Efeitos de tensão em filmes finos de manganitas estudados por espectroscopia de absorção de raios-X com luz linearmente polarizada

Orientadores: Aline Yvette Ramos, Antonio R. Brito de CastroDissertação (mestrado) - Universidade Estadual de Campinas, Instituto de Fisica Gleb WataghinResumo: Dentre os materiais exibindo o efeito de Magnetoresistência Colossal, filmes finos de manganitas dopadas tem recebido atenção especial devido a suas potenciais aplicações para dispositivos magneto-eletrônicos de nova geração. Nesses sistemas, a tensão biaxial externa pode ser usada para sintonizar as propriedades magnéticas e de transporte se for possível determinar a exata relação entre esses efeitos. Neste escopo, é importante identificar a explicita conecção entre tensão induzida pelo substrato e a estrutura local em torno dos átomos de manganês, especialmente distâncias Mn - O e o ângulo Mn - O - Mn. Nesta dissertação, relatamos um estudo de Espectroscopia de Absorção de Raios-X de filmes finos da manganita La0.7Sr0.3MnO3 epitaxialmente crescidos por deposição por laser pulsado em substratos induzindo expansão (SrTiO3) e compressão (LaAlO3) no plano dos filmes. Dados das bordas K e L2,3 do Mn foram coletados nas linhas D04B-XAS e D08A-SGM do Laboratório Nacional de Luz Síncrotron, respectivamente. Contribuições de ligações no plano dos filmes e perpendicular ao plano dos filmes foram obtidas utilizando uma abordagem para o dicroísmo linear natural presente em medidas de absorção de materiais estruturalmente anisotrópicos. Cálculos ab initio usando o formalismo de espalhamento múltiplo total foram utilizados no auxilio da compreensão dos efeitos encontrados. Espectros XANES forneceram fortes evidências de distorção tetragonal do octahedro MnO6 em direções opostas para os filmes compressivos e expansivos. Estas observações foram confirmadas usando simulações ab initio e mostraramos que o melhor modelo estrutural para explicar os dados experimentais é considerar um octahedro MnO6 com distorção no mínimo. tetragonal, e sem nenhuma modificação do ângulo Mn - O - Mn. Evidências de distorção ortorrômbica também foram observados na região de XANES. Dados de EXAFS coletados no plano dos filmes indicaram uma distorção ortorrômbica do octahedro e também confirmou a mudança da distância média Mn - O. Também por EXAFS foi possível concluir que nenhuma modição do ângulo Mn - O - Mn é induzida pela tensão fornecida pelo substrato. A distorção local do octahedro explicaram a diminuição da temperatura de transição (TC) por efeitos de tensão. Foram observados efeitos de modificação da banda 3d de condução do material, induzidos por tensão e por exposição a raios-x intensos, porém uma correlação entre estes efeitos e a distorção da estrutura do filme ainda não está muito claraAbstract: Among the materials exhibiting the Colossal Magnetoresistance e effect, mixed manganite thin films have received special attention due to their potential applications for new generation magneto-eletronic devices. In these systems, the external biaxial strain could be used to tune the magnetism and transport properties if it were possible to settle the exact relationship between both e effects. In this scope, it is important to address the explicit connection between the cell induced strains and the local structure around the manganese atoms, specially the Mn - O distances and the Mn - O - Mn angle. In this dissertation, we report on a X-ray Absorption Spectroscopy study of La0.7Sr0.3MnO3 thin films epitaxially grown by pulsed laser deposition on tensile (SrTiO3) and compressive (LaAlO3) substrates. Mn K and L2,3 edges data were collected at the D04B-XAS and D08A-SGM beamlines of the Brazilian Synchrotron Light Source, respectively. In plane and out of plane bond contributions were obtained by a natural linear dichroism approach for the absorption measurementes of structural anisotropic materials. Ab initio calculations using the Full Multiple Scattering approach was used to understand the found experimental e effects. XANES spectra give evidence of tetragonal distortion within the MnO6 octahedra,with opposite directions for tensile and compressive films. This was confirmed by ab initio simulations and we show that the best structural model to explain experimental data is that of distorted MnO6 average octahedra and without any change in the Mn - O - Mn angle.Some evidence of orthorhombic distortion also was observed in the XANES region. EXAFS data collected in plane for tensile substrate, indicate a orthorhombic distortion of octahedron and also confirm the change in the Mn - O average bond distance. Also by EXAFS was possible conclude that no change of Mn - O - Mn angle is induced by the strain. The distortion of octahedra explains the decrease of Curie temperature (TC) with the strain effects. 3d conduction band changes, induced by the strain and by intense x-ray exposition, were observed. A correlation model between these effects and the structural distortion of films is not clear yetMestradoFísicaMestre em Físic

