Electrical Properties of Self-Assembled Nano-Schottky Diodes

A bottom-up methodology to fabricate a nanostructured material by Au nanoclusters on 6H-SiC surface is illustrated. Furthermore, a methodology to control its structural properties by thermal-induced self-organization of the Au nanoclusters is demonstrated. To this aim, the self-organization kinetic mechanisms of Au nanoclusters on SiC surface were experimentally studied by scanning electron microscopy, atomic force microscopy, Rutherford backscattering spectrometry and theoretically modelled by a ripening process. The fabricated nanostructured materials were used to probe, by local conductive atomic force microscopy analyses, the electrical properties of nano-Schottky contact Au nanocluster/SiC. Strong efforts were dedicated to correlate the structural and electrical characteristics: the main observation was the Schottky barrier height dependence of the nano-Schottky contact on the cluster size. Such behavior was interpreted considering the physics of few electron quantum dots merged with the concepts of ballistic transport and thermoionic emission finding a satisfying agreement between the theoretical prediction and the experimental data. The fabricated Au nanocluster/SiC nanocontact is suggested as a prototype of nano-Schottky diode integrable in complex nanoelectronic circuits

Tailoring MoS2 domains size, doping, and light emission by the sulfurization temperature of ultra-thin MoOx films on sapphire

Thermal sulfurization of ultra-thin Mo-based films represents a promising approach for large-area growth of MoS2. In this paper, we demonstrated that the crystalline quality (domains size and defects density), strain, doping, and light emission properties of monolayer (1L) MoS2 obtained from sputter deposited MoOx films on a c-sapphire substrate can be tailored by the sulfurization temperature (Ts) in the range from 700 to 800 °C. Starting from a continuous film with a nanocrystalline domains structure at Ts = 700 °C, a distribution of 1L MoS2 triangular domains with 2.1 ± 0.6 and 2.6 ± 1.6 μm average sizes was obtained by increasing Ts to 750 and 800 °C, respectively. The increase in Ts was accompanied by a strong (25×) enhancement of the photoluminescence (PL) intensity. Furthermore, the average doping of MoS2, evaluated from Raman analyses, evolved from a strong p-type doping (∼1 × 1013 cm−2) after Ts = 700 °C, ascribed to residual MoO3 in the film, to a low average n-type doping (∼0.04 × 1013 cm−2) after Ts = 800 °C. The wide tunability of doping and PL of 1L MoS2 by the sulfurization temperature can be exploited to tailor material properties for different specific applications

Типы отношения к болезни у пациентов с желчнокаменной болезнью

ЖЕЛЧНОКАМЕННАЯ БОЛЕЗНЬЖЕЛЧНЫХ ПУТЕЙ БОЛЕЗНИтестированиеБОЛЕЗНЬВЫЗДОРОВЛЕНИЕпсихоэмоциональные факторыпсиходиагностик