Scanning Electron Microscopy Core

Department/Unit poster (NCNPR). Corresponding author: Vijayasankar Raman ([email protected])https://egrove.olemiss.edu/pharm_annual_posters_2022/1017/thumbnail.jp

Scanning Electron Microscopy Core

Presenter: Vijayasankar Ramanhttps://egrove.olemiss.edu/pharm_annual_posters_2021/1007/thumbnail.jp

Scanning electron microscopy image representativeness: morphological data on nanoparticles.

A sample of a nanomaterial contains a distribution of nanoparticles of various shapes and/or sizes. A scanning electron microscopy image of such a sample often captures only a fragment of the morphological variety present in the sample. In order to quantitatively analyse the sample using scanning electron microscope digital images, and, in particular, to derive numerical representations of the sample morphology, image content has to be assessed. In this work, we present a framework for extracting morphological information contained in scanning electron microscopy images using computer vision algorithms, and for converting them into numerical particle descriptors. We explore the concept of image representativeness and provide a set of protocols for selecting optimal scanning electron microscopy images as well as determining the smallest representative image set for each of the morphological features. We demonstrate the practical aspects of our methodology by investigating tricalcium phosphate, Ca3 (PO4 )2 , and calcium hydroxyphosphate, Ca5 (PO4 )3 (OH), both naturally occurring minerals with a wide range of biomedical applications

Scanning Electron Microscopy Laboratory Portfolio

These images were prepared as part of the class MCR 484 Scanning Electron Microscopy at SUNY College of Environmental Science and Forestry, Fall 2016. All images were acquired on the JEOL JSM 5800 LV Scanning Electron Microscope in the N. C. Brown Center for Ultrastructure Studies

Scanning electron microscopy of Rydberg-excited Bose-Einstein condensates

We report on the realization of high resolution electron microscopy of Rydberg-excited ultracold atomic samples. The implementation of an ultraviolet laser system allows us to excite the atom, with a single-photon transition, to Rydberg states. By using the electron microscopy technique during the Rydberg excitation of the atoms, we observe a giant enhancement in the production of ions. This is due to $l$-changing collisions, which broaden the Rydberg level and therefore increase the excitation rate of Rydberg atoms. Our results pave the way for the high resolution spatial detection of Rydberg atoms in an atomic sample

Scanning Electron Microscopy Laboratory Portfolio

These images were prepared by Ian Newcomb as part of the class MCR 484 Scanning Electron Microscopy at SUNY College of Environmental Science and Forestry, Fall 2016. All images were acquired on the JEOL JSM 5800 LV Scanning Electron Microscope in the N. C. Brown Center for Ultrastructure Studie

Scanning Electron Microscopy Laboratory Portfolio

These images were prepared as part of the Fall 2016 class, MCR 484, Scanning Electron Microscopy at SUNY College of Environmental Science and Forestry. These images of various specimens were acquired on the JEOL JSM 500 LV Scanning Electron Micoscope in the N.C. Brown Center for Ultrastructure Studies using various microscopy and specimen preparation techniques

Scanning Electron Microscopy Laboratory Portfolio

These images were prepared as part of the class MCR 484 Scanning Electron Microscopy at SUNY College of Environmental Science and Forestry, Fall 2016