Compressive nano-FTIR chemical mapping

Nano-Fourier-transform infrared spectroscopy (nano-FTIR) combines infrared spectroscopy with scanning probe microscopy (SPM) techniques and enables spectroscopic imaging of molecular and electronic properties of matter at nanometer spatial resolution. The spectroscopic imaging can be used to derive chemical mappings, i.e. the spatial distribution of concentrations of the species contained in a given sample. However, due to the sequential scanning principle underlying SPM, recording the complete spectrum over a large spatial area leads to long measurement times. Furthermore, the acquired spectrum often contains additional signals from species and lineshape effects that are not explicitly accounted for. A compressive chemical mapping approach is proposed for undersampled nano-FTIR data that utilizes sparsity of these additional signals in the spectral domain. The approach combines a projection technique with standard compressed sensing, followed by a spatially regularized regression. Using real nano-FTIR measurements superimposed by simulated interferograms representing the chemical mapping of the contained species, it is demonstrated that the proposed procedure performs well even in cases in which the simulated interferograms and the sparse additional signals exhibit a strong spectral overlap

Assessment of Subsampling Schemes for Compressive Nano-FTIR Imaging

Nano-Fourier transform infrared (FTIR) imaging is a powerful scanning-based technique at nanometer spatial resolution that combines FTIR spectroscopy and scattering-type scanning near-field optical microscopy (s-SNOM). Recording large spatial areas using nano-FTIR is, however, limited, because its sequential data acquisition entails long measurement times. Compressed sensing and low-rank matrix reconstruction are mathematical techniques that can reduce the number of these measurements significantly by requiring only a small fraction of randomly chosen measurements. However, choosing this small set of measurements in a random fashion poses practical challenges for scanning procedures and does not save as much time as desired. We, therefore, consider different subsampling schemes of practical relevance that ensure rapid data acquisition, much faster than random subsampling, in combination with a low-rank matrix reconstruction procedure. It is demonstrated that the quality of the results for almost all subsampling schemes considered, namely, original Lissajous, triangle Lissajous, and random reflection subsampling, is similar to that achieved for random subsampling. This implies that nano-FTIR imaging can be significantly extended to also cover samples extended over large areas while maintaining its high spatial resolution

In-Situ Wear Measurement of Hot Forging Dies Using Robot Aided Endoscopic Fringe Projection

According to the current state of the art, wear conditions of forging dies are assessed visually in the dismantled state, as there is no measuring procedure available for inline wear measurement of hot forging dies. This paper introduces a handling concept for automated loading and in-situ tool inspection for a hot forging process. An industrial robot with a quick-change system mounted on its endeffector is utilized to integrate both, a high-temperature gripper and an endoscopic 3D-measurement sensor. By adapting the measuring method of fringe projection to an endoscopic design, the measuring system can be navigated into the difficult-to-access geometry of the forge and take high-precision 3D-measurements of the forging die. The ambient air heated by the forming process creates an inhomogeneous refractive index field around the measuring system and the hot die, which deflects the light during the measurement and deteriorates the overall accuracy of the reconstructed point cloud. This can lead to strong deviations in the reconstructed point clouds and the functional geometries calculated from them. Using a compressed air actuator, the measuring system can be protected from the heat effects of the measuring object, as well as from dirt. Furthermore, the effect of the inhomogeneous refractive index field can be significantly reduced. With this approach the in-situ wear measurement at highly stressed regions using the example of the mandrel radius and the flash radius will be demonstrated. These functional elements are of particular interest, as the thermal stress is high and large material flow takes place. For the wear determination, the functional elements of the tool are examined in detail by fitting geometrical features into the reconstructed point clouds and determining the deviations from a reference geometry. In addition, the measurement data is validated with the aid of a commercially available state-of-the-art measurement system

Nanoscale plasmonic phenomena in CVD-grown MoS2 monolayer revealed by ultra- broadband synchrotron radiation based nano-FTIR spectroscopy and near-field microscopy

