Individual skyrmion manipulation by local magnetic field gradients

Magnetic skyrmions are topologically protected spin textures, stabilised in systems with strong Dzyaloshinskii-Moriya interaction (DMI). Several studies have shown that electrical currents can move skyrmions efficiently through spin-orbit torques. While promising for technological applications, current-driven skyrmion motion is intrinsically collective and accompanied by undesired heating effects. Here we demonstrate a new approach to control individual skyrmion positions precisely, which relies on the magnetic interaction between sample and a magnetic force microscopy (MFM) probe. We investigate perpendicularly magnetised X/CoFeB/MgO multilayers, where for X = W or Pt the DMI is sufficiently strong to allow for skyrmion nucleation in an applied field. We show that these skyrmions can be manipulated individually through the local field gradient generated by the scanning MFM probe with an unprecedented level of accuracy. Furthermore, we show that the probe stray field can assist skyrmion nucleation. Our proof-of-concepts results pave the way towards achieving current-free skyrmion control

Thermoelectric signature of individual skyrmions

We experimentally study the thermoelectrical signature of individual skyrmions in chiral Pt/Co/Ru multilayers. Using a combination of controlled nucleation, single skyrmion annihilation, and magnetic field dependent measurements the thermoelectric signature of individual skyrmions is characterized. The observed signature is explained by the anomalous Nernst effect of the skyrmions spin structure. Possible topological contributions to the observed thermoelectrical signature are discussed. Such thermoelectrical characterization allows for non-invasive detection and counting of skyrmions and enables fundamental studies of topological thermoelectric effects on the nano scal

Anisotropic magnetoresistance state space of permalloy nanowires with domain wall pinning geometry

The domain wall-related change in the anisotropic magnetoresistance in L-shaped permalloy nanowires is measured as a function of the magnitude and orientation of the applied magnetic field. The magnetoresistance curves, compiled into so-called domain wall magnetoresistance state space maps, are used to identify highly reproducible transitions between domain states. Magnetic force microscopy and micromagnetic modelling are correlated with the transport measurements of the devices in order to identify different magnetization states. Analysis allows to determine the optimal working parameters for specific devices, such as the minimal field required to switch magnetization or the most appropriate angle for maximal separation of the pinning/depinning fields. Moreover, the complete state space maps can be used to predict evolution of nanodevices in magnetic field without a need of additional electrical measurements and for repayable initialization of magnetic sensors into a well-specified state

Magnetic Force Microscopy Imaging Using Geometrically Constrained Nano-Domain Walls

International audienceDomain wall probes (DW-probes) were custom-made by modifying standard commercial magnetic force microscopy (MFM) probes using focused ion beam lithography. Excess of magnetic coating from the probes was milled out, leaving a V-shaped nanostructure on one face of the probe apex. Owing to the nanostructure's shape anisotropy, such probe has four possible magnetic states depending on the direction of the magnetization along each arm of the V-shape. Two states of opposite polarity are characterised by the presence of a geometrically constrained DW, pinned at the corner of the V-shape nanostructure. In the other two states, the magnetization curls around the corner with opposite chirality. Electron holography studies, supported by numerical simulations, demonstrate that a strong stray field emanates from the pinned DW, whilst a much weaker stray field is generated by the curling configurations. Using in situ MFM, we show that the magnetization states of the DW-probe can be easily controlled by applying an external magnetic field, thereby demonstrating that this type of probe can be used as a switchable tool with a low or high stray field intensity. We demonstrate that DW-probes enable acquiring magnetic images with a negligible interference with the sample magnetization, similar to that of commercial low moment probes, but with a higher magnetic contrast. In addition, the DW-probe in the curl state provides complementary information about the in-plane component of the sample's magnetization, which is not achievable by standard methods and provides additional information about the stray fields, e.g. as when imaging DWs

Magnetic Force Microscopy Imaging Using Geometrically Constrained Nano-Domain Walls