Local tetragonal distortion in La_{0.7}Sr_{0.3}MnO_3 strained thin films probed by x-ray absorption spectroscopy

We report on an angular resolved X-ray Absorption Spectroscopy study of $La_{0.7}Sr_{0.3}MnO_{3}$ thin films epitaxially grown by pulsed laser deposition on slightly mismatched substrates which induce tensile or compressive strains. XANES spectra give evidence of tetragonal distortion within the $MnO_{6}$ octahedra, with opposite directions for tensile and compressive strains. Quantitative analysis has been done and a model of tetragonal distortion reflecting the strain has been established. EXAFS data collected in plane for tensile substrate confirm the change in the $Mn-O$ average bond distance and the increase of $Mn-Mn$ length matching with the enlargement of the cell parameter. From these results we conclude that there is no significant change in the $Mn-O-Mn$ angle. Our observations conflict with the scenarios which this angle is the main driving parameter in the sensitivity of manganite films properties to external strains and suggest that the distortion within the octahedra plays a key role in the modification of the transport and magnetic properties.Comment: 8 pages, 6 figure

Depth dependent local structures in thin films unraveled by grazing incidence x-ray absorption spectroscopy

A method of using X-ray absorption spectroscopy (XAS) together with resolved grazing incidence geometry for depth profiling atomic, electronic, chemical or magnetic local structures in thin films is presented. The quantitative deconvolution of thickness-dependent spectral features is performed by fully considering both scattering and absorption formalisms. Surface oxidation and local structural depth profiles in nanometric FePt films are determined, exemplifying the application of the method.Comment: 5 pages, 3 figure

Emergence of ferromagnetism and Jahn-Teller distortion in low Cr-substituted LaMnO3

The emergence of a ferromagnetic component in $LaMnO_{3}$ with low Cr-for-Mn substitution has been studied by x-ray absorption spectroscopy and x-ray magnetic circular dichroism at the Mn and Cr K edges. The local magnetic moment strength for the Mn and Cr are proportional to each other and follows the macroscopic magnetization. The net ferromagnetic components of $Cr^{3+}$ and $Mn^{3+}$ are found antiferromagnetically coupled. Unlike hole doping by La site substitution, the inclusion of $Cr^{3+}$ ions up to x = 0.15 does not decrease the Jahn-Teller (JT) distortion and consequently does not significantly affect the orbital ordering. This demonstrates that the emergence of the ferromagnetism is not related to JT weakening and likely arises from a complex orbital mixing.Comment: 5 figure

Stability of the Ni sites across the pressure-induced metallization in YNiO3

The local environment of nickel atoms in Y NiO3 across the pressure- induced insulator to metal (IM) transition was studied using X-ray absorption spectroscopy (XAS) supported by ab initio calculations. The monotonic contraction of the NiO6 units under applied pressure observed up to 13 GPa, stops in a limited pressure domain around 14 GPa, before resuming above 16 GPa. In this narrow pressure range, crystallographic modifications basically occur in the medium/long range, not in the NiO6 octahedron, whereas the evolution of the near-edge XAS features can be associated to metallization. Ab initio calculations show that these features are related to medium range order, provided that the Ni-O-Ni angle enables a proper overlap of the Ni eg and O 2p orbitals. Metallization is then not directly related to modifications in the average local geometry of the NiO6 units but more likely to an inter-octahedra rearrangement. These outcomes provides evidences of the bandwidth driven nature of the IM transition.Comment: 6 pages with figure

Energy-dispersive X-ray absorption spectroscopy at LNLS: Investigation on strongly correlated metal oxides

