The Fifth NASA Symposium on VLSI Design

The fifth annual NASA Symposium on VLSI Design had 13 sessions including Radiation Effects, Architectures, Mixed Signal, Design Techniques, Fault Testing, Synthesis, Signal Processing, and other Featured Presentations. The symposium provides insights into developments in VLSI and digital systems which can be used to increase data systems performance. The presentations share insights into next generation advances that will serve as a basis for future VLSI design

Combinational Logic Circuits for Which Tests Can Be Generated in N2 Time

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Development and analysis of the Software Implemented Fault-Tolerance (SIFT) computer

SIFT (Software Implemented Fault Tolerance) is an experimental, fault-tolerant computer system designed to meet the extreme reliability requirements for safety-critical functions in advanced aircraft. Errors are masked by performing a majority voting operation over the results of identical computations, and faulty processors are removed from service by reassigning computations to the nonfaulty processors. This scheme has been implemented in a special architecture using a set of standard Bendix BDX930 processors, augmented by a special asynchronous-broadcast communication interface that provides direct, processor to processor communication among all processors. Fault isolation is accomplished in hardware; all other fault-tolerance functions, together with scheduling and synchronization are implemented exclusively by executive system software. The system reliability is predicted by a Markov model. Mathematical consistency of the system software with respect to the reliability model has been partially verified, using recently developed tools for machine-aided proof of program correctness

Theory and design of reliable spacecraft data systems

Theory and techniques applicable to design, analysis, and fault diagnosis of reliable spacecraft data system

Industrial Applications: New Solutions for the New Era

This book reprints articles from the Special Issue "Industrial Applications: New Solutions for the New Age" published online in the open-access journal Machines (ISSN 2075-1702). This book consists of twelve published articles. This special edition belongs to the "Mechatronic and Intelligent Machines" section

Resilience of an embedded architecture using hardware redundancy

In the last decade the dominance of the general computing systems market has being replaced by embedded systems with billions of units manufactured every year. Embedded systems appear in contexts where continuous operation is of utmost importance and failure can be profound. Nowadays, radiation poses a serious threat to the reliable operation of safety-critical systems. Fault avoidance techniques, such as radiation hardening, have been commonly used in space applications. However, these components are expensive, lag behind commercial components with regards to performance and do not provide 100% fault elimination. Without fault tolerant mechanisms, many of these faults can become errors at the application or system level, which in turn, can result in catastrophic failures. In this work we study the concepts of fault tolerance and dependability and extend these concepts providing our own definition of resilience. We analyse the physics of radiation-induced faults, the damage mechanisms of particles and the process that leads to computing failures. We provide extensive taxonomies of 1) existing fault tolerant techniques and of 2) the effects of radiation in state-of-the-art electronics, analysing and comparing their characteristics. We propose a detailed model of faults and provide a classification of the different types of faults at various levels. We introduce an algorithm of fault tolerance and define the system states and actions necessary to implement it. We introduce novel hardware and system software techniques that provide a more efficient combination of reliability, performance and power consumption than existing techniques. We propose a new element of the system called syndrome that is the core of a resilient architecture whose software and hardware can adapt to reliable and unreliable environments. We implement a software simulator and disassembler and introduce a testing framework in combination with ERA’s assembler and commercial hardware simulators

A test method for analog circuits : using sensitivity analysis and the singular value decomposition

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The Huawei and Snowden Questions

This open access book answers two central questions: firstly, is it at all possible to verify electronic equipment procured from untrusted vendors? Secondly, can I build trust into my products in such a way that I support verification by untrusting customers? In separate chapters the book takes readers through the state of the art in fields of computer science that can shed light on these questions. In a concluding chapter it discusses realistic ways forward. In discussions on cyber security, there is a tacit assumption that the manufacturer of equipment will collaborate with the user of the equipment to stop third-party wrongdoers. The Snowden files and recent deliberations on the use of Chinese equipment in the critical infrastructures of western countries have changed this. The discourse in both cases revolves around what malevolent manufacturers can do to harm their own customers, and the importance of the matter is on par with questions of national security. This book is of great interest to ICT and security professionals who need a clear understanding of the two questions posed in the subtitle, and to decision-makers in industry, national bodies and nation states