Redetermination of tris­(N,N-diethyl­dithio­carbamato)anti­mony(III)

The title compound, [Sb(C5H10NS2)3], was synthesized from Sb2O3, diethyl­amine, carbon dis­ulfide, hydro­chloric acid and sodium hydroxide. The structure has been published previously but H atoms were not included in the model [Raston & White (1976 ▶). Chem. Soc. Dalton Trans. p. 791]. The current determination has significantly higher precision than the original work. The complex has three ligands. The Sb atom is coordinated by three bidentate diethyl­dithio­carbamate groups, two in an almost planar fashion and the third perpendicular to that plane with a dihedral angle of 86.429 (13)°. One ethyl group is disordered over two positions of equal occupancy

Precursor chemistry: remaining challenges and some novel approaches

In this short paper an outline of the properties of an ideal precursor for MOCVD is given. Two systems are then used to explain the advantages of novel precursor systems over conventional ones, for the deposition of electrically important materials. The first example concerns the use of the triethylamine adduct of dimethylzinc as a precursor either in the deposition of II/VI materials containing zinc or the doping of III/V materials. The second example concerns the development of thiocarbamato precursors of improved volatility and their use in the deposition of PbS a material whose deposition by MOCVD has been problematic

Deposition of II-VI thin films by LP-MOCVD using novel single-source precursors

Thin films of several zinc or cadmium chalcogenides have been deposited on glass substrates by low pressure metal-organic chemical vapour deposition (LP-MOCVD) using single-source precursors, [M{(EPiPr(2))(2)N}(2)] (M = Cd-II, Zn-II and E = S, Se). X-ray single crystal structures show that [Zn{(EPiPr(2))(2)N}(2)] (E = S or Se) and [Zn{(SePPh2)(2)N}(2)] are tetrahedrally distorted. TGA analyses showed that the precursors are volatile, making them suitable for MOCVD studies. As-deposited films were polycrystalline as confirmed by X-ray powder diffraction (XRPD) and their morphologies were studied by scanning electron microscope (SEM).</p