Experimental verification of new configurations in the piezoelectric photothermal spectroscopy of semiconductor materials

This paper presents the analysis of two experimental configurations applied in the piezoelectric spectroscopy method. The first configuration called `rear' is normally used in the field of piezoelectric spectroscopy. The second configuration called `front' is a new configuration analyzed by authors. In this paper both advantages and disadvantages of both configurations are described. In this paper both theoretical and experimental spectra measured in these two configurations are presented and compared

Study of Zn

In this paper a series of experimental piezoelectric spectra of Zn1-x-yBexMnySe (y = 0.05, x = 0.05, 0.10, 0.15) crystals are presented and discussed. Three groups of samples exhibiting different composition with different surface treatment: grinded, polished and etched were prepared. The influence of a different surface treatment on piezoelectric amplitude spectra are discussed with in model taking into account the presence of defects located on the surfaces of the samples