A programmable BIST architecture for clusters of Multiple-Port SRAMs

This paper presents a BIST architecture, based on a single microprogrammable BIST processor and a set of memory wrappers, designed to simplify the test of a system containing many distributed multi-port SRAMs of different sizes (number of bits, number of words), access protocol (asynchronous, synchronous), and timin

Programmable built-in self-testing of embedded RAM clusters in system-on-chip architectures

Multiport memories are widely used as embedded cores in all communication system-on-chip devices. Due to their high complexity and very low accessibility, built-in self-test (BIST) is the most common solution implemented to test the different memories embedded in the system. This article presents a programmable BIST architecture based on a single microprogrammable BIST processor and a set of memory wrappers designed to simplify the test of a system containing a large number of distributed multiport memories of different sizes (number of bits, number of words), access protocols (asynchronous, synchronous), and timing

Infrastructures and Algorithms for Testable and Dependable Systems-on-a-Chip

Every new node of semiconductor technologies provides further miniaturization and higher performances, increasing the number of advanced functions that electronic products can offer. Silicon area is now so cheap that industries can integrate in a single chip usually referred to as System-on-Chip (SoC), all the components and functions that historically were placed on a hardware board. Although adding such advanced functionality can benefit users, the manufacturing process is becoming finer and denser, making chips more susceptible to defects. Today’s very deep-submicron semiconductor technologies (0.13 micron and below) have reached susceptibility levels that put conventional semiconductor manufacturing at an impasse. Being able to rapidly develop, manufacture, test, diagnose and verify such complex new chips and products is crucial for the continued success of our economy at-large. This trend is expected to continue at least for the next ten years making possible the design and production of 100 million transistor chips. To speed up the research, the National Technology Roadmap for Semiconductors identified in 1997 a number of major hurdles to be overcome. Some of these hurdles are related to test and dependability. Test is one of the most critical tasks in the semiconductor production process where Integrated Circuits (ICs) are tested several times starting from the wafer probing to the end of production test. Test is not only necessary to assure fault free devices but it also plays a key role in analyzing defects in the manufacturing process. This last point has high relevance since increasing time-to-market pressure on semiconductor fabrication often forces foundries to start volume production on a given semiconductor technology node before reaching the defect densities, and hence yield levels, traditionally obtained at that stage. The feedback derived from test is the only way to analyze and isolate many of the defects in today’s processes and to increase process’s yield. With the increasing need of high quality electronic products, at each new physical assembly level, such as board and system assembly, test is used for debugging, diagnosing and repairing the sub-assemblies in their new environment. Similarly, the increasing reliability, availability and serviceability requirements, lead the users of high-end products performing periodic tests in the field throughout the full life cycle. To allow advancements in each one of the above scaling trends, fundamental changes are expected to emerge in different Integrated Circuits (ICs) realization disciplines such as IC design, packaging and silicon process. These changes have a direct impact on test methods, tools and equipment. Conventional test equipment and methodologies will be inadequate to assure high quality levels. On chip specialized block dedicated to test, usually referred to as Infrastructure IP (Intellectual Property), need to be developed and included in the new complex designs to assure that new chips will be adequately tested, diagnosed, measured, debugged and even sometimes repaired. In this thesis, some of the scaling trends in designing new complex SoCs will be analyzed one at a time, observing their implications on test and identifying the key hurdles/challenges to be addressed. The goal of the remaining of the thesis is the presentation of possible solutions. It is not sufficient to address just one of the challenges; all must be met at the same time to fulfill the market requirements

Hardware Design and Implementation of Role-Based Cryptography

Traditional public key cryptographic methods provide access control to sensitive data by allowing the message sender to grant a single recipient permission to read the encrypted message. The Need2Know® system (N2K) improves upon these methods by providing role-based access control. N2K defines data access permissions similar to those of a multi-user file system, but N2K strictly enforces access through cryptographic standards. Since custom hardware can efficiently implement many cryptographic algorithms and can provide additional security, N2K stands to benefit greatly from a hardware implementation. To this end, the main N2K algorithm, the Key Protection Module (KPM), is being specified in VHDL. The design is being built and tested incrementally: this first phase implements the core control logic of the KPM without integrating its cryptographic sub-modules. Both RTL simulation and formal verification are used to test the design. This is the first N2K implementation in hardware, and it promises to provide an accelerated and secured alternative to the software-based system. A hardware implementation is a necessary step toward highly secure and flexible deployments of the N2K system

Development of PCI Embedded Card Useful for Microcontroller Trainer

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Dynamic partial reconfiguration management for high performance and reliability in FPGAs