Domain wall probes (DW-probes) were custom-made by modifying standard commercial magnetic force microscopy (MFM) probes using focused ion beam lithography. Excess of magnetic coating from the probes was milled out, leaving a V-shaped nanostructure on one face of the probe apex. Owing to the nanostructure's shape anisotropy, such probe has four possible magnetic states depending on the direction of the magnetization along each arm of the V-shape. Two states of opposite polarity are characterised by the presence of a geometrically constrained DW, pinned at the corner of the V-shape nanostructure. In the other two states, the magnetization curls around the corner with opposite chirality. Electron holography studies, supported by numerical simulations, demonstrate that a strong stray field emanates from the pinned DW, whilst a much weaker stray field is generated by the curling configurations. Using in situ MFM, we show that the magnetization states of the DW-probe can be easily controlled by applying an external magnetic field, thereby demonstrating that this type of probe can be used as a switchable tool with a low or high stray field intensity. We demonstrate that DW-probes enable acquiring magnetic images with a negligible interference with the sample magnetization, similar to that of commercial low moment probes, but with a higher magnetic contrast. In addition, the DW-probe in the curl state provides complementary information about the in-plane component of the sample's magnetization, which is not achievable by standard methods and provides additional information about the stray fields, e.g. as when imaging DWs

Magnetic Force Microscopy Imaging Using Geometrically Constrained Nano-Domain Walls

Domain wall probes (DW-probes) were custom-made by modifying standard commercial magnetic force microscopy (MFM) probes using focused ion beam lithography. Excess of magnetic coating from the probes was milled out, leaving a V-shaped nanostructure on one face of the probe apex. Owing to the nanostructure's shape anisotropy, such probe has four possible magnetic states depending on the direction of the magnetization along each arm of the V-shape. Two states of opposite polarity are characterised by the presence of a geometrically constrained DW, pinned at the corner of the V-shape nanostructure. In the other two states, the magnetization curls around the corner with opposite chirality. Electron holography studies, supported by numerical simulations, demonstrate that a strong stray field emanates from the pinned DW, whilst a much weaker stray field is generated by the curling configurations. Using in situ MFM, we show that the magnetization states of the DW-probe can be easily controlled by applying an external magnetic field, thereby demonstrating that this type of probe can be used as a switchable tool with a low or high stray field intensity. We demonstrate that DW-probes enable acquiring magnetic images with a negligible interference with the sample magnetization, similar to that of commercial low moment probes, but with a higher magnetic contrast. In addition, the DW-probe in the curl state provides complementary information about the in-plane component of the sample's magnetization, which is not achievable by standard methods and provides additional information about the stray fields, e.g. as when imaging DWs

Comparison and Validation of Different Magnetic Force Microscopy Calibration Schemes

The future of consumer electronics depends on the capability to reliably fabricate nanostructures with given physical properties. Therefore, techniques to characterize materials and devices with nanoscale resolution are crucial. Among these is magnetic force microscopy (MFM), which transduces the magnetic force between the sample and a magnetic oscillating probe into a phase shift, enabling the locally resolved study of magnetic field patterns down to 10 nm. Here, the progress done toward making quantitative MFM a common tool in nanocharacterization laboratories is shown. The reliability and ease of use of the calibration method based on a magnetic reference sample, with a calculable stray field, and a deconvolution algorithm is demonstrated. This is achieved by comparing two calibration approaches combined with numerical modeling as a quantitative link: measuring the probe's effect on the voltage signal when scanning above a nanosized graphene Hall sensor, and recording the MFM phase shift signal when the probe scans across magnetic fields produced by metallic microcoils. Furthermore, in the case of the deconvolution algorithm, it is shown how it can be applied using the open‐source software package Gwyddion. The estimated magnetic dipole approximation for the most common probes currently in the market is also reported

Magnetic imaging using geometrically constrained nano-domain walls

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