Application of different organic and mineral fertilizers on the growth, yield and nutrient accumulation of rice in a Japanese ordinary paddy field

A rice cultivation study was conducted at Kyushu University farm. Cow manure (CM), poultry manure (PM), rice straw + urea mix-application (SU), urea (UF) and M-coat, a slow released compound fertilizer (M-coat) were used as the N sources by comparing with no application (Control). Treatments were made with two levels application of each N source at 40 (level I) and 80 kg N ha-1(level II) excluding M-coat. In all urea treatments, three split applications were made. A study of soil incubation was conducted for 2 weeks to investigate the mineralized N of applied mineral and organic fertilizer. Plant growth characters, dry matter, yield and plant nutrient accumulations were higher in mineral fertilization than organic. Mineral fertilization was observed in correlation with the larger crop removal. PM-II as an organic matter provided comparatively higher nutrient accumulations which in turn enhanced the growth and yield of rice. CM and SU gave the lower plant growth, yield and nutrient accumulation. Mineralized N was higher in sole mineral N applications. Organic matter with high C/N ratio provided very low mineralized N and its net N mineralization percentage. Negative values of net N mineralization percentage were observed in SU due to N immobilization. Keywords: Cow Manure, Mineralized N, Paddy Soil, Poultry Manure, Rice (Oryza sativa L.), Rice Stra

A note on the Gauss decomposition of the elliptic Cauchy matrix

Explicit formulas for the Gauss decomposition of elliptic Cauchy type matrices are derived in a very simple way. The elliptic Cauchy identity is an immediate corollary.Comment: 5 page

UV-B radiation amplification factor determined based on the simultaneous observation of total ozone and global spectral irradiance

The Japan Meteorological Agency started the spectral observation of solar ultraviolet (UV) irradiance on 1 January 1990 at Tateno, Aerological Observatory in Tsukuba (35 deg N, 140 deg E). The observation has been carried out using the Brewer spectrophotometer for the wavelengths from 290 to 325 nm with a 0.5 nm interval every hour from 30 minutes before sunrise to 30 minutes after sunset throughout a year. Because of remarkable similarity within observed spectra, an observed spectrum can be expressed by a simple combination of a reference spectrum and two parameters expressing the deformation of the observed spectrum from the reference. By use of the relation between one of the deformation parameters and the total ozone simultaneously observed with the Dobson spectrophotometer, the possible increase of UV irradiance due to ozone depletion is estimated. For damaging UV, the irradiance possibly increases about 19 percent with the ozone depletion of 10 percent at noon throughout the year in the northern midlatitudes. DUV at noon on the summer solstice possibly increases about 5.6 percent with the ozone depletion of 10 m atm-cm for all latitudes in the Northern Hemisphere

CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing

At-speed scan testing is susceptible to yield loss risk due to power supply noise caused by excessive launch switching activity. This paper proposes a novel two-stage scheme, namely CTX (Clock-Gating-Based Test Relaxation and X-Filling), for reducing switching activity when test stimulus is launched. Test relaxation and X-filling are conducted (1) to make as many FFs inactive as possible by disabling corresponding clock-control signals of clock-gating circuitry in Stage-1 (Clock-Disabling), and (2) to make as many remaining active FFs as possible to have equal input and output values in Stage-2 (FF-Silencing). CTX effectively reduces launch switching activity, thus yield loss risk, even with a small number of donpsilat care (X) bits as in test compression, without any impact on test data volume, fault coverage, performance, and circuit design.2008 17th Asian Test Symposium (ATS 2008), 24-27 November 2008, Sapporo, Japa

Arthrectomy for traumatic proximal interphalangeal arthritis in the lateral digit in a heifer

ΔΕΝ ΔΙΑΤΙΘΕΤΑΙ ΠΕΡΙΛΗΨΗInstructive information on the treatment for chronic deep infections of digital joints in a 9-month-old Holstein heifer is described in this report. Preoperative ultrasonographic and radiographic examinations revealed soft tissue swelling and subchondral bone lysis at the distal part of the proximal phalanx in the lateral digit. Arthrectomy was performed under xylazine sedation to remove infectious articular cartilage tissues. Immature callus formation was observed via radiography at the surgical site by the 28th postoperative day. On the 48th postoperative day, callus fellinto disrepair on the radiographs along with aggravation of the locomotion score. After the application of a half-limb cast, the immature callus formed again by the 62nd postoperative day (11 months), and bony callus formation was observed by the 74th postoperative day. Thereafter, the heifer could walk well with marked improvement in the locomotion score. The withers height of the heifer at 13 months (136 cm) was within the range of that in control heifers of the same age on this farm (133 ± 3 cm); however, the body weight (BW) of this heifer (322 kg) was lower than the BW of controls (384 ± 26 kg). The BW gain from 11 to 13 months of age seemed to be higher in the present heifer (+76 kg) than in controls (+55±20 kg), suggesting that BW of the present heifer was returning to the original BW. Based on these observations, we suggested that arthrectomy was an effective treatment option for the present case of digital joint arthritis

On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST

The applicability of at-speed scan-based logic built-in self-test (BIST) is being severely challenged by excessive capture power that may cause erroneous test responses for good chips. Different from conventional low-power BIST, this paper is the first that has explicitly focused on achieving capture power safety with a practical scheme called capture-power-safe BIST (CPS-BIST). The basic idea is to identify all possibly erroneous test responses and use the well-known technique of mask (partial-mask or full-mask) to block them from reaching the MISR. Experiments with large benchmark and industrial circuits show that CPS-BIST can achieve capture power safety with negligible impact on both test quality and area overhead.2013 22nd Asian Test Symposium, 18-21 November 2013, Jiaosi Township, Taiwa