Increasing Spatial Fidelity and SNR of 4D-STEM using Multi-frame Data Fusion

4D-STEM, in which the 2D diffraction plane is captured for each 2D scan position in the scanning transmission electron microscope (STEM) using a pixelated detector, is complementing and increasingly replacing existing imaging approaches. However, at present the speed of those detectors, although having drastically improved in the recent years, is still 100 to 1,000 times slower than the current PMT technology operators are used to. Regrettably, this means environmental scanning-distortion often limits the overall performance of the recorded 4D data. Here we present an extension of existing STEM distortion correction techniques for the treatment of 4D-data series. Although applicable to 4D-data in general, we use electron ptychography and electric-field mapping as model cases and demonstrate an improvement in spatial-fidelity, signal-to-noise ratio (SNR), phase-precision and spatial-resolution

How Fast is Your Detector? The Effect of Temporal Response on Image Quality

With increasing interest in high-speed imaging should come an increased interest in the response times of our scanning transmission electron microscope (STEM) detectors. Previous works have previously highlighted and contrasted performance of various detectors for quantitative compositional or structural studies, but here we shift the focus to detector temporal response, and the effect this has on captured images. The rise and decay times of eight detectors' single electron response are reported, as well as measurements of their flatness, roundness, smoothness, and ellipticity. We develop and apply a methodology for incorporating the temporal detector response into simulations, showing that a loss of resolution is apparent in both the images and their Fourier transforms. We conclude that the solid-state detector outperforms the photomultiplier-tube (PMT) based detectors in all areas bar a slightly less elliptical central hole and is likely the best detector to use for the majority of applications. However, using tools introduced here we encourage users to effectively evaluate what detector is most suitable for their experimental needs

Measuring the Hole State Anisotropy in MgB2 by Electron Energy-Loss Spectroscopy

We have examined polycrystalline MgB2 by electron energy loss spectroscopy (EELS) and density of state calculations. In particular, we have studied two different crystal orientations, [110] and [001] with respect to the incident electron beam direction, and found significant changes in the near-edge fine-structure of the B K-edge. Density functional theory suggests that the pre-peak of the B K-edge core loss is composed of a mixture of pxy and pz hole states and we will show that these contributions can be distinguished only with an experimental energy resolution better than 0.5 eV. For conventional TEM/STEM instruments with an energy resolution of ~1.0 eV the pre-peak still contains valuable information about the local charge carrier concentration that can be probed by core-loss EELS. By considering the scattering momentum transfer for different crystal orientations, it is possible to analytically separate pxy and pz components from of the experimental spectra With careful experiments and analysis, EELS can be a unique tool measuring the superconducting properties of MgB2, doped with various elements for improved transport properties on a sub-nanometer scale.Comment: 26 Pages, 5 figures, 1 table. Submited to PR

WS22D nanosheets in 3D nanoflowers

In this work it has been established that 3D nanoflowers of WS2 synthesized by chemical vapour deposition are composed of few layer WS2 along the edges of the petals. An experimental study to understand the evolution of these nanostructures shows the nucleation and growth along with the compositional changes they undergo

Subsampled STEM-ptychography

Ptychography has been shown to be an efficient phase contrast imaging technique for scanning transmission electron microscopes (STEM). STEM-ptychography uses a fast pixelated detector to collect a “4-dimensional” dataset consisting of a 2D electron diffraction pattern at every probe position of a 2D raster-scan. This 4D dataset can be used to recover the phase-image. Current camera technology, unfortunately, can only achieve a frame rate of a few thousand detector frames-per-second (fps), which means that the acquisition time of the 4D dataset is up to 1000× slower than the scanning speed in a conventional STEM, thereby limiting the potential applications of this method for dose-fragile and dynamic specimens. In this letter, we demonstrate that subsampling provides an effective method for optimizing ptychographic acquisition by reducing both the number of detector-pixels and the number of probe positions. Subsampling and recovery of the 4D dataset are shown using an experimental 4D dataset with randomly removed detector-pixels and probe positions. After compressive sensing recovery, Wigner distribution deconvolution is applied to obtain phase-images. Randomly sampling both the probe positions and the detector at 10% gives sufficient information for phase-retrieval and reduces acquisition time by 100×, thereby making STEM-ptychography competitive with conventional STEM

Managing dose-, damage- and data-rates in multi-frame spectrum-imaging

As an instrument, the scanning transmission electron microscope is unique in being able to simultaneously explore both local structural and chemical variations in materials at the atomic scale. This is made possible as both types of data are acquired serially, originating simultaneously from sample interactions with a sharply focused electron probe. Unfortunately, such scanned data can be distorted by environmental factors, though recently fast-scanned multi-frame imaging approaches have been shown to mitigate these effects. Here, we demonstrate the same approach but optimized for spectroscopic data; we offer some perspectives on the new potential of multi-frame spectrum-imaging (MFSI) and show how dose-sharing approaches can reduce sample damage, improve crystallographic fidelity, increase data signal-to-noise, or maximize usable field of view. Further, we discuss the potential issue of excessive data-rates in MFSI, and demonstrate a file-compression approach to significantly reduce data storage and transmission burdens

The Effect of Dynamical Scattering on Single-plane Phase Retrieval in Electron Ptychography

Segmented and pixelated detectors on scanning transmission electron microscopes enable the complex specimen transmission function to be reconstructed. Imaging the transmission function is key to interpreting the electric and magnetic properties of the specimen, and as such four-dimensional scanning transmission electron microscopy (4D-STEM) imaging techniques are crucial for our understanding of functional materials. Many of the algorithms used in the reconstruction of the transmission function rely on the multiplicative approximation and the (weak) phase object approximation, which are not valid for many materials, particularly at high resolution. Herein, we study the breakdown of simple phase imaging in thicker samples. We demonstrate the behavior of integrated center of mass imaging, single-side band ptychography, and Wigner distribution deconvolution over a thickness series of simulated GaN 4D-STEM datasets. We further give guidance as to the optimal focal conditions for obtaining a more interpretable dataset using these algorithms