Coherent diffuse neutron scattering from UO₂ and ThO₂ at temperatures above 2000K

The structure of the View the MathML source reconstruction induced by adsorption of View the MathML source of a monolayer of Sn on the Si(111) surface has been determined using surface X-ray diffraction. The in-plane projection of the surface structure, obtained from structure factors near zero perpendicular momentum transfer, indicates substantial lateral displacements of the Si atoms. Intensity profiles of the fractional order rods give information concerning displacements normal to the surface. The adatoms are shown to occupy sites above second layer Si atoms. Incorporation of elastic strain minimisation into the structure factor analysis enables the identification of relaxations extending six layers into the bulk

Electropolymerisation and properties of conducting polymers derived from aminobenzenesulphonic acids and from mixtures with aniline

The electrochemical polymerisation of 2- and 4-aminobenzenesulphonic acids (orthanilic acid and sulphanilic acid) in sulphuric acid solution and co-polymerisation of mixtures of aniline and acid monomers, have been systematically investigated. The polymers formed have been characterised voltammetrically. Further evidence concerning the polymer structure and chemical composition has been obtained by IR spectroscopy and scanning electron microscopy (SEM).http://www.sciencedirect.com/science/article/B6TY7-44KM0ST-X/1/36670ca564b886f8c1c6c7366e336bf