An energy-dispersive X-ray absorption spectroscopy beamline mainly dedicated to X-ray magnetic circular dichroism (XMCD) and material science under extreme conditions has been implemented in a bending-magnet port at the Brazilian Synchrotron Light Laboratory. Here the beamline technical characteristics are described, including the most important aspects of the mechanics, optical elements and detection set-up. The beamline performance is then illustrated through two case studies on strongly correlated transition metal oxides: an XMCD insight into the modifications of the magnetic properties of Cr-doped manganites and the structural deformation in nickel perovskites under high applied pressure. © 2010 International Union of Crystallography. Printed in Singapore - all rights reserved.Fil: Cezar, Julio C.. Laboratorio Nacional de Luz Síncrotron; BrasilFil: Souza Neto, Narcizo M.. Laboratorio Nacional de Luz Síncrotron; BrasilFil: Piamonteze, Cínthia. Laboratorio Nacional de Luz Síncrotron; BrasilFil: Tamura, Edilson. Laboratorio Nacional de Luz Síncrotron; BrasilFil: Garcia, Flávio. Laboratorio Nacional de Luz Síncrotron; BrasilFil: Carvalho, Edson J.. Laboratorio Nacional de Luz Síncrotron; BrasilFil: Neueschwander, Régis T.. Laboratorio Nacional de Luz Síncrotron; BrasilFil: Ramos, Aline Y.. Centre National de la Recherche Scientifique; FranciaFil: Tolentino, Hélio C. N.. Centre National de la Recherche Scientifique; FranciaFil: Caneiro, Alberto. Comisión Nacional de Energía Atómica. Centro Atómico Bariloche; Argentina. Comisión Nacional de Energía Atómica. Gerencia del Área de Energía Nuclear. Instituto Balseiro; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Massa, Nestor Emilio. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - La Plata. Centro de Química Inorgánica "Dr. Pedro J. Aymonino". Universidad Nacional de La Plata. Facultad de Ciencias Exactas. Centro de Química Inorgánica "Dr. Pedro J. Aymonino"; ArgentinaFil: Martinez Lope, Maria Jesus. Instituto de Ciencia de Materiales de Madrid; España. Consejo Superior de Investigaciones Científicas; EspañaFil: Alonso, José Antonio. Instituto de Ciencia de Materiales de Madrid; España. Consejo Superior de Investigaciones Científicas; EspañaFil: Itié, Jean Paul. L'Orme des Merisiers. Synchrotron SOLEIL; Franci

Energy-dispersive X-ray absorption spectroscopy at LNLS: investigation on strongly correlated metal oxides

An energy-dispersive X-ray absorption spectroscopy beamline mainly dedicated to X-ray magnetic circular dichroism (XMCD) and material science under extreme conditions has been implemented in a bending-magnet port at the Brazilian Synchrotron Light Laboratory. Here the beamline technical characteristics are described, including the most important aspects of the mechanics, optical elements and detection set-up. The beamline performance is then illustrated through two case studies on strongly correlated transition metal oxides: an XMCD insight into the modifications of the magnetic properties of Cr-doped manganites and the structural deformation in nickel perovskites under high applied pressure.Facultad de Ciencias ExactasCentro de Química Inorgánic

Local order profile and magnetic anisotropy in thin films: The contribution of the X-ray espectroscopy in grazing incidence

Filmes finos magnéticos têm grande apelo em mídias de gravação com alta densidade de dados. As propriedades magnéticas desses filmes, que dependem da estrutura atômica do material, podem ser modificadas ou induzidas pela presença de interfaces internas. Para o entendimento e melhoramento dessas propriedades, torna-se necessário o uso de técnicas capazes de fornecer informações seletivamente em profundidade. Neste trabalho, acoplamos a espectroscopia de absorção de raios X (XAS) à uma geometria de incidência rasante, e assim usamos a variação da penetração dos raios X dentro do material em torno do ângulo crítico de reflexão total para obter informações resolvidas em profundidade sobre a ordem estrutural e magnética local. Desenvolvemos uma metodologia de medidas e de análise desta informação. Esta metodologia foi aplicada em filmes de FePt e CoPt que produzimos pela técnica de deposição catódica. Em filmes de FePt, uma análise quantitativa completa nos permitiu caracterizar a camada de oxidação da superfície. Em filmes de CoPt, observamos que a ordem química, responsável pela anisotropia perpendicular é parcialmente perdida em grandes profundidades além da superfície para filmes de espessura superior a 50 nm. A presença desta camada desordenada, confirmada por espalhamento ressonante de raios X, explica a incomum dependência em espessura das propriedades magnéticas do sistema estudado.Magnetic thin films have great appeal in recording media with high data density. The magnetic properties of these films, depending on the material atomic structure, may be modified or induced by the presence of intern interfaces. For the understanding and improving of these properties, becomes necessary the use of techniques able to provide in depth selective information. In this work, we put together the X-ray absorption spectroscopy (XAS) to a grazing incidence setup, and then we use the variation of X-ray penetration inside the material around the critical angle to get depth resolved information about the structural and magnetic local order. We developed a measurements and analysis methodology of this information. This methodology were applied in FePt and CoPt films which we produced by the magnetron sputtering technique In FePt films, a complete quantitative analysis allowed us characterize a surface oxidized layer. In CoPt films, we observed the chemical order, responsible for the perpendicular anisotropy, is partially lost in high depths away from the surface for films thicker than 50 nm. The presence of this disordered layer, confirmed by resonant magnetic X-ray scattering, explains the unconventional in depth dependence of the studied system magnetic properties