271 research outputs found
Plasma-beam instabilities in cometary ionospheres
It is shown that the interaction between the solar wind flux and the cometary ionosphere leads to the excitation of ion sound, whistler, electron-cyclotron, low hybrid, and magnetohydrodynamic waves. We investigated the frequency spectrum and found linear-increasing increments and lengths of excited waves
Evaluation of ambipolar potential barrier in the gas dynamic trap by Doppler spectroscopy
The recently developed Doppler spectroscopy diagnostic has been used to
evaluate the height of the ambipolar potential barrier forming in the gas
dynamic trap (GDT) plasma between the central cell and the region with a large
magnetic expansion ratio beyond the mirror. The diagnostic technique based on
the gas jet charge exchange target, allowed to measure the potential profile
along the line of sight covering the radial range from the axis to the limiter.
The on-axis potential drop was found to be in units of the
central plane electron temperature, which supports the existing theoretical
understanding of suppression of electron thermal conductivity in the GDT
expander
Long, Saturated Chains: Tasty Domains for Kinases of Insulin Resistance
The mechanistic basis of how cells respond to increased fatty acids (FAs) is murky but potentially involves receptor-mediated activation or inhibition by different FA classes. Holzer etΒ al. (2011) recently propose in Cell that expansion of intracellular membrane microdomains induced by saturated FA recruit and activate c-Src for JNK activation
Integrated diffractometry: achieved progress and new performance capabilities
