Differences in genetic structuring of populations of the Argentine hemorrhagic fever reservoir, the rodent Calomys musculinus, from endemic and non endemic zones

Chiappero, M.B., Piacenza, M.F., Gardenal, C.N., Calderón, G., Provensal, C., Polop, J.J

Morphology evolution of thermally annealed polycrystalline thin films

Investigation of the morphology evolution of annealed polycrystalline Au(111) films by atomic force microscopy and x-ray diffraction leads to a continuous model that correlates such an evolution to local interactions between grains triggering different mechanisms of stress accommodation (grain zipping and shear strain) and relaxation (gap filling and grain rotation). The model takes into consideration findings concerning the in-plane reorientation of the grains during the coalescence to provide a comprehensive picture of the grain-size dependence of the interactions (underlying the origin of the growth stress in polycrystalline systems); and in particular it sheds light on the postcoalescence compressive stress as a consequence of the kinetic limitations for the reorientation of larger surface structuresThis paper was supported by the projects F1-54173 (bilateral program CSIC-Conacyt) 200960I182 (CSIC), and CCG10-UAM/MAT-5537 (DGUI-Comunidad de Madrid and Universidad Aut´onoma deMadrid). A.G.G. acknowledges the financial support of the MICINN Spanish Ministry under the project ESP2006-14282-C02-0

Is keV ion induced pattern formation on Si(001) caused by metal impurities?

We present ion beam erosion experiments performed in ultra high vacuum using a differentially pumped ion source and taking care that the ion beam hits the Si(001) sample only. Under these conditions no ion beam patterns form on Si for angles below 45 degrees with respect to the global surface normal using 2 keV Kr ions and fluences of 2 x 10^22 ions/m^2. In fact, the ion beam induces a smoothening of preformed patterns. Simultaneous sputter deposition of stainless steel in this angular range creates a variety of patterns, similar to those previously ascribed to clean ion beam induced destabilization of the surface profile. Only for grazing incidence with incident angles between 60 degrees and 83 degrees pronounced ion beam patterns form. It appears that the angular dependent stability of Si(001) against pattern formation under clean ion beam erosion conditions is related to the angular dependence of the sputtering yield, and not primarily to a curvature dependent yield as invoked frequently in continuum theory models.Comment: 15 pages, 7 figures. This is an author-created, un-copyedited version of an article published in Nanotechnology. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from i

Разработка и программная реализация алгоритма детектирования номерных знаков на изображениях

Объектом исследования является задача определения расположения номерной пластины на изображении. Цель работы – разработка и программная реализация алгоритмов детектирования номерных знаков. В процессе исследования были изучены и проанализированы существующие методы детектирования номерных знаков, методы текстурной сегментации изображений и методы предобработки изображения. В результате исследования был предложен и реализован алгоритм детектирования номерных знаков на изображениях. Программное обеспечение позволит детектировать номерные знаки автомобилей. Может быть востребовано в системах контроля и регистрации автомобилей и других видов транспортных средств.The object of study is the problem of determining the location of the license plate in the image. The work purpose – development and software implementation of algorithms for the detection of license plates. In the research process was studied and analyzed existing methods of license plate detection methods, texture segmentation of images and methods of image preprocessing. The study was proposed and implemented algorithm detecting license plates in images.The software will detect number plates of cars. It can be used in the systems of control and registration of cars and other types of vehicle

A multi-technique approach to understanding delithiation damage in LiCoO thin films

We report on the delithiation of LiCoO2 thin films using oxalic acid (C2H2O4) with the goal of understanding the structural degradation of an insertion oxide associated with Li chemical extraction. Using a multi-technique approach that includes synchrotron radiation X-ray diffraction, scanning electron microscopy, micro Raman spectroscopy, photoelectron spectroscopy and conductive atomic force microscopy we reveal the balance between selective Li extraction and structural damage. We identify three different delithiation regimes, related to surface processes, bulk delithiation and damage generation. We find that only a fraction of the grains is affected by the delithiation process, which may create local inhomogeneities. However, the bulk delithiation regime is effective to delithiate the LCO film. All experimental evidence collected indicates that the delithiation process in this regime mimics the behavior of LCO upon electrochemical delithiation. We discard the formation of Co oxalate during the chemical extraction process. In conclusion, the chemical route to Li extraction provides additional opportunities to investigate delithiation while avoiding the complications associated with electrolyte breakdown and simplifying in-situ measurement

Understanding the intrinsic compression in polycrystalline films through a mean-field atomistic model

This is the Accepted Manuscript version of an article accepted for publication in Journal of Physics D: Applied Physics. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at 10.1088/1361-6463/abc11