurement of the single event transient (SET) pulse width, allowing to detect the linear energy transfer (LET) of incident particles, and thus assess more accurately the radiation conditions. Based on Spectre simulations, we have shown that for the LET from 1 to 100 MeV cm2 mg−1, the SET pulse width detected by PS-BBICS varies by 620–800 ps. The threshold LET of PS-BBICS increases linearly with the number of monitored inverters, and it is around 1.7 MeV cm2 mg−1 for ten monitored inverters. On the other hand, the SET pulse width is independent of the number of monitored inverters for LET > 4 MeV cm2 mg−1. It was shown that supply voltage, temperature and process variations have strong impact on the response of PS-BBICS

Solar Particle Event and Single Event Upset Prediction from SRAM-based Monitor and Supervised Machine Learning

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A case for acoustic wave detectors for soft-errors

The continuing decrease in dimensions and operating voltage of transistors has increased their sensitivity against radiation phenomena, making soft errors an important challenge in future microprocessors. New techniques for detecting errors in the logic and memories that allow meeting the desired failure rate are key to keep harnessing the benefits of Moore's law. This paper proposes a low-cost dynamic particle strike detection mechanism based on acoustic wave detectors. Our results show that the proposed mechanism can protect the whole chip, including both the logic and the memory arrays, and detect all the soft errors caused by particle strikes with minimal hardware overhead and performance cost.Peer ReviewedPostprint (published version

A case for acoustic wave detectors for soft-errors

The continuing decrease in dimensions and operating voltage of transistors has increased their sensitivity against radiation phenomena, making soft errors an important challenge in future microprocessors. New techniques for detecting errors in the logic and memories that allow meeting the desired failure rate are key to keep harnessing the benefits of Moore's law. This paper proposes a low-cost dynamic particle strike detection mechanism based on acoustic wave detectors. Our results show that the proposed mechanism can protect the whole chip, including both the logic and the memory arrays, and detect all the soft errors caused by particle strikes with minimal hardware overhead and performance cost.Peer Reviewe