Experimental application of sum rules for electron energy loss magnetic chiral dichroism

We present a derivation of the orbital and spin sum rules for magnetic circular dichroic spectra measured by electron energy loss spectroscopy in a transmission electron microscope. These sum rules are obtained from the differential cross section calculated for symmetric positions in the diffraction pattern. Orbital and spin magnetic moments are expressed explicitly in terms of experimental spectra and dynamical diffraction coefficients. We estimate the ratio of spin to orbital magnetic moments and discuss first experimental results for the Fe L_{2,3} edge.Comment: 11 pages, 2 figure

Energy-loss magnetic chiral dichroism (EMCD): Magnetic chiral dichroism in the electron microscope

A new technique called energy-loss magnetic chiral dichroism (EMCD) has recently been developed [P. Schattschneider, et al. Nature 441, 486 (2006)] to measure magnetic circular dichroism in the transmission electron microscope (TEM) with a spatial resolution of 10 nm. This novel technique is the TEM counterpart of x-ray magnetic circular dichroism, which is widely used for the characterization of magnetic materials with synchrotron radiation. In this paper we describe several experimental methods that can be used to measure the EMCD signal [P. Schattschneider, et al. Nature 441, 486 (2006); C. Hébert, et al. Ultramicroscopy 108(3), 277 (2008); B. Warot-Fonrose, et al. Ultramicroscopy 108(5), 393 (2008); L. Calmels, et al. Phys. Rev. B 76, 060409 (2007); P. van Aken, et al. Microsc. Microanal. 13(3), 426 (2007)] and give a review of the recent improvements of this new investigation tool. The dependence of the EMCD on several experimental conditions (such as thickness, relative orientation of beam and sample, collection and convergence angle) is investigated in the transition metals iron, cobalt, and nickel. Different scattering geometries are illustrated; their advantages and disadvantages are detailed, together with current limitations. The next realistic perspectives of this technique consist of measuring atomic specific magnetic moments, using suitable spin and orbital sum rules, [L. Calmels, et al. Phys. Rev. B 76, 060409 (2007); J. Rusz, et al. Phys. Rev. B 76, 060408 (2007)] with a resolution down to 2 to 3 n

Calibration of multi-layered probes with low/high magnetic moments

We present a comprehensive method for visualisation and quantification of the magnetic stray field of magnetic force microscopy (MFM) probes, applied to the particular case of custom-made multi-layered probes with controllable high/low magnetic moment states. The probes consist of two decoupled magnetic layers separated by a non-magnetic interlayer, which results in four stable magnetic states: ±ferromagnetic (FM) and ±antiferromagnetic (A-FM). Direct visualisation of the stray field surrounding the probe apex using electron holography convincingly demonstrates a striking difference in the spatial distribution and strength of the magnetic flux in FM and A-FM states. In situ MFM studies of reference samples are used to determine the probe switching fields and spatial resolution. Furthermore, quantitative values of the probe magnetic moments are obtained by determining their real space tip transfer function (RSTTF). We also map the local Hall voltage in graphene Hall nanosensors induced by the probes in different states. The measured transport properties of nanosensors and RSTTF outcomes are introduced as an input in a numerical model of Hall devices to verify the probe magnetic moments. The modelling results fully match the experimental measurements, outlining an all-inclusive method for the calibration of complex magnetic probes with a controllable low/high magnetic moment

Dielectric response of pentagonal defects in multilayer graphene nano-cones

The dielectric response of pentagonal defects in multilayer graphene nano-cones has been studied by electron energy loss spectroscopy and ab initio simulations. At the cone apex, a strong modification of the dielectric response is observed below the energy of the π plasmon resonance. This is attributed to π → π* interband transitions induced by topology-specific resonant π bonding states as well as π*–σ* hybridization. It is concluded that pentagonal defects strongly affect the local electronic structure in such a way that multi-walled graphene nano-cones should show great promise as field emitters

