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    БистСма ΠΎΡ€ΠΈΠ΅Π½Ρ‚Π°Ρ†ΠΈΠΈ Π½Π° основС микромСханичСского ΠΈΠ½Π΅Ρ€Ρ†ΠΈΠ°Π»ΡŒΠ½ΠΎΠ³ΠΎ модуля

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    Описано Π°Π»Π³ΠΎΡ€ΠΈΡ‚ΠΌ комплСксування ΠΌΡ–ΠΊΡ€ΠΎΠΌΠ΅Ρ…Π°Π½Ρ–Ρ‡Π½ΠΈΡ… Π΄Π°Ρ‚Ρ‡ΠΈΠΊΡ–Π² ΠΊΡƒΡ‚ΠΎΠ²ΠΎΡ— ΡˆΠ²ΠΈΠ΄ΠΊΠΎΡΡ‚Ρ– Π· аксСлСромСтрами для підвищСння точності Π±Π΅Π·ΠΏΠ»Π°Ρ‚Ρ„ΠΎΡ€ΠΌΠΎΠ²ΠΎΡ— систСми ΠΎΡ€Ρ–Ρ”Π½Ρ‚Π°Ρ†Ρ–Ρ— Π½ΠΈΠ·ΡŒΠΊΠΎΡ— точності, випробування ΠΉΠΎΠ³ΠΎ Ρ€ΠΎΠ±ΠΎΡ‚ΠΈ Π½Π° Ρ–Π½Π΅Ρ€Ρ†Ρ–Π°Π»ΡŒΠ½ΠΎΠΌΡƒ Π²ΠΈΠΌΡ–Ρ€ΡŽΠ²Π°Π»ΡŒΠ½ΠΎΠΌΡƒ ΠΌΠΎΠ΄ΡƒΠ»Ρ– ADIS16354 Ρ„Ρ–Ρ€ΠΌΠΈ Analog Devices, Π° Ρ‚Π°ΠΊΠΎΠΆ виконання Π°Π½Π°Π»Ρ–Π·Ρƒ характСристик точності визначСння ΠΏΠ°Ρ€Π°ΠΌΠ΅Ρ‚Ρ€Ρ–Π² ΠΎΡ€Ρ–Ρ”Π½Ρ‚Π°Ρ†Ρ–Ρ—.The aim of the work is to describe algorithm of complexification angular velocity sensors and accelerometers for accuracy enhancement of strap down orientation system with low accuracy, testing of its work on Analog Devices inertial measurement module ADIS16354 and, also, analyzing of accuracy characteristic of orientation determination. The micromechanical inertial module ADIS16354, which has a low weight and small size and low cost, making it important to use BSO for small UAVs. This device incorporates a three-axis gyroscope and three-axis unit block accelerometers. Receiving data via SPI and transfer to USB is via module based controller MCS 51. The main computer (computer environment LabVIEW) performs: 1) receive data and decimation to 50 Hz; 2) data processing (temperature compensation and filtering the signal); 3) determine the angles of Euler-Krylov based on quaternion signal from the angular rate sensors (DKSH); 4) the initial orientation angles and correction Euler-Krylov angles to the signals from accelerometers in case of uniform rectilinear motion of the UAV. Feature of the proposed algorithm is a method for determining the BSO moments correction depending on the nature of the object and the introduction of the threshold correction. The modeling and study of the system showed that the developed system orientation can be used to determine the orientation parameters compact unmanned aerial vehicle and ensures the accuracy of the orientation parameters of Β± 0,32 Β° in rectilinear uniform motion of the object is sufficient accuracy to determine the orientation parameters.Π’ ΡΡ‚Π°Ρ‚ΡŒΠ΅ описан Π°Π»Π³ΠΎΡ€ΠΈΡ‚ΠΌ комплСксирования микромСханичСских Π΄Π°Ρ‚Ρ‡ΠΈΠΊΠΎΠ² ΡƒΠ³Π»ΠΎΠ²ΠΎΠΉ скорости ΠΈ аксСлСромСтров для ΠΏΠΎΠ²Ρ‹ΡˆΠ΅Π½ΠΈΡ точности Π±Π΅Π·ΠΏΠ»Π°Ρ‚Ρ„ΠΎΡ€ΠΌΠ΅Π½Π½ΠΎΠΉ систСмы ΠΎΡ€ΠΈΠ΅Π½Ρ‚Π°Ρ†ΠΈΠΈ Π½ΠΈΠ·ΠΊΠΎΠΉ точности, испытаниС аксСлСромСтров для ΠΏΠΎΠ²Ρ‹ΡˆΠ΅Π½ΠΈΡ точности Π±Π΅Π·ΠΏΠ»Π°Ρ‚Ρ„ΠΎΡ€ΠΌΠ΅Π½Π½ΠΎΠΉ систСмы ΠΎΡ€ΠΈΠ΅Π½Ρ‚Π°Ρ†ΠΈΠΈ Π½ΠΈΠ·ΠΊΠΎΠΉ точности, испытаниС Π΅Π³ΠΎ Ρ€Π°Π±ΠΎΡ‚Ρ‹ Π½Π° ΠΈΠ½Π΅Ρ€Ρ†ΠΈΠ°Π»ΡŒΠ½ΠΎΠΌ ΠΈΠ·ΠΌΠ΅Ρ€ΠΈΡ‚Π΅Π»ΡŒΠ½ΠΎΠΌ ΠΌΠΎΠ΄ΡƒΠ»Π΅ ADIS16354 Ρ„ΠΈΡ€ΠΌΡ‹ Analog Devices, Π° Ρ‚Π°ΠΊΠΆΠ΅ Π²Ρ‹ΠΏΠΎΠ»Π½Π΅Π½ΠΈΠ΅ Π°Π½Π°Π»ΠΈΠ·Π° характСристик точности опрСдСлСния ΠΏΠ°Ρ€Π°ΠΌΠ΅Ρ‚Ρ€ΠΎΠ² ΠΎΡ€ΠΈΠ΅Π½Ρ‚Π°Ρ†ΠΈΠΈ

    Direct nitridation synthesis and characterization of Si3N4 nanofibers

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    Silicon nitride nanofibers were prepared by direct nitridation of silicon powder, with an iron catalyst, under nitrogen flow. The as-prepared nanofibers have the Ξ±-Si3N4 structure. Micromorphology and phase composition of the as-prepared Ξ±-Si3N4 nanofibers were characterized by scanning and transmission electron microscopy and by X-ray diffraction analysis, respectively. The electronic structure of silicon nitride nanofibers was compared with that of Si3N4 powder by X-ray photoelectron spectroscopy and X-ray emission spectroscopy

    Direct nitridation synthesis and characterization of Si3N4 nanofibers

    No full text
    Silicon nitride nanofibers were prepared by direct nitridation of silicon powder, with an iron catalyst, under nitrogen flow. The as-prepared nanofibers have the Ξ±-Si3N4 structure. Micromorphology and phase composition of the as-prepared Ξ±-Si3N4 nanofibers were characterized by scanning and transmission electron microscopy and by X-ray diffraction analysis, respectively. The electronic structure of silicon nitride nanofibers was compared with that of Si3N4 powder by X-ray photoelectron spectroscopy and X-ray emission spectroscopy
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