584 research outputs found

    Noise Considerations for Manned Reentry Vehicles

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    Noise measurements pertaining mainly to the static firing, launch, 0 and exit flight phases are presented for three rocket-powered vehicles 4 in the Project Mercury test program. Both internal and external data 4 from onboard recordings are presented for a range of Mach numbers and dynamic pressures and for different external vehicle shapes. The main sources of noise are noted to be the rocket engines during static firing and launch and the aerodynamic boundary layer during the high-dynamic-pressure portions of the flight. Rocket-engine noise measurements along the surface of the Mercury Big Joe vehicle were noted to correlate well with data from small models and available data for other large rockets. Measurements have indicated that the aerodynamic noise pressures increase approximately as the dynamic pressure increases and may vary according to the external shape of the vehicle, the highest noise levels being associated with conditions of flow separation. There is also a trend for the aerodynamic noise spectra to peak at higher frequencies as the flight Mach number increases

    Risk factors for cardiovascular disease in people with idiopathic pulmonary fibrosis: a population-based study

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    OBJECTIVE: People with idiopathic pulmonary fibrosis (IPF) have been shown to be at an increased risk for cardiovascular (CV) disease, but reasons for this are unknown. The aim of this study was to compare the prevalence of common CV risk factors in people with IPF and the general population and establish the incidence of ischemic heart disease (IHD) and stroke after the diagnosis of IPF, controlling for these risk factors. METHODS: We used data from a large, UK primary care database to identify incident cases of IPF and matched general-population control subjects. We compared the prevalence of risk factors for CV disease and prescription of CV medications in people with IPF (before diagnosis) with control subjects from the general population and assessed the incidence of IHD and stroke in people with IPF (after diagnosis) compared with control subjects. RESULTS: We identified 3,211 cases of IPF and 12,307 control subjects. Patients with IPF were more likely to have a record of hypertension (OR, 1.31; 95% CI, 1.19-1.44), and diabetes (OR, 1.20; 95% CI, 1.07-1.34) compared with control subjects; they were also more likely to have been prescribed several CV drugs. The rate of first-time IHD events was more than twice as high in patients than control subjects (rate ratio, 2.32; 95% CI, 1.85-2.93; P < .001), but the incidence of stroke was only marginally higher (P = .09). Rate ratios for IHD and stroke were not altered substantially after adjusting for CV risk factors. CONCLUSIONS: Several CV risk factors were more prevalent in people with IPF; however, this did not account for the increased rate of IHD in this group of patients

    STEM EBIC Mapping of the Metal-Insulator Transition in Thin-film NbO 2

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    This article has been published in a revised form in Microscopy and Microanalysis https://doi.org/10.1017/S1431927617007802. This version is free to view and download for private research and study only. Not for re-distribution, re-sale or use in derivative works. © copyright holder

    Differential electron yield imaging with STXM

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    Total electron yield (TEY) imaging is an established scanning transmission X-ray microscopy (STXM) technique that gives varying contrast based on a sample's geometry, elemental composition, and electrical conductivity. However, the TEY-STXM signal is determined solely by the electrons that the beam ejects from the sample. A related technique, X-ray beam-induced current (XBIC) imaging, is sensitive to electrons and holes independently, but requires electric fields in the sample. Here we report that multi-electrode devices can be wired to produce differential electron yield (DEY) contrast, which is also independently sensitive to electrons and holes, but does not require an electric field. Depending on whether the region illuminated by the focused STXM beam is better connected to one electrode or another, the DEY-STXM contrast changes sign. DEY-STXM images thus provide a vivid map of a device's connectivity landscape, which can be key to understanding device function and failure. To demonstrate an application in the area of failure analysis, we image a 100~nm, lithographically-defined aluminum nanowire that has failed after being stressed with a large current density.Comment: 8 pages, 6 figure
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