Pyroxenes microstructure in comet 81P/Wild 2 terminal Stardust particles

We report the examination by transmission electron microscopy (TEM) of four Stardust terminal particles extracted from two neighboring tracks (32 an 69). The particles are made of wellpreserved crystalline grains dominated by low-Ca pyroxene ranging from nearly pure enstatite to pigeonite. Some olivine grains are also found, in chemical equilibrium with the surrounding pyroxenes. Various microstructures are observed, as a function of the composition of the grains. They include (100)-twinned pigeonite, clino/ortho domains in enstatite and exsolution in a Ca-rich grain. The microstructures are mostly consistent with a formation by cooling from high-temperature phases, which could be associated to igneous processes. Some dislocations in glide configuration are also present, probably attesting for small intensity shocks. Possible effects of the rapid heating/cooling stage and thermal shock associated to the collect are discussed. It appears that most of the microstructural features reported here are plausibly pristine.The Meteoritics & Planetary Science archives are made available by the Meteoritical Society and the University of Arizona Libraries. Contact [email protected] for further information.Migrated from OJS platform February 202

Microstructure of Cs-implanted zirconia: Role of temperature

The aim of this study was to identify experimentally the phase which includes cesium in yttria stabilized zirconia (YSZ). The solubility and retention of cesium in YSZ were studied at high temperature (HT). Cesium was ion implanted (at 300 keV) into YSZ at room temperature (RT), 750 degrees C, or 900 degrees C at fluences up to 5 x 10(16) cm(-2). The temperature dependence of the radiation-induced damage and of the cesium distribution in YSZ single crystals was investigated by Rutherford backscattering spectrometry and ion channeling. Transmission electron microscopy (TEM) studies were performed in order to determine the damage nature and search for a predicted ternary phase of cesium zirconate. Whatever the implantation temperature, the thickness of the damaged layer increases inwards with ion fluence. At RT, amorphization occurs, caused by the high Cs concentration (7 at. %). In situ TEM during postannealing shows recrystallization of cubic zirconia after release of cesium. A high implantation temperature has a significant influence on the nature of radiation defects and on the retained Cs concentration. At HT, dislocation loops and voids are formed but no amorphization is observed whereas polygonization occurs at high fluence. The implanted cesium concentration reaches a saturation value of 1.5 at. % above which Cs can no longer be retained in the matrix and is then released at the surface. At that concentration, cesium forms a solid solution in YSZ; no other phase is formed, neither during irradiation nor after thermal annealing. (C) 2008 American Institute of Physics. [DOI: 10.1063/1.3021162

Microstructure of Cs-implanted zirconia: Role of temperature

The aim of this study was to identify experimentally the phase which includes cesium in yttria stabilized zirconia (YSZ). The solubility and retention of cesium in YSZ were studied at high temperature (HT). Cesium was ion implanted (at 300 keV) into YSZ at room temperature (RT), 750 degrees C, or 900 degrees C at fluences up to 5 x 10(16) cm(-2). The temperature dependence of the radiation-induced damage and of the cesium distribution in YSZ single crystals was investigated by Rutherford backscattering spectrometry and ion channeling. Transmission electron microscopy (TEM) studies were performed in order to determine the damage nature and search for a predicted ternary phase of cesium zirconate. Whatever the implantation temperature, the thickness of the damaged layer increases inwards with ion fluence. At RT, amorphization occurs, caused by the high Cs concentration (7 at. %). In situ TEM during postannealing shows recrystallization of cubic zirconia after release of cesium. A high implantation temperature has a significant influence on the nature of radiation defects and on the retained Cs concentration. At HT, dislocation loops and voids are formed but no amorphization is observed whereas polygonization occurs at high fluence. The implanted cesium concentration reaches a saturation value of 1.5 at. % above which Cs can no longer be retained in the matrix and is then released at the surface. At that concentration, cesium forms a solid solution in YSZ; no other phase is formed, neither during irradiation nor after thermal annealing. (C) 2008 American Institute of Physics. [DOI: 10.1063/1.3021162