2,344 research outputs found

    More Sources of Bias in Half-life Estimation

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    Biases in measurement of dynamics of time series from calculation of half- life received more attention lately. In particular, this issue amplifies the controversy surrounding the purchasing power parity doctrine. Cross-sectional and temporal aggregations along with mis-specified models were identified before as sources of this bias. We identified a few other sources of bias, namely, sampling error, wrong approximations, and structural breaks in time series. These sources should receive adequate attention for a sound measure of half-life

    Ultrahigh areal number density solid-state on-chip microsupercapacitors via electrohydrodynamic jet printing

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    Microsupercapacitors (MSCs) have garnered considerable attention as a promising power source for microelectronics and miniaturized portable/wearable devices. However, their practical application has been hindered by the manufacturing complexity and dimensional limits. Here, we develop a new class of ultrahigh areal number density solid-state MSCs (UHD SS-MSCs) on a chip via electrohydrodynamic (EHD) jet printing. This is, to the best of our knowledge, the first study to exploit EHD jet printing in the MSCs. The activated carbon-based electrode inks are EHD jet-printed, creating interdigitated electrodes with fine feature sizes. Subsequently, a drying-free, ultraviolet-cured solid-state gel electrolyte is introduced to ensure electrochemical isolation between the SS-MSCs, enabling dense SS-MSC integration with on-demand (in-series/in-parallel) cell connection on a chip. The resulting on-chip UHD SS-MSCs exhibit exceptional areal number density [36 unit cells integrated on a chip (area = 8.0 mm x 8.2 mm), 54.9 cells cm(-2)] and areal operating voltage (65.9 V cm(-2))
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