Design and Characterization of Reliable RF-MEMS

This thesis present a SPDT (Single Pole Double Throw) in Ku-Band designed for space applications. It was developed in LAAS-CNRS (Laboratoire d’Analyse et d’Architecture des Systèmes) from February 2009 to July 2009 in collaboration with CEA-Leti and ESA (European Spatial Agency) in the ESTEC contract 20832/07/NL/GLC. For the conception of the design, an analysis of available fabrication process is done so as to adapt the given measures to the simulation model. The fabrication problems are also detected and treated arriving to a simulation model which fits with measures. From this primary model some modifications are proposed so as to reach the desired RF specifications. Afterwards, some designs are proposed and discussed arriving to a final design which presents an input matching of 50dB at 13GHz while it is under 20dB in the range of interest. Insertion losses are about 0.2dB approximately in all the range so they are quite constant while isolation is under 15dB. This memory is organized in five chapters. The first one present the state of art in the routing circuits using MEMS and the last novelties in MEMS designs beginning with an introduction to the MEMS world. The second chapter is dedicated to the conception of a simulation model for Momentum taking into account the fabrication process. In the third one, the RF specifications and the available MEMS designs are presented while some modifications are proposed so as to reach the objectives. The fourth chapter describes different SPDT designs which are proposed and discussed presenting the final design. In the last chapter, some general conclusions are described as well as future work in this field is proposed

Integración de estándares en la recuperación de la imagen fotográfica

Actas de las Segundas Jornadas Imagen, Cultura y Tecnología celebradas entre el 1 y el 3 de julio de 2003 en la Universidad Carlos III de MadridPublicad

Ontologías y combinación de estándares aplicadas al análisis fotográfico en la construcción de sitios web

Actas de las Quintas Jornadas Imagen, Cultura y Tecnología celebradas del 3 al 5 de julio de 2006 en la Universidad Carlos III de Madri

Design for reliability applied to RF-MEMS devices and circuits issued from different TRL environments

Ces travaux de thèse visent à aborder la fiabilité des composants RF-MEMS (commutateurs en particulier) pendant la phase de conception en utilisant différents approches de procédés de fabrication. Ça veut dire que l'intérêt est focalisé en comment éliminer ou diminuer pendant la conception les effets des mécanismes de défaillance plus importants au lieu d'étudier la physique des mécanismes. La détection des différents mécanismes de défaillance est analysée en utilisant les performances RF du dispositif et le développement d'un circuit équivalent. Cette nouvelle approche permet à l'utilisateur final savoir comment les performances vont évoluer pendant le cycle de vie. La classification des procédés de fabrication a été faite en utilisant le Technology Readiness Level du procédé qui évalue le niveau de maturité de la technologie. L'analyse de différentes approches de R&D est décrite en mettant l'accent sur les différences entre les niveaux dans la classification TRL. Cette thèse montre quelle est la stratégie optimale pour aborder la fiabilité en démarrant avec un procédé très flexible (LAAS-CNRS comme exemple de baisse TRL), en continuant avec une approche composant (CEA-Leti comme moyenne TRL) et en finissant avec un procédé standard co-intégré CMOS-MEMS (IHP comme haute TRL) dont les modifications sont impossibles.This thesis is intended to deal with reliability of RF-MEMS devices (switches, in particular) from a designer point of view using different fabrication process approaches. This means that the focus will be on how to eliminate or alleviate at the design stage the effects of the most relevant failure mechanisms in each case rather than studying the underlying physics of failure. The detection of the different failure mechanisms are investigated using the RF performance of the device and the developed equivalent circuits. This novel approach allows the end-user to infer the evolution of the device performance versus time going one step further in the Design for Reliability in RF-MEMS. The division of the fabrication process has been done using the Technology Readiness Level of the process. It assesses the maturity of the technology prior to incorporating it into a system or subsystem. An analysis of the different R&D approaches will be presented by highlighting the differences between the different levels in the TRL classification. This thesis pretend to show how reliability can be improved regarding the approach of the fabrication process starting from a very flexible one (LAAS-CNRS as example of low-TRL) passing through a component approach (CEA-Leti as example of medium-TRL) and finishing with a standard co-integrated CMOS-MEMS process (IHP example of high TRL)

Conocimiento sobre orientación espacial en estudiantes de ESO

El presente trabajo se centra en el estudio del conocimiento sobre la orientación espacial de alumnos de 1o y 4o de ESO. En esta comunicación presentamos los resultados relativos a uno de los subbloques de contenidos abordados: la representación plana de entornos. Comparamos las respuestas de alumnos de ambos cursos de un mismo centro educativo a las mismas cuestiones. Los resultados muestran diferencias significativas entre ambos grupos y ponen de relieve cómo algunas dificultades de los alumnos (por ejemplo, respecto del concepto de plano) dependen de las características del entorno a representar

Career inhibitors and career enablers for executive women

This paper is intended to contribute to the study of career inhibitors and career enablers for women. The analysis is based on data obtained from a survey conducted by the International Center of Work and Family at IESE Business School. The main conclusions of the analysis are: - Women have readier access to general management posts in small companies. - The feeling of working a "double work day" is widespread among women managers, especially in large companies. - Lack of sympathy on the part of colleagues and superiors when women give priority to their family responsibilities undermines women managers' satisfaction with their professional life. - The main career inhibitor is corporate culture (the "glass ceiling"). - The importance that executive women ascribe to career inhibitors decreases with age and professional rank. - The average woman manager's main support is her husband, who in most cases is also a manager. - The principal career enablers are: motivation, training, mental strength and value system.top management; career; family; women;

Algunos impresos árabes egipcios del siglo XIX en la Biblioteca Islámica "Félix Maria Pareja".

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