Thin film structural analysis using variable-period x-ray standing waves

Variable-period x-ray standing wave (VPXSW) studies have been carried out using 3 keV x rays and photoelectron detection. Two model surfaces have been used, a native SiO2 layer (20 Å thick) on bulk silicon, and a purpose-built multilayer surface comprising a chloroform/water marker layer (12 Å thick) on an ionic liquid spacer layer (211 Å thick) deposited on a SiO2/Si substrate at 90 K. By using photoelectron detection, both chemical and elemental sensitivity were achieved. The surfaces were modeled using dynamic x-ray scattering for x-ray intensity, and attenuation of photoelectrons transmitted through the layers, to produce simulations which accurately reproduced the experimental VPXSW measurements. VPXSW measurements made using the substrate, spacer layer, and marker layer photoelectron signatures produced consistent structural values. This work demonstrates that VPXSW can be used to determine chemically specific layer thicknesses within thick (≲300Å) surface structures composed of the light elements B, C, N, O, F, and Cl with an accuracy of 10 to 15 Å, perpendicular to the surface

Growth of nanocrystalline thin films of metal sulfides [CdS, ZnS, CuS and PbS] at the water–oil interface

Simple one pot reactions between thiobiuret complexes [M(SON(CNiPr2)2)2], (M = Cd, Zn, Pb or Cu) in toluene and aqueous Na2S lead to well-defined assemblies of nanocrystals. High quality thin films of CdS, ZnS, CuS and PbS nanoparticulates adhered to the interface are produced and are transferable to glass and other substrates. The effect of reaction parameters on the nature and properties of the deposits are examined. The films are characterized by high-resolution transmission electron microscopy, X-ray diffraction, scanning electron microscopy, transport property measurements, X-ray photoelectron and absorption spectroscopy. The ability to obtain thin films of several nanocrystalline semiconductors from a single precursor set significantly expands the scope of a reaction scheme that is still in its infancy

Cystinosis: practical tools for diagnosis and treatment

Cystinosis is the major cause of inherited Fanconi syndrome, and should be suspected in young children with failure to thrive and signs of renal proximal tubular damage. The diagnosis can be missed in infants, because not all signs of renal Fanconi syndrome are present during the first months of life. In older patients cystinosis can mimic idiopathic nephrotic syndrome due to focal and segmental glomerulosclerosis. Measuring elevated white blood cell cystine content is the corner stone for the diagnosis. The diagnosis is confirmed by molecular analysis of the cystinosin gene. Corneal cystine crystals are invariably present in all patients with cystinosis after the age of 1 year. Treatment with the cystine depleting drug cysteamine should be initiated as soon as possible and continued lifelong to prolong renal function survival and protect extra-renal organs. This educational feature provides practical tools for the diagnosis and treatment of cystinosis

Surface characterization of zirconia dental implants

Objectives: The aim of the study was to characterize the chemical composition, microstructure and roughness of two commercially available zirconia dental implants (WhiteSky and Zit-Z). Methods: The chemical composition of the cervical collar and threaded root parts of the implants (n = 2) were studied by XPS and HV-EDX. LV-SEM was used for morphological assessment, Raman microanalysis for microstructural characterization and optical profilometry for surface roughness measurements. XRD, HV-EDX and Raman microanalysis of bulk regions (longitudinal sections) were used as reference. Results: XPS showed the presence of C, O, Zr and Y (collar) plus Al (root) at implant surfaces. More C (10-26 at%) and a lower Al/Zr ratio were found in WhiteSky (1.05 vs 1.26 in Zit-Z). Zr, Y and Al were detected in single, fully oxidized states. The same elements, plus Hf, were identified by HV-EDX at bulk and surface regions, with a Al/Zr ratio higher in WhiteSky (0.17 vs 0.09 in Zit-Z). Na, K and Cl contaminants were traced at implant root parts by both methods. XRD analysis of cross-sectioned specimens revealed the presence of monoclinic and tetragonal zirconia along with cubic yttria phases. Raman microanalysis showed that the monoclinic zirconia volume fraction was higher at root surfaces than the collar. No monoclinic phase was found at bulk regions. Significantly higher Sa and Sq values were recorded in WhiteSky than Zit-Z, whereas Zit-Z showed higher Rt value. Significance: The differences found between the implants in the extent of carbon contamination, residual alumina content, tetragonal to monoclinic ZrO2 phase transformation and 3D-roughness parameters may contribute to a substantial differentiation in the cellular and tissue response. © 2009 Academy of Dental Materials