Modern Field-Programmable Gate Arrays (FPGAs) are no longer used to implement small “glue logic” circuitries. The high-density of reconfigurable logic resources in today’s FPGAs enable the implementation of large systems in a single chip. FPGAs are highly flexible devices; their functionality can be altered by simply loading a new binary file in their configuration memory. While the flexibility of FPGAs is comparable to General-Purpose Processors (GPPs), in the sense that different functions can be performed using the same hardware, the performance gain that can be achieved using FPGAs can be orders of magnitudes higher as FPGAs offer the ability for customisation of parallel computational architectures. Dynamic Partial Reconfiguration (DPR) allows for changing the functionality of certain blocks on the chip while the rest of the FPGA is operational. DPR has sparked the interest of researchers to explore new computational platforms where computational tasks are off-loaded from a main CPU to be executed using dedicated reconfigurable hardware accelerators configured on demand at run-time. By having a battery of custom accelerators which can be swapped in and out of the FPGA at runtime, a higher computational density can be achieved compared to static systems where the accelerators are bound to fixed locations within the chip. Furthermore, the ability of relocating these accelerators across several locations on the chip allows for the implementation of adaptive systems which can mitigate emerging faults in the FPGA chip when operating in harsh environments. By porting the appropriate fault mitigation techniques in such computational platforms, the advantages of FPGAs can be harnessed in different applications in space and military electronics where FPGAs are usually seen as unreliable devices due to their sensitivity to radiation and extreme environmental conditions. In light of the above, this thesis investigates the deployment of DPR as: 1) a method for enhancing performance by efficient exploitation of the FPGA resources, and 2) a method for enhancing the reliability of systems intended to operate in harsh environments. Achieving optimal performance in such systems requires an efficient internal configuration management system to manage the reconfiguration and execution of the reconfigurable modules in the FPGA. In addition, the system needs to support “fault-resilience” features by integrating parameterisable fault detection and recovery capabilities to meet the reliability standard of fault-tolerant applications. This thesis addresses all the design and implementation aspects of an Internal Configuration Manger (ICM) which supports a novel bitstream relocation model to enable the placement of relocatable accelerators across several locations on the FPGA chip. In addition to supporting all the configuration capabilities required to implement a Reconfigurable Operating System (ROS), the proposed ICM also supports the novel multiple-clone configuration technique which allows for cloning several instances of the same hardware accelerator at the same time resulting in much shorter configuration time compared to traditional configuration techniques. A faulttolerant (FT) version of the proposed ICM which supports a comprehensive faultrecovery scheme is also introduced in this thesis. The proposed FT-ICM is designed with a much smaller area footprint compared to Triple Modular Redundancy (TMR) hardening techniques while keeping a comparable level of fault-resilience. The capabilities of the proposed ICM system are demonstrated with two novel applications. The first application demonstrates a proof-of-concept reliable FPGA server solution used for executing encryption/decryption queries. The proposed server deploys bitstream relocation and modular redundancy to mitigate both permanent and transient faults in the device. It also deploys a novel Built-In Self- Test (BIST) diagnosis scheme, specifically designed to detect emerging permanent faults in the system at run-time. The second application is a data mining application where DPR is used to increase the computational density of a system used to implement the Frequent Itemset Mining (FIM) problem

High-speed dynamic partial reconfiguration for field programmable gate arrays

With dynamically and partially reconfigurable designs, it is necessary that the speed of the reconfiguration be accomplished in a time that is sufficiently small such that the operation of reconfiguration is not the limiting factor in the process. Therefore, the communication between the source of configuration and the configurable unit must be made as fast as possible. The aim of this work is to use an embedded controller internal to the FPGA to control the reconfiguration process and obtain the maximum speed at which reconfiguration can occur, with current FPGA technology. The use of Direct Memory Access (DMA) driven operations instead of the current arbitrated bus architectures yielded a 30% increase in the speed of reconfiguration compared to other methods such as OPB_HWICAP and PLB_HWICAP [1]. The use of interrupt driven partial reconfiguration was also introduced, allowing the processor to switch to other tasks during the reconfiguration operation. All of these contributions lead to significant performance improvements over current partial reconfiguration subsystems. The configuration controller was tested using four partially reconfigurable system implementations: (i) one targeting the Hard IP PowerPC405 on Virtex-4, (ii) a second targeting the Soft IP MicroBlaze on Virtex-5, (iii) a third targeting the Hard IP PowerPC440 on Virtex-5, and (iv) a fourth system targets the Hard IP PowerPC440 on Virtex-5 capable of adaptive feedback. The adaptive feedback Virtex-5 system can use internal voltage and temperature measurements from the Xilinx System Monitor IP to dynamically increase or decrease the speed of reconfiguration and/or change other reconfigurable aspects of the system to better match the environment

NanoWalker: a fully autonomous highly integrated miniature robot for nanoscale measurements

The aim of this project is to develop the smallest and most sophisticated wireless fully autonomous instrumented robot capable of subatomic movements. The robot named 'NanoWalker' should bring a new paradigm in the way instruments are built while providing a sophisticated platform for a new range of applications. The project involves primarily the investigation of a new legged locomotion based on piezo-actuators with advanced micro-assembly techniques applied to complex embedded electronic systems; the development of new miniature instruments, micro-manipulators, integrated behavior for controlling, searching and scanning at the atomic scale; and the development of a subatomic navigation system. Besides all the new technologies and techniques that we intend to develop and which will be applicable to many areas and systems, the NanoWalker should provide a suitable yet more flexible and powerful platform compared to traditional macro-scaled instruments. It is anticipated that this new form of highly integrated autonomous microsystem will be used as the main building block for a new generation of measurement and inspection systems. In this paper, the main components of the NanoWalker are briefly described.Seaver Institut

