2,340 research outputs found
Gate-Level Simulation of Quantum Circuits
While thousands of experimental physicists and chemists are currently trying
to build scalable quantum computers, it appears that simulation of quantum
computation will be at least as critical as circuit simulation in classical
VLSI design. However, since the work of Richard Feynman in the early 1980s
little progress was made in practical quantum simulation. Most researchers
focused on polynomial-time simulation of restricted types of quantum circuits
that fall short of the full power of quantum computation. Simulating quantum
computing devices and useful quantum algorithms on classical hardware now
requires excessive computational resources, making many important simulation
tasks infeasible. In this work we propose a new technique for gate-level
simulation of quantum circuits which greatly reduces the difficulty and cost of
such simulations. The proposed technique is implemented in a simulation tool
called the Quantum Information Decision Diagram (QuIDD) and evaluated by
simulating Grover's quantum search algorithm. The back-end of our package,
QuIDD Pro, is based on Binary Decision Diagrams, well-known for their ability
to efficiently represent many seemingly intractable combinatorial structures.
This reliance on a well-established area of research allows us to take
advantage of existing software for BDD manipulation and achieve unparalleled
empirical results for quantum simulation
Fault Testing for Reversible Circuits
Applications of reversible circuits can be found in the fields of low-power
computation, cryptography, communications, digital signal processing, and the
emerging field of quantum computation. Furthermore, prototype circuits for
low-power applications are already being fabricated in CMOS. Regardless of the
eventual technology adopted, testing is sure to be an important component in
any robust implementation.
We consider the test set generation problem. Reversibility affects the
testing problem in fundamental ways, making it significantly simpler than for
the irreversible case. For example, we show that any test set that detects all
single stuck-at faults in a reversible circuit also detects all multiple
stuck-at faults. We present efficient test set constructions for the standard
stuck-at fault model as well as the usually intractable cell-fault model. We
also give a practical test set generation algorithm, based on an integer linear
programming formulation, that yields test sets approximately half the size of
those produced by conventional ATPG.Comment: 30 pages, 8 figures. to appear in IEEE Trans. on CA
Removing constantâinduced errors in stochastic circuits
Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/163790/1/cdt2bf00226.pd
The UAE\u27s tourism competitiveness: A business perspective
© 2019 Elsevier Ltd The United Arab Emirates (UAE) is one of the most popular tourism destinations and the most competitive in the Middle East and North Africa region. Currently, the country aims to reach its full potential to better compete on a global scale. This paper examines factors influencing the competitiveness of the UAE as a tourism destination from the business perspective. The data were collected from a convenience sample of 311 business entrepreneurs and analyzed using a hierarchical regression. The results suggest that destination resources, destination infrastructure and support services, and the general business environment have a significant influence on the UAE\u27s tourism competitiveness. The implications of the study\u27s results are discussed
On the Equivalence of Regular Expressions
Coordinated Science Laboratory was formerly known as Control Systems LaboratoryJoint Services Electronics Program / DAAB-07-67-C-0199NSF GK-166
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