Radiation Characterization of a Backside-Illuminated P-Type Photo-MOS Pixel With Gamma Rays and Fusion-Induced Neutrons

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Real-Time Characterization of Neutron-Induced SEUs in Fusion Experiments at WEST Tokamak during D-D Plasma Operation

International audienceWe conducted a real-time soft-error rate characterization of CMOS bulk 65 nm SRAMs subjected to fusion neutrons during deuterium-deuterium (D-D) plasma operation at WEST tokamak. The test equipment, installed in the experimental hall at several locations of the tokamak, was irradiated during machine shots by a flux of particles dominated by primary 2.45 MeV neutrons. Real-time neutron metrology, neutron spectrometry, complementary characterization with monoenergetic neutrons and Monte Carlo numerical simulations at both material and circuit levels have been also performed to analyze experimental data. Our results suggest that higher energy neutrons, simultaneously produced by deuterium-tritium (D-T) reactions due to triton burn up in the D-D plasma, play a significant role in the radiation response of the SRAMs for which multiple cell upsets are detected and cannot be attributed to D-D neutrons

Preliminary Study of Electronics Reliability in ITER Neutron Environment

International audienceWe validated a method for predicting the Soft Error Rate (SER) in the WEST tokamak operated with deuterium plasmas, and we applied it to predict the SER in the ITER tokamak operated with deuterium-tritium plasmas

Preliminary Study of Electronics Reliability in ITER Neutron Environment

International audienceWe validated a method for predicting the Soft Error Rate (SER) in the WEST tokamak operated with deuterium plasmas, and we applied it to predict the SER in the ITER tokamak operated with deuterium-tritium plasmas

Preliminary Study of Electronics Reliability in ITER Neutron Environment

International audienceWe validated a method for predicting the Soft Error Rate (SER) in the WEST tokamak operated with deuterium plasmas, and we applied it to predict the SER in the ITER tokamak operated with deuterium-tritium plasmas

Fusion Neutron-Induced Soft Errors During Long Pulse D-D Plasma Discharges in the WEST Tokamak

International audienceWe have performed real-time soft error rate (RT-SER) measurements on bulk 65-nm static random access memories (SRAMs) during deuterium–deuterium (D-D) plasma operation at W–tungsten–Environment in Steady-state Tokamak (WEST). The present measurement campaign was characterized by the production of several tens of long pulse discharges (∼60 s) and by a total neutron fluence (at the level of the circuits under test) up to ∼10 9 n·cm−2, improving the error statistics by a factor of more than 6 with respect to the first measurements obtained in 2020. The experimental results demonstrate the occurrence of bursts of single-event upsets (SEUs) during the most efficient shots and 12% of multiple cell upset (MCU) events. Time-resolved data also show that MCUs are preferentially detected in the last part of these long pulses, providing further evidence that higher energy neutrons, initiated by deuterium–tritium (D-T) reactions due to triton burn-up in the D-D plasma, may play a role in the production of MCUs that cannot be attributed in such large proportions to “low-energy” neutrons produced in D-D reactions

Fusion Neutron-Induced Soft Errors During Long Pulse D-D Plasma Discharges in the WEST Tokamak

International audienceWe conducted real-time SER measurements on bulk 65 nm SRAMs in the WEST tokamak during long pulse deuterium-deuterium plasma discharges (~60 s), evidencing bursts of SEUs during the most efficient shots and 12% of MCU events

Fusion Neutron-Induced Soft Errors During Long Pulse D-D Plasma Discharges in the WEST Tokamak

International audienceWe conducted real-time SER measurements on bulk 65 nm SRAMs in the WEST tokamak during long pulse deuterium-deuterium plasma discharges (~60 s), evidencing bursts of SEUs during the most efficient shots and 12% of MCU events