Towards the development of flexible, reliable, reconfigurable, and high-performance imaging systems

Current FPGAs can implement large systems because of the high density of reconfigurable logic resources in a single chip. FPGAs are comprehensive devices that combine flexibility and high performance in the same platform compared to other platform such as General-Purpose Processors (GPPs) and Application Specific Integrated Circuits (ASICs). The flexibility of modern FPGAs is further enhanced by introducing Dynamic Partial Reconfiguration (DPR) feature, which allows for changing the functionality of part of the system while other parts are functioning. FPGAs became an important platform for digital image processing applications because of the aforementioned features. They can fulfil the need of efficient and flexible platforms that execute imaging tasks efficiently as well as the reliably with low power, high performance and high flexibility. The use of FPGAs as accelerators for image processing outperforms most of the current solutions. Current FPGA solutions can to load part of the imaging application that needs high computational power on dedicated reconfigurable hardware accelerators while other parts are working on the traditional solution to increase the system performance. Moreover, the use of the DPR feature enhances the flexibility of image processing further by swapping accelerators in and out at run-time. The use of fault mitigation techniques in FPGAs enables imaging applications to operate in harsh environments following the fact that FPGAs are sensitive to radiation and extreme conditions. The aim of this thesis is to present a platform for efficient implementations of imaging tasks. The research uses FPGAs as the key component of this platform and uses the concept of DPR to increase the performance, flexibility, to reduce the power dissipation and to expand the cycle of possible imaging applications. In this context, it proposes the use of FPGAs to accelerate the Image Processing Pipeline (IPP) stages, the core part of most imaging devices. The thesis has a number of novel concepts. The first novel concept is the use of FPGA hardware environment and DPR feature to increase the parallelism and achieve high flexibility. The concept also increases the performance and reduces the power consumption and area utilisation. Based on this concept, the following implementations are presented in this thesis: An implementation of Adams Hamilton Demosaicing algorithm for camera colour interpolation, which exploits the FPGA parallelism to outperform other equivalents. In addition, an implementation of Automatic White Balance (AWB), another IPP stage that employs DPR feature to prove the mentioned novelty aspects. Another novel concept in this thesis is presented in chapter 6, which uses DPR feature to develop a novel flexible imaging system that requires less logic and can be implemented in small FPGAs. The system can be employed as a template for any imaging application with no limitation. Moreover, discussed in this thesis is a novel reliable version of the imaging system that adopts novel techniques including scrubbing, Built-In Self Test (BIST), and Triple Modular Redundancy (TMR) to detect and correct errors using the Internal Configuration Access Port (ICAP) primitive. These techniques exploit the datapath-based nature of the implemented imaging system to improve the system's overall reliability. The thesis presents a proposal for integrating the imaging system with the Robust Reliable Reconfigurable Real-Time Heterogeneous Operating System (R4THOS) to get the best out of the system. The proposal shows the suitability of the proposed DPR imaging system to be used as part of the core system of autonomous cars because of its unbounded flexibility. These novel works are presented in a number of publications as shown in section 1.3 later in this thesis

Fault-tolerant fpga for mission-critical applications.

One of the devices that play a great role in electronic circuits design, specifically safety-critical design applications, is Field programmable Gate Arrays (FPGAs). This is because of its high performance, re-configurability and low development cost. FPGAs are used in many applications such as data processing, networks, automotive, space and industrial applications. Negative impacts on the reliability of such applications result from moving to smaller feature sizes in the latest FPGA architectures. This increases the need for fault-tolerant techniques to improve reliability and extend system lifetime of FPGA-based applications. In this thesis, two fault-tolerant techniques for FPGA-based applications are proposed with a built-in fault detection region. A low cost fault detection scheme is proposed for detecting faults using the fault detection region used in both schemes. The fault detection scheme primarily detects open faults in the programmable interconnect resources in the FPGAs. In addition, Stuck-At faults and Single Event Upsets (SEUs) fault can be detected. For fault recovery, each scheme has its own fault recovery approach. The first approach uses a spare module and a 2-to-1 multiplexer to recover from any fault detected. On the other hand, the second approach recovers from any fault detected using the property of Partial Reconfiguration (PR) in the FPGAs. It relies on identifying a Partially Reconfigurable block (P_b) in the FPGA that is used in the recovery process after the first faulty module is identified in the system. This technique uses only one location to recover from faults in any of the FPGA’s modules and the FPGA interconnects. Simulation results show that both techniques can detect and recover from open faults. In addition, Stuck-At faults and Single Event Upsets (SEUs) fault can also be detected. Finally, both techniques require low area overhead