In-plane magnetocrystalline anisotropy in the van der Waals antiferromagnet FePSe3_3 probed by magneto-Raman scattering

Magnon gap excitations selectively coupled to phonon modes have been studied in FePSe$_3$ layered antiferromagnet with magneto-Raman scattering experiments performed at different temperatures. The bare magnon excitation in this material has been found to be split (by $\approx~1.2$ cm$^{-1}$) into two components each being selectively coupled to one of the two degenerated, nearby phonon modes. Lifting the degeneracy of the fundamental magnon mode points out toward the biaxial character of the FePS$_3$ antiferromagnet, with an additional in-plane anisotropy complementing much stronger, out-of-plane anisotropy. Moreover, the tunability, with temperature, of the phonon- versus the magnon-like character of the observed coupled modes has been demonstrated.Comment: 7 pages, 5 figure

Structural and optical properties of CdTe thin films deposited using RF Magnetron sputtering

In this work, we have studied the influence of RF power on structural and optical properties of CdTe thin films deposited by indigenously designed locally fabricated RF magnetron sputtering. Films were analyzed by using variety of techniques such as low angle X- ray diffraction, UV-Visible spectroscopy, Raman spectroscopy etc. to study its structural and optical properties. Low angle XRD analysis showed that CdTe films are polycrystalline and has cubic structure with preferred orientation in (111) direction. Raman scattering studies revealed the presence of CdTephase over the entire range of RF power studied. The UV-Visible spectroscopy analysis showed that the band gap decreases with increase in RF power. However, CdTe films deposited at higher RF power has optimum band gap values (1.44-1.60 eV). Such optimum band gap CdTe can be use as absorber material in CdS/CdTe and ZnO/CdTe solar cells

Growth of hydrogenated nano-crystalline silicon (nc-Si:H) films by plasma enhanced chemical vapor deposition (PE-CVD)

Hydrogenated nanocrystalline silicon (nc-Si:H) thin films were prepared by home-made PE-CVD systemfromgas mixture of pure SiH4 and H2 at various deposition pressures. Obtained results exhibited that deposition rate increases with increase in deposition pressure. Raman spectroscopy analysis revealed that deposition pressure in PE-CVD is a critical process parameter to induce nanocrystallization in Si:H films. The FTIR spectroscopy analysis results indicate that with increase in deposition pressure hydrogen bonding in films shifts from Si-H to Si-H2 and (Si-H2)n bonded species bonded species. The bonded hydrogen content didn’t show particular trend with optical band gap with change in deposition pressure. The obtained results indicates that 400 mTorr is an optimized deposition pressure of our PE-CVD unit to synthesize nc-Si:H films. At this optimized deposition pressure nc-Si:H films with crystallite size ∼ 5.43 nm having good degree of crystallinity (∼77%) and high band gap (ETauc∼ 1.85 eV) were obtained with a low hydrogen content (4.28 at. %) at moderately high deposition rate (0.75 nm/s). The ease of the present work is to optimize deposition pressure to obtain device quality intrinsicnc-Si:H layer in view of its used in p-i-n solar cells

Synthesis and characterization of chemical spray [yrolysed CZTS thin films for solar cell applications

In present work, thin films of CZTS have been prepared by chemical spray pyrolysis (CSP) by spraying precursor solution directly onto the soda lime glass (SLG) substrates by varying sulphur molar concentration. Copper chloride [CuCl2.2H2O], zinc chloride [ZnCl2.2H2O], tin chloride [SnCl4.5H2O] and thiourea [(NH2)2CS] were used as precursor materials to deposit CZTS thin films by using home-built chemical spray pyrolysis system. Influence of sulphur variation on structural, optical, morphology and electrical properties of CZTS films have been investigated by using variety techniques such as low angle x-ray diffraction (XRD), Raman spectroscopy, field emission scanning electron microscopy (FE-SEM), UV-Visible spectroscopy, four probe method, etc. The formation of CZTS has been confirmed by low angle XRD and Raman spectroscopy. The structural analysis reveals formation of kesterite tetragonal phase with preferential orientation along (112) direction. The band gap values of CZTS thin films have been calculated and found in the range 2 - 2.25 eV over the entire range of sulphur variation studied. The change in band gap may be due to quantum confinement effects at nanoscale. The morphological studies show formation of islands of nanoscale particulate clusters which constitute the films in most of the samples. The films exhibit higher resistivity values (in KΩ) which may be due to presence of the strain in the films

Single Crystal, High Band Gap CdS Thin Films Grown by RF Magnetron Sputtering in Argon Atmosphere for Solar Cell Applications