This review provides a brief overview and a discussion of dynamical integrated diffractometry and its functional capabilities. It is demonstrated that the combined use of measurements of integrated diffraction parameters on different diffraction conditions allows determining the parameters of several types of microdefects, which are simultaneously present in a single crystal. These parameters are the total integrated intensity of dynamical diffraction, the contribution of its diffuse component, and their dependences on different diffraction conditions. Examples of the use of integrated diffraction parameters for non-destructive express diagnostics of the characteristics of the defectsβ structure of single crystals are discussed.Π‘ΡΠ°ΡΡΡ ΠΏΡΠΈΡΠ²ΡΡΠ΅Π½ΠΎ ΠΎΠ±Π³ΠΎΠ²ΠΎΡΠ΅Π½Π½Ρ Π΄ΠΈΠ½Π°ΠΌΡΡΠ½ΠΎΡ ΡΠ½ΡΠ΅Π³ΡΠ°Π»ΡΠ½ΠΎΡ Π΄ΠΈΡΡΠ°ΠΊΡΠΎΠΌΠ΅ΡΡΡΡ ΡΠ° ΡΡ ΡΡΠ½ΠΊΡΡΠΎΠ½Π°Π»ΡΠ½ΠΈΡ
ΠΌΠΎΠΆΠ»ΠΈΠ²ΠΎΡΡΠ΅ΠΉ. ΠΠΎΠΊΠ°Π·Π°Π½ΠΎ, ΡΠΎ ΠΊΠΎΠΌΠ±ΡΠ½ΠΎΠ²Π°Π½Π΅ Π²ΠΈΠΊΠΎΡΠΈΡΡΠ°Π½Π½Ρ Π²ΠΈΠΌΡΡΡΠ²Π°Π½Ρ ΡΠ½ΡΠ΅Π³ΡΠ°Π»ΡΠ½ΠΈΡ
Π΄ΠΈΡΡΠ°ΠΊΡΡΠΉΠ½ΠΈΡ
ΠΏΠ°ΡΠ°ΠΌΠ΅ΡΡΡΠ² Π·Π° ΡΡΠ·Π½ΠΈΡ
ΡΠΌΠΎΠ² Π΄ΠΈΡΡΠ°ΠΊΡΡΡ ΡΠΌΠΎΠΆΠ»ΠΈΠ²Π»ΡΡ Π²ΠΈΠ·Π½Π°ΡΠ΅Π½Π½Ρ ΠΏΠ°ΡΠ°ΠΌΠ΅ΡΡΡΠ² ΠΌΡΠΊΡΠΎΠ΄Π΅ΡΠ΅ΠΊΡΡΠ² Π΄Π΅ΠΊΡΠ»ΡΠΊΠΎΡ
ΡΠΈΠΏΡΠ², ΠΎΠ΄Π½ΠΎΡΠ°ΡΠ½ΠΎ ΠΏΡΠΈΡΡΡΠ½ΡΡ
Ρ ΠΌΠΎΠ½ΠΎΠΊΡΠΈΡΡΠ°Π»Ρ. ΠΠ±Π³ΠΎΠ²ΠΎΡΡΡΡΡΡΡ ΠΏΡΠΈΠΊΠ»Π°Π΄ΠΈ Π²ΠΈΠΊΠΎΡΠΈΡΡΠ°Π½Π½Ρ Π²ΠΈΠΌΡΡΡΠ²Π°Π½Π½Ρ ΠΏΠΎΠ²Π½ΠΎΡ ΡΠ½ΡΠ΅Π³ΡΠ°Π»ΡΠ½ΠΎΡ ΡΠ½ΡΠ΅Π½ΡΠΈΠ²Π½ΠΎΡΡΡ Π΄ΠΈΠ½Π°ΠΌΡΡΠ½ΠΎΡ Π΄ΠΈΡΡΠ°ΠΊΡΡΡ, Π²Π½Π΅ΡΠΊΡ ΡΡ Π΄ΠΈΡΡΠ·ΡΠΉΠ½ΠΎΡ ΡΠΊΠ»Π°Π΄ΠΎΠ²ΠΎΡ ΡΠ° ΡΡ
Π½ΡΡ
Π·Π°Π»Π΅ΠΆΠ½ΠΎΡΡΠ΅ΠΉ Π²ΡΠ΄ ΡΡΠ·Π½ΠΈΡ
ΡΠΌΠΎΠ² Π΄ΠΈΠ½Π°ΠΌΡΡΠ½ΠΎΡ Π΄ΠΈΡΡΠ°ΠΊΡΡΡ Π΄Π»Ρ Π½Π΅ΡΡΠΉΠ½ΡΠ²Π½ΠΎΡ Π΅ΠΊΡΠΏΡΠ΅ΡΠ½ΠΎΡ Π΄ΡΠ°Π³Π½ΠΎΡΡΠΈΠΊΠΈ Ρ
Π°ΡΠ°ΠΊΡΠ΅ΡΠΈΡΡΠΈΠΊ Π΄Π΅ΡΠ΅ΠΊΡΠ½ΠΎΡ ΡΡΡΡΠΊΡΡΡΠΈ ΠΌΠΎΠ½ΠΎΠΊΡΠΈΡΡΠ°Π»ΡΡΠ½ΠΈΡ
ΡΠΈΡΡΠ΅ΠΌ.Π‘ΡΠ°ΡΡΡ ΠΏΠΎΡΠ²ΡΡΠ΅Π½Π° ΠΎΠ±ΡΡΠΆΠ΄Π΅Π½ΠΈΡ Π΄ΠΈΠ½Π°ΠΌΠΈΡΠ΅ΡΠΊΠΎΠΉ ΠΈΠ½ΡΠ΅Π³ΡΠ°Π»ΡΠ½ΠΎΠΉ Π΄ΠΈΡΡΠ°ΠΊΡΠΎΠΌΠ΅ΡΡΠΈΠΈ ΠΈ Π΅Ρ ΡΡΠ½ΠΊΡΠΈΠΎΠ½Π°Π»ΡΠ½ΡΡ
Π²ΠΎΠ·ΠΌΠΎΠΆΠ½ΠΎΡΡΠ΅ΠΉ. ΠΠΎΠΊΠ°Π·Π°Π½ΠΎ, ΡΡΠΎ ΠΊΠΎΠΌΠ±ΠΈΠ½ΠΈΡΠΎΠ²Π°Π½Π½ΠΎΠ΅ ΠΈΡΠΏΠΎΠ»ΡΠ·ΠΎΠ²Π°Π½ΠΈΠ΅ ΠΈΠ·ΠΌΠ΅ΡΠ΅Π½ΠΈΠΉ ΠΈΠ½ΡΠ΅Π³ΡΠ°Π»ΡΠ½ΡΡ
Π΄ΠΈΡΡΠ°ΠΊΡΠΈΠΎΠ½Π½ΡΡ
ΠΏΠ°ΡΠ°ΠΌΠ΅ΡΡΠΎΠ² ΠΏΡΠΈ ΡΠ°Π·Π»ΠΈΡΠ½ΡΡ
ΡΡΠ»ΠΎΠ²ΠΈΡΡ
Π΄ΠΈΡΡΠ°ΠΊΡΠΈΠΈ ΠΏΠΎΠ·Π²ΠΎΠ»ΡΠ΅Ρ ΠΎΠΏΡΠ΅Π΄Π΅Π»ΡΡΡ ΠΏΠ°ΡΠ°ΠΌΠ΅ΡΡΡ ΠΌΠΈΠΊΡΠΎΠ΄Π΅ΡΠ΅ΠΊΡΠΎΠ² Π½Π΅ΡΠΊΠΎΠ»ΡΠΊΠΈΡ
