The PHENIX Experiment at RHIC

The physics emphases of the PHENIX collaboration and the design and current status of the PHENIX detector are discussed. The plan of the collaboration for making the most effective use of the available luminosity in the first years of RHIC operation is also presented.Comment: 5 pages, 1 figure. Further details of the PHENIX physics program available at http://www.rhic.bnl.gov/phenix

Ion-beam depth-profiling studies of leached glasses

Ion-beam depth-profiling was carried out on three different glasses leached (or hydrated) in deionized water using /sup 1/H(/sup 19/F,..cap alpha gamma..)/sup 16/O nuclear reaction, secondary ion mass spectrometry (SIMS) and sputter-induced photon spectrometry (SIPS) techniques. The depth-profiles show an interdiffusion mechanism in which the sodium ions in the glass are depleted and replaced by hydrogen (H/sup +/) or hydronium (H/sub 3/O/sup +/) ions from the solution. The leaching behavior does not show significant difference whether the glass surface is fractured or polished. Problems of mobile ion migration caused by ion bombardment and loss of hydrogen during analysis are discussed

Investigation of hydrogen and chlorine at the SiO/sub 2//Si interface

Silicon oxides thermally grown in H/sub 2/O, O/sub 2/, HCl/O/sub 2/ and Cl/sub 2//O/sub 2/ ambients were analyzed, via /sup 1/H(/sup 19/F,..cap alpha gamma..)/sup 16/O nuclear reaction and SIMS, for the presence of hydrogen. In addition, those oxides grown in HCl/O/sub 2/ and Cl/sub 2//O/sub 2/ ambients were analyzed with SIMS for the presence of chlorine. The SIMS data show that the hydrogen levels in these oxides were below the limit of detection for nuclear reaction experiments. The /sup 35/Cl/sup +/ depth-profiles show that chlorine is enriched at the SiO/sub 2/ interface for the HCl/O/sub 2/ grown oxides while it is more evenly distributed in oxide bulk in the Cl/sub 2//O/sub 2/ grown samples