Preocupações de carreira e adaptabilidade : estudo exploratório com uma amostra de candidatos a sargentos e oficiais do Exército Português

Tese de mestrado, Psicologia (Psicologia dos Recursos Humanos, do Trabalho e das Organizações), Universidade de Lisboa, Faculdade de Psicologia, 2010O presente trabalho consiste num estudo exploratório sobre as preocupações de carreira e as dimensões da adaptabilidade, baseando-se na Perspectiva de Desenvolvimento da Carreira de Donald Super e na Perspectiva Construtivista de Mark Savickas. Pretende-se, ainda, contribuir para a investigação acerca do Inventário sobre Adaptabilidade, que se encontra ainda em estudo no âmbito de um Projecto Internacional. Foram aplicados o Inventário das Preocupações de Carreira e o Inventário sobre Adaptabilidade a uma amostra de 75 adultos candidatos a Sargentos e Oficiais do Exército Português. Os resultados obtidos tendem a confirmar as hipóteses de investigação formuladas, apontando para a relação entre a variável idade e as tarefas de desenvolvimento das fases da carreira Exploração e Estabelecimento, para a predominância das dimensões Confiança e Cooperação, e para a relação entre preocupações de carreira e dimensões da adaptabilidade. Apresentam-se as conclusões do presente estudo, algumas limitações deste e futuras linhas de investigação. Tecem-se também algumas considerações sobre as implicações do estudo para as práticas de gestão de carreira.This work is an exploratory study about the career concerns and the dimensions of adaptability, based on the Perspective of the Career Development of Donald Super and the Constructivist Perspective of Mark Savickas. It is also intended to contribute to the research on the Career Adapt-Abilities Inventory, which is still under investigation as part of an International Project. The Career Concerns Inventory and the Career Adapt-Abilities Inventory were applied to a sample of 75 adult candidates to Sergeants and Officers of the Portuguese Army. The results seem to confirm the research hypotheses, pointing to the relation between the variable age and the developmental tasks of the Exploration and Establishment career phases, to the predominance of the dimensions Cooperation, and Confidence and also to the relation between career concerns and adaptability dimensions. The findings of this study, some of its limitations and future research paths are presented. Some reflections are also discussed in what concerns the study's implications for the career management practices

Structural, Electronic and Magnetic Properties of a Few Nanometer-Thick Superconducting NdBa₂Cu₃O₇ Films

Abstract: Epitaxial films of high critical temperature (Tc) cuprate superconductors preserve their transport properties even when their thickness is reduced to a few nanometers. However, when approaching the single crystalline unit cell (u.c.) of thickness, Tc decreases and eventually, superconductivity is lost. Strain originating from the mismatch with the substrate, electronic reconstruction at the interface and alteration of the chemical composition and of doping can be the cause of such changes. Here, we use resonant inelastic x-ray scattering at the Cu L3 edge to study the crystal field and spin excitations of NdBa2Cu3O7x ultrathin films grown on SrTiO3, comparing 1, 2 and 80 u.c.-thick samples. We find that even at extremely low thicknesses, the strength of the in-plane superexchange interaction is mostly preserved, with just a slight decrease in the 1 u.c. with respect to the 80 u.c.-thick sample. We also observe spectroscopic signatures for a decrease of the hole-doping at low thickness, consistent with the expansion of the c-axis lattice parameter and oxygen deficiency in the chains of the first unit cell, determined by high-resolution transmission microscopy and x-ray diffraction

4f excitations in Ce Kondo lattices studied by resonant inelastic x-ray scattering

The potential of resonant inelastic soft x-ray scattering to measure 4f crystal electric-field excitation spectra in Ce Kondo lattices has been examined. Spectra have been obtained for several Ce systems and show a well-defined structure determined by crystal-field, spin-orbit, and charge-transfer excitations only. The spectral shapes of the excitation spectra can be well understood in the framework of atomic multiplet calculations. For CeCu2Si2 we found notable disagreement between the inelastic x-ray-scattering spectra and theoretical calculations when using the crystal-field scheme proposed from inelastic neutron scattering. Modified sets of crystal-field parameters yield better agreement. Our results also show that, with the very recent improvements of soft x-ray spectrometers in resolution to below 30 meV at the Ce M4,5 edges, resonant inelastic x-ray scattering could be an ideal tool to determine the crystal-field scheme in Ce Kondo lattices and other rare-earth compounds

Structural, Electronic and Magnetic Properties of a Few Nanometer-Thick Superconducting NdBa2Cu3O7 Films

Epitaxial films of high critical temperature (Tc) cuprate superconductors preserve their transport properties even when their thickness is reduced to a few nanometers. However, when approaching the single crystalline unit cell (u.c.) of thickness, Tc decreases and eventually, superconductivity is lost. Strain originating from the mismatch with the substrate, electronic reconstruction at the interface and alteration of the chemical composition and of doping can be the cause of such changes. Here, we use resonant inelastic x-ray scattering at the Cu L3 edge to study the crystal field and spin excitations of NdBa2Cu3O7x ultrathin films grown on SrTiO3, comparing 1, 2 and 80 u.c.-thick samples. We find that even at extremely low thicknesses, the strength of the in-plane superexchange interaction is mostly preserved, with just a slight decrease in the 1 u.c. with respect to the 80 u.c.-thick sample. We also observe spectroscopic signatures for a decrease of the hole-doping at low thickness, consistent with the expansion of the c-axis lattice parameter and oxygen deficiency in the chains of the first unit cell, determined by high-resolution transmission microscopy and x-ray diffraction