Transition Faults and Transition Path Delay Faults: Test Generation, Path Selection, and Built-In Generation of Functional Broadside Tests

As the clock frequency and complexity of digital integrated circuits increase rapidly, delay testing is indispensable to guarantee the correct timing behavior of the circuits. In this dissertation, we describe methods developed for three aspects of delay testing in scan-based circuits: test generation, path selection and built-in test generation. We first describe a deterministic broadside test generation procedure for a path delay fault model named the transition path delay fault model, which captures both large and small delay defects. Under this fault model, a path delay fault is detected only if all the individual transition faults along the path are detected by the same test. To reduce the complexity of test generation, sub-procedures with low complexity are applied before a complete branch-and-bound procedure. Next, we describe a method based on static timing analysis to select critical paths for test generation. Logic conditions that are necessary for detecting a path delay fault are considered to refine the accuracy of static timing analysis, using input necessary assignments. Input necessary assignments are input values that must be assigned to detect a fault. The method calculates more accurate path delays, selects paths that are critical during test application, and identifies undetectable path delay faults. These two methods are applicable to off-line test generation. For large circuits with high complexity and frequency, built-in test generation is a cost-effective method for delay testing. For a circuit that is embedded in a larger design, we developed a method for built-in generation of functional broadside tests to avoid excessive power dissipation during test application and the overtesting of delay faults, taking the functional constraints on the primary input sequences of the circuit into consideration. Functional broadside tests are scan-based two-pattern tests for delay faults that create functional operation conditions during test application. To avoid the potential fault coverage loss due to the exclusive use of functional broadside tests, we also developed an optional DFT method based on state holding to improve fault coverage. High delay fault coverage can be achieved by the developed method for benchmark circuits using simple hardware

Compressed Skewed-Load Delay Test Generation Based on Evolution and Deterministic Initialization of Populations

The current design and manufacturing semiconductor technologies require to test the products against delay related defects. However, complex acpSOC require low-overhead testability methods to keep the test cost at an acceptable level. Skewed-load tests seem to be the appropriate way to test delay faults in these acpSOC because the test application requires only one storage element per scan cell. Compressed skewed-load test generator based on genetic algorithm is proposed for wrapper-based logic cores of acpSOC. Deterministic population initialization is used to ensure the highest achievable aclTDF coverage for the given wrapper and scan cell order. The developed method performs test data compression by generating test vectors containing already overlapped test vector pairs. The experimental results show high fault coverages, decreased test lengths and better scalability in comparison to recent methods

A survey of scan-capture power reduction techniques

With the advent of sub-nanometer geometries, integrated circuits (ICs) are required to be checked for newer defects. While scan-based architectures help detect these defects using newer fault models, test data inflation happens, increasing test time and test cost. An automatic test pattern generator (ATPG) exercise’s multiple fault sites simultaneously to reduce test data which causes elevated switching activity during the capture cycle. The switching activity results in an IR drop exceeding the devices under test (DUT) specification. An increase in IR-drop leads to failure of the patterns and may cause good DUTs to fail the test. The problem is severe during at-speed scan testing, which uses a functional rated clock with a high frequency for the capture operation. Researchers have proposed several techniques to reduce capture power. They used various methods, including the reduction of switching activity. This paper reviews the recently proposed techniques. The principle, algorithm, and architecture used in them are discussed, along with key advantages and limitations. In addition, it provides a classification of the techniques based on the method used and its application. The goal is to present a survey of the techniques and prepare a platform for future development in capture power reduction during scan testing

Radar Technology

In this book “Radar Technology”, the chapters are divided into four main topic areas: Topic area 1: “Radar Systems” consists of chapters which treat whole radar systems, environment and target functional chain. Topic area 2: “Radar Applications” shows various applications of radar systems, including meteorological radars, ground penetrating radars and glaciology. Topic area 3: “Radar Functional Chain and Signal Processing” describes several aspects of the radar signal processing. From parameter extraction, target detection over tracking and classification technologies. Topic area 4: “Radar Subsystems and Components” consists of design technology of radar subsystem components like antenna design or waveform design

The Future of the Operating Room: Surgical Preplanning and Navigation using High Accuracy Ultra-Wideband Positioning and Advanced Bone Measurement

This dissertation embodies the diversity and creativity of my research, of which much has been peer-reviewed, published in archival quality journals, and presented nationally and internationally. Portions of the work described herein have been published in the fields of image processing, forensic anthropology, physical anthropology, biomedical engineering, clinical orthopedics, and microwave engineering. The problem studied is primarily that of developing the tools and technologies for a next-generation surgical navigation system. The discussion focuses on the underlying technologies of a novel microwave positioning subsystem and a bone analysis subsystem. The methodologies behind each of these technologies are presented in the context of the overall system with the salient results helping to elucidate the difficult facets of the problem. The microwave positioning system is currently the highest accuracy wireless ultra-wideband positioning system that can be found in the literature. The challenges in producing a system with these capabilities are many, and the research and development in solving these problems should further the art of high accuracy pulse-based positioning

Development of a Resource Manager Framework for Adaptive Beamformer Selection

Adaptive digital beamforming (DBF) algorithms are designed to mitigate the effects of interference and noise in the electromagnetic (EM) environment encountered by modern electronic support (ES) receivers. Traditionally, an ES receiver employs a single adaptive DBF algorithm that is part of the design of the receiver system. While the traditional form of receiver implementation is effective in many scenarios it has inherent limitations. This dissertation proposes a new ES receiver framework capable of overcoming the limitations of traditional ES receivers. The proposed receiver framework is capable of forming multiple, independent, simultaneous adaptive digital beams toward multiple signals of interest in an electromagnetic environment. The main contribution of the research is the development, validation, and verification of a resource manager (RM) algorithm. The RM estimates a set of parameters that characterizes the electromagnetic environment and selects an adaptive digital beam forming DBF algorithm for implementation toward all each signal of interest (SOI) in the environment. Adaptive DBF algorithms are chosen by the RM based upon their signal to interference plus noise ratio (SINR) improvement ratio and their computational complexity. The proposed receiver framework is demonstrated to correctly estimate the desired electromagnetic parameters and select an adaptive DBF from the LUT

Journal of Telecommunications and Information Technology, 2018, nr 2

kwartalni

Journal of Telecommunications and Information Technology, 2007, nr 1

kwartalni

Fault simulation and test generation for small delay faults

Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they model only a subset of delay defect behaviors. To solve this problem, a more realistic delay fault model has been developed which models delay faults caused by the combination of spot defects and parametric process variation. According to the new model, a realistic delay fault coverage metric has been developed. Traditional path delay fault coverage metrics result in unrealistically low fault coverage, and the real test quality is not reflected. The new metric uses a statistical approach and the simulation based fault coverage is consistent with silicon data. Fast simulation algorithms are also included in this dissertation. The new metric suggests that testing the K longest paths per gate (KLPG) has high detection probability for small delay faults under process variation. In this dissertation, a novel automatic test pattern generation (ATPG) methodology to find the K longest testable paths through each gate for both combinational and sequential circuits is presented. Many techniques are used to reduce search space and CPU time significantly. Experimental results show that this methodology is efficient and able to handle circuits with an exponential number of paths, such as ISCAS85 benchmark circuit c6288. The ATPG methodology has been implemented on industrial designs. Speed binning has been done on many devices and silicon data has shown significant benefit of the KLPG test, compared to several traditional delay test approaches