Cobalt Xanthate Thin Film with Chemical Bath Deposition

Cobalt xanthate thin films (CXTFs) were successfully deposited by chemical bath deposition, onto amorphous glass substrates, as well as on p- and n-silicon, indium tin oxide, and poly(methyl methacrylate). The structure of the films was analyzed by far-infrared spectrum (FIR), mid-infrared (MIR) spectrum, nuclear magnetic resonance (NMR), and scanning electron microscopy (SEM). These films were investigated from their structural, optical, and electrical properties point of view. Electrical properties were measured using four-point method, whereas optical properties were investigated via UV-VIS spectroscopic technique. Uniform distribution of grains was clearly observed from the photographs taken by scanning electron microscope (SEM). The transmittance was about 70–80% (4 hours, 50°C). The optical band gap of the CXTF was graphically estimated to be 3.99–4.02 eV. The resistivity of the films was calculated as 22.47–75.91 Ω·cm on commercial glass depending on film thickness and 44.90–73.10 Ω ·cm on the other substrates. It has been observed that the relative resistivity changed with film thickness. The MIR and FIR spectra of the films were in agreement with the literature analogues. The expected peaks of cobalt xanthate were observed in NMR analysis on glass. The films were dipped in chloroform as organic solvent and were analyzed by NMR

Crystalline TeO₂ thin film with chemical bath deposition

175-179Tellurium oxide (TeO2) crystalline thin film has been produced with chemical bath deposition on substrates (commercial glass). Some properties of the films have been investigated by UV/VIS. The spectrum has been studied in terms of as transmittance, refractive index and reflectivity. The monoclinic and orthorhombic forms have been observed for the structural properties in XRD. The structural and optical properties of tellurium oxide thin films have been analyzed at different pHs of the chemical bath. EDX analysis has been used to determine the elemental ratio of tellurium in the films. Some properties of the films change with deposition pH. The concentration of sodium hydroxide was scanned at 2.5×10-3 M, 5×10-3 M, 7.5×10-3 M and 10×10-3 M at pHs of 10, 11, 11.50 and 12, respectively. The optical properties of the films change with the deposition pH of the chemical bath. Also, the film thickness changes with deposition pH at 12, 11.50, 11 and 10 and the respective thickness values are 900, 586, 657 and 866 nm. The optimum parameters have been determined with 10 mL 2.5×10-3 M tellurium tetrachloride, 10 mL 2.5×10-3 M of potassium hydroxide and 2 mL hydrogen peroxide at pH: 10 for producing γ-TeO2

Characterization of High Quality Chalcogenide Thin Film Fabricated by Chemical Bath Deposition

The structural, electrical and optical properties of chalcogenide thin films deposited by chemical bath deposition are studied as a function of the pH value of the chemical bath. The orthorhombic polycrystalline structures thin films with preferred orientation along (201) are determined by the x-ray diffraction technique (XRD). The surface morphology of the thin films is determined using a scanning electron microscope (SEM). Measurements of electrical were carried out using a Hall Effect measurement. According to this measurement data, the mobility increases from 98.4 to 670.9 (cm(2)/V.s). To determine optical properties of the thin films, UV-vis spectrometer was used. We determined that the optical band gap (Eg) of the film gradually decreases from 2.22 to 1.95 eV with increase in the pH value of the chemical bath. Additionally, the refractive index and extinction coefficient of the thin films were calculated using these data

Optical properties of amorphous CuS thin films deposited chemically at different pH values

Amorphous copper sulfide thin films were deposited on commercial glass substrates at room temperature by chemical bath deposition. The effect of the pH value of the chemical bath on the optical properties of the amorphous thin films is investigated and discussed. The influence of the pH value of the chemical bath was examined by means of the optical transmission of the thin films in the wavelength range of 300-1100 nm taken at room temperature. Next, using these data, the absorption coefficient, the optical band gap value, the extinction coefficient, the refractive index, and the real and imaginary parts of the dielectric constant were calculated. The dispersion of the refractive index of the thin films was also investigated in terms of the single-oscillator Wemple and DiDomenico method. The value of the optical band gap determined by Tauc's extrapolation was found to be equal to one and half times the oscillator energy values of all deposited films. (C) 2011 Elsevier B.V. All rights reserved

