Comment on: `Pipe Network Model for Scaling of Dynamic Interfaces in Porous Media'

We argue that a proposed exponent identity [Phys. Rev. Lett 85, 1238 (2000)] for interface roughening in spontaneous imbibition is wrong. It rests on the assumption that the fluctuations are controlled by a single time scale, but liquid conservation imposes two distinct time scales.Comment: 1 page, to appear in Phys. Rev. Let

Multiscale modelling of microstructure formation in polymerc asting

A data bank approach to multi-scale modelling of polymer solidification under flow and holding conditions is presented with applications to injection molding. The latent heat of solidification, which acts as an input parameter for large scale simulations, is determined as a function of different process dependent parameters such as the flow speed, supersaturation and geometric properties including the seed density of emerging spherulitic microstructures. Supersaturation and flow velocities are obtained from the larger scale simulation code as input values as function of which the released latent heat can be obtained from the pre-computed data bank thereby offering a possibility to circumvent the spatial and temporal coarse-graining problem associated with large scale simulations

Interface dynamics and kinetic roughening in fractals

We consider the dynamics and kinetic roughening of single-valued interfaces in two-dimensional fractal media. Assuming that the local height difference distribution function of the fronts obeys Levý statistics with a well-defined power-law decay exponent, we derive analytic expressions for the local scaling exponents. We also show that the kinetic roughening of the interfaces displays anomalous scaling and multiscaling in the relevant correlation functions. For invasion percolation models, the exponents can be obtained from the fractal geometry of percolation clusters. Our predictions are in excellent agreement with numerical simulations.Peer reviewe

Interface Equations for Capillary Rise in Random Environment

We consider the influence of quenched noise upon interface dynamics in 2D and 3D capillary rise with rough walls by using phase-field approach, where the local conservation of mass in the bulk is explicitly included. In the 2D case the disorder is assumed to be in the effective mobility coefficient, while in the 3D case we explicitly consider the influence of locally fluctuating geometry along a solid wall using a generalized curvilinear coordinate transformation. To obtain the equations of motion for meniscus and contact lines, we develop a systematic projection formalism which allows inclusion of disorder. Using this formalism, we derive linearized equations of motion for the meniscus and contact line variables, which become local in the Fourier space representation. These dispersion relations contain effective noise that is linearly proportional to the velocity. The deterministic parts of our dispersion relations agree with results obtained from other similar studies in the proper limits. However, the forms of the noise terms derived here are quantitatively different from the other studies

Interface pinning in spontaneous imbibition

Evaporation and gravity induced pinning in spontaneous imbibition are examined within a phase field formalism. Evaporation is introduced via a nonconserving term and gravity through a convective term that constrains the influx of liquid. Their effects are described by dimensionless coupling constants ε and g, respectively. From liquid conservation, the early time behavior of the average interface position follows H(t)∼t1/2 until a crossover time t*(g,ε). After that the pinning height Hp(g,ε) is approached exponentially in time, in accordance with mean field theory. The statistical roughness of the interface is described by an exponent χ≃1.25 at all stages of the rise, but the dynamic length scale controlling roughness crosses over from ξ×∼H1/2 to a time independent pinning length scale ξp(ε,g).Peer reviewe

Phase-field crystal modelling of crystal nucleation, heteroepitaxy and patterning

We apply a simple dynamical density functional theory, the phase-field-crystal (PFC) model, to describe homogeneous and heterogeneous crystal nucleation in 2d monodisperse colloidal systems and crystal nucleation in highly compressed Fe liquid. External periodic potentials are used to approximate inert crystalline substrates in addressing heterogeneous nucleation. In agreement with experiments in 2d colloids, the PFC model predicts that in 2d supersaturated liquids, crystalline freezing starts with homogeneous crystal nucleation without the occurrence of the hexatic phase. At extreme supersaturations crystal nucleation happens after the appearance of an amorphous precursor phase both in 2d and 3d. We demonstrate that contrary to expectations based on the classical nucleation theory, corners are not necessarily favourable places for crystal nucleation. Finally, we show that adding external potential terms to the free energy, the PFC theory can be used to model colloid patterning experiments.Comment: 21 pages, 16 figure

Correlation functions and queuing phenomena in growth processes with drift

We suggest a novel stochastic discrete growth model which describes the drifted Edward-Wilkinson (EW) equation $\partial h /\partial t = \nu \partial_x^2 h - v\partial_x h +\eta(x,t)$. From the stochastic model, the anomalous behavior of the drifted EW equation with a defect is analyzed. To physically understand the anomalous behavior the height-height correlation functions $C(r)=$ and $G(r)=$ are also investigated, where the defect is located at $x_0$. The height-height correlation functions follow the power law $C(r)\sim r^{\alpha'}$ and $G(r)\sim r^{\alpha''}$ with $\alpha'=\alpha''=1/4$ around a perfect defect at which no growth process is allowed. $\alpha'=\alpha''=1/4$ is the same as the anomalous roughness exponent $\alpha=1/4$. For the weak defect at which the growth process is partially allowed, the normal EW behavior is recovered. We also suggest a new type queuing process based on the asymmetry $C(r) \neq C(-r)$ of the correlation function around the perfect defect

Dynamics and Kinetic Roughening of Interfaces in Two-Dimensional Forced Wetting

We consider the dynamics and kinetic roughening of wetting fronts in the case of forced wetting driven by a constant mass flux into a 2D disordered medium. We employ a coarse-grained phase field model with local conservation of density, which has been developed earlier for spontaneous imbibition driven by a capillary forces. The forced flow creates interfaces that propagate at a constant average velocity. We first derive a linearized equation of motion for the interface fluctuations using projection methods. From this we extract a time-independent crossover length $\xi_\times$, which separates two regimes of dissipative behavior and governs the kinetic roughening of the interfaces by giving an upper cutoff for the extent of the fluctuations. By numerically integrating the phase field model, we find that the interfaces are superrough with a roughness exponent of $\chi = 1.35 \pm 0.05$, a growth exponent of $\beta = 0.50 \pm 0.02$, and $\xi_\times \sim v^{-1/2}$ as a function of the velocity. These results are in good agreement with recent experiments on Hele-Shaw cells. We also make a direct numerical comparison between the solutions of the full phase field model and the corresponding linearized interface equation. Good agreement is found in spatial correlations, while the temporal correlations in the two models are somewhat different.Comment: 9 pages, 4 figures, submitted to Eur.Phys.J.

Linear theory of unstable growth on rough surfaces

Unstable homoepitaxy on rough substrates is treated within a linear continuum theory. The time dependence of the surface width $W(t)$ is governed by three length scales: The characteristic scale $l_0$ of the substrate roughness, the terrace size $l_D$ and the Ehrlich-Schwoebel length $l_{ES}$. If $l_{ES} \ll l_D$ (weak step edge barriers) and $l_0 \ll l_m \sim l_D \sqrt{l_D/l_{ES}}$, then $W(t)$ displays a minimum at a coverage $\theta_{\rm min} \sim (l_D/l_{ES})^2$, where the initial surface width is reduced by a factor $l_0/l_m$. The r\^{o}le of deposition and diffusion noise is analyzed. The results are applied to recent experiments on the growth of InAs buffer layers [M.F. Gyure {\em et al.}, Phys. Rev. Lett. {\bf 81}, 4931 (1998)]. The overall features of the observed roughness evolution are captured by the linear theory, but the detailed time dependence shows distinct deviations which suggest a significant influence of nonlinearities