Comparative study of annealed and high temperature grown ITO and AZO films for solar energy applications

We present the optical and electrical properties of ITO and AZO films fabricated directly on silicon substrates under several growth and annealing temperatures, as well as their potential performance when used as low emissivity coatings in hybrid photovoltaic-thermal systems. We use broadband spectroscopic ellipsometry measurements (from 300 nm to 20 μm) to obtain a consistent model for the permittivity of each of the films. The best performance is found using the properties of the ITO film grown at 250 °C, with a state of the art resistivity of 0.2 mΩ-cm and an optimized thickness of 75 nm which leads to an estimated 50% increase in the extracted power compared to a standard diffused silicon solar cell. The Hall mobility and resistivity measurements of all the films are also provided, complementing and supporting the observed optical properties

Thermoelectric cross-plane properties on p- and n-Ge/SixGe1-x superlattices

Silicon and germanium materials have demonstrated an increasing attraction for energy harvesting, due to their sustainability and integrability with complementary metal oxide semiconductor and micro-electro-mechanical-system technology. The thermoelectric efficiencies for these materials, however, are very poor at room temperature and so it is necessary to engineer them in order to compete with telluride based materials, which have demonstrated at room temperature the highest performances in literature [1]. Micro-fabricated devices consisting of mesa structures with integrated heaters, thermometers and Ohmic contacts were used to extract the cross-plane values of the Seebeck coefficient and the thermal conductivity from p- and n-Ge/SixGe1-x superlattices. A second device consisting in a modified circular transfer line method structure was used to extract the electrical conductivity of the materials. A range of p-Ge/Si0.5Ge0.5 superlattices with different doping levels was investigated in detail to determine the role of the doping density in dictating the thermoelectric properties. A second set of n-Ge/Si0.3Ge0.7 superlattices was fabricated to study the impact that quantum well thickness might have on the two thermoelectric figures of merit, and also to demonstrate a further reduction of the thermal conductivity by scattering phonons at different wavelengths. This technique has demonstrated to lower the thermal conductivity by a 25% by adding different barrier thicknesses per period

Thermal emissivity of silicon heterojunction solar cells

The aim of this work is to evaluate whether silicon heterojunction solar cells, lacking highly emissive, heavily doped silicon layers, could be better candidates for hybrid photovoltaic thermal collectors than standard aluminium-diffused back contact solar cells. To this end, the near and mid infrared emissivity of full silicon heterojunction solar cells, as well as of its constituent materials – crystalline silicon wafer, indium tin oxide, n-, i- and p-type amorphous silicon – have been assessed by means of ellipsometry and FTIR. The experimental results show that the thermal emissivity of these cells is actually as high as in the more traditional structures, ~80% at 8 μm. Detailed optical modelling combining raytracing and transfer matrix formalism shows that the emissivity in these cells originates in the transparent conductive oxide layers themselves, where the doping is not high enough to result in a reflection that exceeds the increased free carrier absorption. Further modelling suggests that it is possible to obtain lower emissivity solar cells, but that a careful optimization of the transparent conductive layer needs to be done to avoid hindering the photovoltaic performance

High Efficiency Planar Geometry Germanium-on-silicon Single-photon Avalanche Diode Detectors

This paper presents the performance of 26 μm and 50 μm diameter planar Ge-on-Si single-photon avalanche diode (SPAD) detectors. The addition of germanium in these detectors extends the spectral range into the short-wave infrared (SWIR) region, beyond the capability of already well-established Si SPAD devices. There are several advantages for extending the spectral range into the SWIR region including: reduced eye-safety laser threshold, greater attainable ranges, and increased depth resolution in range finding applications, in addition to the enhanced capability to image through obscurants such as fog and smoke. The time correlated single-photon counting (TCSPC) technique has been utilized to observe record low dark count rates, below 100 kHz at a temperature of 125 K for up to a 6.6 % excess bias, for the 26 μm diameter devices. Under identical experimental conditions, in terms of excess bias and temperature, the 50 μm diameter device consistently demonstrates dark count rates a factor of 4 times greater than 26 μm diameter devices, indicating that the dark count rate is proportional to the device volume. Single-photon detection efficiencies of up to ~ 29 % were measured at a wavelength of 1310 nm at 125 K. Noise equivalent powers (NEP) down to 9.8 × 10-17 WHz-1/2 and jitters < 160 ps are obtainable, both significantly lower than previous 100 μm diameter planar geometry devices, demonstrating the potential of these devices for highly sensitive and high-speed imaging in the SWIR

ITO and AZO films for low emissivity coatings in hybrid photovoltaic-thermal applications

We report on the electrical and optical properties of ITO and AZO films fabricated directly on silicon substrates under several growth and annealing temperatures. We use broadband spectroscopic ellipsometry measurements (from 300 nm to 20 μm) to obtain a consistent model for the permittivity of each of the films. The results are then used to design an optimized, single layer, high transparency, high conductivity film, suitable as front transparent electrode and low thermal emissivity coating for silicon based solar cells. The best performance is found using the properties of the ITO film grown at 250 °C, with a state of the art resistivity of 0.2 mΩ cm and an optimized thickness of 75 nm which leads to 0.79 average absorptivity in the solar range (300–2000 nm) and 0.21 average emissivity in the thermal range (5–20 μm). The structural characterization of the films using X-Ray diffraction, and the Hall mobility and resistivity measurements of all the films are also provided, complementing and supporting the observed optical properties

Roadmap for the next-generation of hybrid photovoltaic-thermal solar energy collectors

For hybrid photovoltaic-thermal collectors to become competitive with other types of solar energy converters, they must offer high performance at fluid outlet temperatures above 60 °C, as is required for space heating and domestic hot water provision, which together account for nearly 50% of heat demand. A roadmap is presented of the technological advances required to achieve this goal. Strategies for reducing convective, radiative and electrical losses at elevated temperature are discussed, and an experimental characterisation of a novel transparent low-emissivity coating for photovoltaic solar cells is presented. An experimentally-validated simulation formalism is used to project the performance of different combinations of loss-reduction strategies implemented together. Finally, a techno-economic analysis is performed to predict the price points at which the hybrid technologies along the roadmap become competitive with non-hybrid photovoltaic and solar thermal technologies. The most advanced hybrid technology along the roadmap employs an evacuated cavity, a transparent low-emissivity coating, and silicon heterojunction photovoltaic cells

Ge/SiGe superlattices for thermoelectric energy conversion devices

Ge-rich multiple quantum well heterostructures have been investigated as engineered material for efficient thermoelectric generators monolithically integrated on silicon substrates. Thick Ge/SiGe multilayers on Si substrates designed for lateral thermoelectric devices have been grown and characterized in which electrical and thermal conduction occur parallel to the heterostructure interfaces. In this study, an overview of the investigated structures is presented together with results from X-ray scattering and transmission electron microscopy experiments. These analyses confirm the high quality of the material and the uniformity of the structure over the whole deposited thickness. Important parameters in terms of the optimization of the material quality which could affect thermoelectric properties, such as the interfaces roughness and the threading dislocation density, have also been evaluated. Preliminary electrical and Seebeck coefficient measurements indicate the viability of this material for the realization of thermoelectric devices

High Efficiency Planar Ge-on-Si Single-Photon Avalanche Diode Detectors

Planar Ge-on-Si single-photon avalanche diode detectors fabricated using CMOS-compatible processing demonstrate a 38% single photon detection efficiency at 125 K with 1310 nm wavelength illumination, exhibiting 310 ps jitter and 2×10−16WHz−12 noise equivalent power