Optical and electronic properties of iron xanthate thin film

348-353The iron xanthate thin films (IXTF) were deposited by the chemical bath deposition method on various substrates, such as amorphous glass, <i style="mso-bidi-font-style: normal">p and n-silicon, indium tin oxide and poly(methyl methacrylate). The structure of the films was analyzed by far-infrared spectrum (FIR), mid-infrared (MIR) spectrum and scanning electron microscope (SEM) and their structural, optical and electrical properties were examined. Electrical properties were measured using the four-point method whereas optical properties were investigated via the UV-VIS spectroscopic technique. The transmittance was found to be 70-80% at optimum deposition time and temperature (4 h, 50°C). The optical band gap of the IXTF was graphically estimated to be 3.62-3.83 eV. The resistivity of the films was calculated to be between 23.5-38.5 Ω∙cm on commercial glass depending on the film thickness and between 23.8-42.0 Ω∙cm on the other substrates. It was found that resistivity changed with film thickness. The MIR and FIR spectra of the films were in line with the literature analogues. </span

Preparation of iodine and silver coated thin film on poly(methylmethacrylate) substrate and examination of antifungal, antibacterial and mechanistic properties

122-128In this study, iodine (I2) and silver (Ag) have been deposited on polymer substrate, namely poly(methylmethacrylate), via chemical bath deposition (CBD). For the sake of simplicity, uncoated poly(methylmethacrylate), iodine coated poly(methylmethacrylate) thin film and silver coated iodized thin film on poly(methylmethacrylate) have been denoted as PMM, I2-PMM and Ag-I2-PMM. Capacitance of the film has been measured with a LCR meter, whereas surface tensions were measured by a tensiometer. Transmittance, reflectance and absorption properties of thin films have been investigated via an UV-vis spectrometer. Elemental composition of uncoated PMM and thin films has been discovered by means of energy dispersive X-ray (EDX). Elemental composition of uncoated PMM has been determined as 64% C and 36% O, whereas Ag-I2-PMM contained 28% iodine and 23% silver. X-ray photoelectron spectroscopy (XPS) has been employed to characterize the surface structure of I2-PMM and Ag-I2-PMM. In addition, antimicrobial properties of the silver coated material have been examined

Electrical energy deposition on mitochondria and the different substrates

Mitochondria were deposited via dip coating on different substrates, namely, commercial glass, copper plate (Cu), aluminum plate (Al), and poly (methylmethacrylate). Mitochondria are organelles that are found in live cells. Mitochondria produce most of the ATP via oxidative phosphorylation. First, mitochondria were extracted for the thin film, as described in the literature. Capacitance properties of thin films were measured with Agilent LCR meter. SEM analysis was used for the surface analysis. The structure of mitochondrion was characterized with FTIR, whose spectrum was measured using a Perkin Elmer Spectrum 400 spectrometer. The stretching vibration of the P-O bond was observed at 1236 cm(-1) in FTIR spectrum of the thin film. The capacitance and dielectric permittivity were first measured and calculated for the substrates, and then for mitochondria plated substrates. The properties, such as dielectric permittivity, capacitance, energy density, and power density of some substrates have been changed when their surface has been coated with mitochondria. Published by AIP Publishing

Effect of pH on the physical properties of CdS thin films deposited by CBD

CdS thin films with different pH values changing from 9 to 12 were deposited on glass substrates using chemical bath deposition technique (CBD). The effect of pH on the structural, optical and electrical properties of CdS thin films is investigated. X-ray diffraction, Ultraviolet-visible absorption spectroscopy, Scanning electron microscopy, Energy dispersive X-ray analysis, and Raman spectroscopy were used to characterize the thin films. X-ray diffraction data reveal growth of the cubic phase with preferential orientation along (1 1 1) direction. Raman peaks appearing at 296 cm -1 and 593 cm -1 for all samples were attributed to 1LO and 2LO phonons of CdS, and they shifted to the blue region with increase in pH values. The band gap of the films increased from 2.29 to 2.40 eV with increasing pH values. Resistivity, carrier density and mobility of the films were determined using Hall effect measurements. After all investigations, it was concluded that the pH value of 11 is suitable for producing CdS thin films by chemical bath deposition technique. The formed film was transparent, uniform and with good adherence to the substrate. These results indicate that films obtained at pH 11 by CBD are good candidates for applications in different optoelectronic devices