Single crystal thin films of CdS were grown onto glass substrates by RF magnetron sputtering at var ious substrate temperatures. Structural, optical and morphology properties of these films were investigated through low angle XRD, Raman spectroscopy, scanning electron microscopy (SEM), energy dispersive x-ray (EDX) spectroscopy, UV-Visible spectroscopy etc. Formation of single crystal CdS films has been confirmed by low angle XRD and Raman spectroscopy analysis. Low angle XRD showed that CdS films has preferred orientation in (111) direction. Improvement of crystallinity and increase in average grain size of CdS crystallites has been observed with increase in substrate temperature. Surface morphology investigated using SEM showed that CdS films deposited over entire range of substrate temperature are highly smooth, dense, homogeneous, and free of flaws and cracks. The EDX data revealed the formation of high-quality nearly stoichiometric CdS films by RF magnetron sputtering. Furthermore, the CdS films deposited at low substrate temperatures (< 200 0C) are slightly S rich while deposited at higher substrate temperatures (> 200 0C) are slightly Cd rich. The UV-Visible spectroscopy analysis showed that an average transmission ~ 80-90 % in the visible range of the spectrum having band gap ~ 2.28 -2.38 eV, which is quite close to the optimum value of band gap for a buffer layer in CdTe/CdS, Cu2S/CdS hetero-junction solar cells

High Band Gap Nanocrystalline Tungsten Carbide (nc-WC) Thin Films Grown by Hot Wire Chemical Vapor Deposition (HW-CVD) Method

In present study nanocrystalline tungsten carbide (nc-WC) thin films were deposited by HW-CVD using heated W filament and CF4 gas. Influence of CF4 flow rate on structural, optical and electrical properties has been investigated. Formation of WC thin films was confirmed by low angle XRD, Raman spectroscopy and x-ray photoelectron spectroscopy (XPS) analysis. Low angle XRD analysis revealed that WC crystallites have preferred orientation in (101) direction and with increase in CF4 flow rate the volume fraction of WC crystallites and its average grain size increases. Formation of nano-sized WC was also confirmed by transmission electron microscopy (TEM) analysis. UV-Visible spectroscopy analysis revealed increase in optical transmission with increase in CF4 flow rate. The WC film deposited for 40 sccm of CF4 flow rate show high transparency (- 80-85 %) ranging from visible to infrared wavelengths region. The band gap shows increasing trend with increase in CF4 flow rate (3.48-4.18 eV). The electrical conductivity measured using Hall Effect was found in the range - 103-141 S/cm over the entire range of CF4 flow rate studied. The obtained results suggest that these wide band gap and conducting nc-WC films can be used as low cost counter electrodes in DSSCs and co-catalyst in electrochemical water splitting for hydrogen production

Raman Fingerprint of Pressure-Induced Phase Transitions in TiS3Nanoribbons: Implications for Thermal Measurements under Extreme Stress Conditions

Two-dimensional layered trichalcogenide materials have recently attracted the attention of the scientific community because of their robust mechanical and thermal properties and applications in opto- and nanoelectronics devices. We report the pressure dependence of out-of-plane Ag Raman modes in high quality few-layer titanium trisulfide (TiS3) nanoribbons grown using a direct solid-gas reaction method and infer their cross-plane thermal expansion coefficient. Both mechanical stability and thermal properties of the TiS3 nanoribbons are elucidated by using phonon-spectrum analyses. Raman spectroscopic studies at high pressure (up to 34 GPa) using a diamond anvil cell identify four prominent Ag Raman bands; a band at 557 cm-1 softens under compression, and others at 175, 300, and 370 cm-1 show normal hardening. Anomalies in phonon mode frequencies and excessive broadening in line width of the soft phonon about 13 GPa are attributed to the possible onset of a reversible structural transition. A complete structural phase transition at 43 GPa is inferred from the Ag soft mode frequency (557 cm-1) versus pressure extrapolation curve, consistent with recently reported theoretical predictions. Using the experimental mode Grüneisen parameters γi of Raman modes, we estimated the cross-plane thermal expansion coefficient Cv of the TiS3 nanoribbons at ambient phase to be 1.321 × 10-6 K-1. The observed results are expected to be useful in calibration and performance of next-generation nanoelectronics and optical devices under extreme stress condition

Raman scattering signatures of strong spin-phonon coupling in the bulk magnetic van der Waals material CrSBr

International audienceMagnetic excitations in layered magnetic materials that can be thinned down to the twodimensional (2D) monolayer limit are of high interest from a fundamental point of view and for applications perspectives. Raman scattering has played a crucial role in exploring the properties of magnetic layered materials and, even-though it is essentially a probe of lattice vibrations, it can reflect magnetic ordering in solids through the spin-phonon interaction or through the observation of magnon excitations. In bulk CrSBr, a layered A type antiferromagnet (AF), we show that the magnetic ordering can be directly observed in the temperature dependence of the Raman scattering response i) through the variations of the scattered intensities, ii) through the activation of new phonon lines reflecting the change of symmetry with the appearance of the additional magnetic periodicity, and iii) through the observation, below the Néel temperature (TN) of second order Raman scattering processes. We additionally show that the three different magnetic phases encountered in CrSBr, including the recently identified low temperature phase, have a particular Raman scattering signature. This work demonstrates that magnetic ordering can be observed directly in the Raman scattering response of bulk CrSBr with in-plane magnetization, and that it can provide a unique insight into the magnetic phases encountered in magnetic layered materials