Nanoscale plasmonic phenomena observed in single and bi-layers of molybdenum disulfide (MoS2) on silicon dioxide (SiO2) are reported. A scattering type scanning near-field optical microscope (s-SNOM) with a broadband synchrotron radiation (SR) infrared source was used. We also present complementary optical mapping using tunable CO2-laser radiation. Specifically, there is a correlation of the topography of well-defined MoS2 islands grown by chemical vapor deposition, as determined by atomic force microscopy, with the infrared (IR) signature of MoS2. The influence of MoS2 islands on the SiO2 phonon resonance is discussed. The results reveal the plasmonic character of the MoS2 structures and their interaction with the SiO2 phonons leading to an enhancement of the hybridized surface plasmon-phonon mode. A theoretical analysis shows that, in the case of monolayer islands, the coupling of the MoS2 optical plasmon mode to the SiO2 surface phonons does not affect the infrared spectrum significantly. For two-layer MoS2, the coupling of the extra inter-plane acoustic plasmon mode with the SiO2 surface transverse phonon leads to a remarkable increase of the surface phonon peak at 794 cm−1. This is in agreement with the experimental data. These results show the capability of the s-SNOM technique to study local multiple excitations in complex non- homogeneous structures

Fringe Projection Profilometry in Production Metrology: A Multi-Scale Comparison in Sheet-Bulk Metal Forming

Fringe projection profilometry in combination with other optical measuring technologies has established itself over the last decades as an essential complement to conventional, tactile measuring devices. The non-contact, holistic reconstruction of complex geometries within fractions of a second in conjunction with the lightweight and transportable sensor design open up many fields of application in production metrology. Furthermore, triangulation-based measuring principles feature good scalability, which has led to 3D scanners for various scale ranges. Innovative and modern production processes, such as sheet-bulk metal forming, thus, utilize fringe projection profilometry in many respects to monitor the process, quantify possible wear and improve production technology. Therefore, it is essential to identify the appropriate 3D scanner for each application and to properly evaluate the acquired data. Through precise knowledge of the measurement volume and the relative uncertainty with respect to the specimen and scanner position, adapted measurement strategies and integrated production concepts can be realized. Although there are extensive industrial standards and guidelines for the quantification of sensor performance, evaluation and tolerancing is mainly global and can, therefore, neither provide assistance in the correct, application-specific positioning and alignment of the sensor nor reflect the local characteristics within the measuring volume. Therefore, this article compares fringe projection systems across various scale ranges by positioning and scanning a calibrated sphere in a high resolution grid

Compressed sensing FTIR nano-spectroscopy and nano-imaging.

Infrared scattering scanning near-field optical microscopy (IR s-SNOM) provides for spectroscopic imaging with nanometer spatial resolution, yet full spatio-spectral imaging is constrained by long measurement times. Here, we demonstrate the application of compressed sensing algorithms to achieve hyperspectral FTIR-based nano-imaging at an order of magnitude faster imaging speed to achieve the same spectral content compared to conventional approaches. At the example of the spectroscopy of a single vibrational resonance, we discuss the relationship of prior knowledge of sparseness of the employed Fourier base functions and sub-sampling. Compressed sensing nano-FTIR spectroscopy promises both rapid and sensitive chemical nano-imaging which is highly relevant in academic and industrial settings for fundamental and applied nano- and bio-materials research

Partitioning of on-demand electron pairs

We demonstrate the high fidelity splitting of electron pairs emitted on demand from a dynamic quantum dot by an electronic beam splitter. The fidelity of pair splitting is inferred from the coincidence of arrival in two detector paths probed by a measurement of the partitioning noise. The emission characteristic of the on-demand electron source is tunable from electrons being partitioned equally and independently to electron pairs being split with a fidelity of 90%. For low beam splitter transmittance we further find evidence of pair bunching violating statistical expectations for independent fermions