A review of focused ion beam applications in microsystem technology

In this paper the possibilities of focused ion beam (FIB) applications in microsystem technology are reviewed. After an introduction to the technology and the operating principles of FIB, two classes of applications are described. First the subject of FIB for microsystem technology inspection, metrology and failure analysis is outlined. A procedure for cross sectioning on samples is presented, as well as some examples of how this technique can be applied to study processing results. The second part of the paper is on the use of FIB as a toot for maskless micromachining. Both subtractive (etching) and additive (deposition) techniques are discussed, as well as the combination of FIB implantation of silicon with subsequent wet etching. We will show the possibility to fabricate three-dimensional structures on a micrometre scale, and give examples of recent realizations thereof.status: publishe

Spatial and social factors drive anemia in Congolese women

Anemia is common in women of child-bearing age in the Democratic Republic of the Congo (DRC). As part of the 2007 DRC Demographic and Health Survey (DHS), 4,638 women of childbearing age (including 526 pregnant women) were tested for HIV and had the hemoglobin content of their blood recorded. We assessed malaria prevalence using laboratory methods. The DHS provided extensive information for individuals, as well as household cluster coordinates which enabled us to derive several spatial variables. Multilevel analyses were conducted to determine individual and contextual risk factors for anemia. Prevalence varied geographically and was associated with both one's ethnic group and the amount and type of nearby agriculture. In contrast, prevalence was not affected by HIV or malaria status

Best practices for managing large CryoEM facilities

Microscopic imaging and technolog