ΡΠΈΠΏΠΎΠ², ΠΎΠ΄Π½ΠΎΠ²ΡΠ΅ΠΌΠ΅Π½Π½ΠΎ ΠΏΡΠΈΡΡΡΡΡΠ²ΡΡΡΠΈΡ
Π² ΠΌΠΎΠ½ΠΎΠΊΡΠΈΡΡΠ°Π»Π»Π΅. ΠΠ±ΡΡΠΆΠ΄Π°ΡΡΡΡ ΠΏΡΠΈΠΌΠ΅ΡΡ ΠΈΡΠΏΠΎΠ»ΡΠ·ΠΎΠ²Π°Π½ΠΈΡ ΠΈΠ·ΠΌΠ΅ΡΠ΅Π½ΠΈΡ ΠΏΠΎΠ»Π½ΠΎΠΉ ΠΈΠ½ΡΠ΅Π³ΡΠ°Π»ΡΠ½ΠΎΠΉ ΠΈΠ½ΡΠ΅Π½ΡΠΈΠ²Π½ΠΎΡΡΠΈ Π΄ΠΈΠ½Π°ΠΌΠΈΡΠ΅ΡΠΊΠΎΠΉ Π΄ΠΈΡΡΠ°ΠΊΡΠΈΠΈ, Π²ΠΊΠ»Π°Π΄Π° Π΅Ρ Π΄ΠΈΡΡΡΠ·Π½ΠΎΠΉ ΡΠΎΡΡΠ°Π²Π»ΡΡΡΠ΅ΠΉ ΠΈ ΠΈΡ
Π·Π°Π²ΠΈΡΠΈΠΌΠΎΡΡΠ΅ΠΉ ΠΎΡ ΡΠ°Π·Π»ΠΈΡΠ½ΡΡ
ΡΡΠ»ΠΎΠ²ΠΈΠΉ Π΄ΠΈΠ½Π°ΠΌΠΈΡΠ΅ΡΠΊΠΎΠΉ Π΄ΠΈΡΡΠ°ΠΊΡΠΈΠΈ Π΄Π»Ρ Π½Π΅ΡΠ°Π·ΡΡΡΠ°ΡΡΠ΅ΠΉ ΡΠΊΡΠΏΡΠ΅ΡΡΠ½ΠΎΠΉ Π΄ΠΈΠ°Π³Π½ΠΎΡΡΠΈΠΊΠΈ Ρ
Π°ΡΠ°ΠΊΡΠ΅ΡΠΈΡΡΠΈΠΊ Π΄Π΅ΡΠ΅ΠΊΡΠ½ΠΎΠΉ ΡΡΡΡΠΊΡΡΡΡ ΠΌΠΎΠ½ΠΎΠΊΡΠΈΡΡΠ°Π»Π»ΠΈΡΠ΅ΡΠΊΠΈΡ
ΡΠΈΡΡΠ΅ΠΌ
Optical bus of centralized relay protection and automation system of medium voltage switchgear for data collection and transmission
The article deals with the system of information collection and transfer from a centralized relay protection and automation system for medium voltage electrical units based on a passive optical bus. The issues of electromagnetic compatibility of technical devices are also considered, and the intensity of electromagnetic interference is calculated in the distribution center of medium voltage. Since the electric power industry objects are characterized by a complex electromagnetic environment, including a significant adverse effect on the reliability and full functionality of modern microprocessor relay protection and anti-emergency automatic systems, the solution is considered for a centralized relay protection and automation system based on xPON passive optical network technology.Key words: centralized system of relay protection and automation, signaling and measurements; distribution point of medium voltage; medium voltage distribution network; electromagnetic interference; conductive low-frequency interference; conductive highfrequency interference; IEC 61850; IEC 61000-2-5-195; IEC 61000-4; Degree of electromagnetic compatibility intensity
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