A memory-based programmable logic device using look-up table cascade with synchronous static random access memories

A large-scale memory-technology-based programmable logic device (PLD) using LUT (Look-Up Table) cascade is developed in 0.35um Standard CMOS logic process. Eight 64K-bit synchronous SRAMs are connected to form an LUT cascade with a few additional circuits. The features of the LUT cascade include: 1) flexible cascade connection structure, 2) multi-phase pseudo-asynchronous operations with synchronous SRAM cores, 3) LUT-bypass redundancy. This chip operates at 33MHz in 8-LUT cascades with 122mW. Benchmark results show that it achieves a comparable performance to FPGAs

Pattern-Based FPGA Logic Block and Clustering Algorithm

In classical FPGA, LUTs and DFFs are pre-packed into BLEs and then BLEs are grouped into logic blocks. We propose a novel logic block architecture with fast combinational paths between LUTs, called pattern-based logic blocks. A new clustering algorithm is developed to release the potential of pattern-based logic blocks. Experimental results show that the novel architecture and the associated clustering algorithm lead to a 14% performance gain and a 8% wirelength reduction with a 3% area overhead compared to conventional architecture in large control-instensive benchmarks

Not All Fabrics Are Created Equal: Exploring eFPGA Parameters for IP Redaction

Semiconductor design houses rely on third-party foundries to manufacture their integrated circuits (ICs). While this trend allows them to tackle fabrication costs, it introduces security concerns as external (and potentially malicious) parties can access critical parts of the designs and steal or modify the intellectual property (IP). Embedded field-programmable gate array (eFPGA) redaction is a promising technique to protect critical IPs of an ASIC by redacting (i.e., removing) critical parts and mapping them onto a custom reconfigurable fabric. Only trusted parties will receive the correct bitstream to restore the redacted functionality. While previous studies imply that using an eFPGA is a sufficient condition to provide security against IP threats like reverse-engineering, whether this truly holds for all eFPGA architectures is unclear, thus motivating the study in this article. We examine the security of eFPGA fabrics generated by varying different FPGA design parameters. We characterize the power, performance, and area (PPA) characteristics and evaluate each fabric’s resistance to Boolean satisfiability (SAT)-based bitstream recovery. Our results encourage designers to work with custom eFPGA fabrics rather than off-the-shelf commercial FPGAs and reveals that only considering a redaction fabric’s bitstream size is inadequate for gauging security

FPGA Architecture Optimization Using Geometric Programming

Volume 4 No 13 of the periodical Progression. Published November, February, May and August by The Radiant Healing Centre. SPCL PER BT 732 P76 V.1,1932-V.5,193

Performance Analysis of Nanoelectromechanical Relay-Based Field-Programmable Gate Arrays

The energy consumption of field-programmable gate arrays (FPGA) is dominated by leakage currents and dynamic energy associated with programmable interconnect. An FPGA built entirely from nanoelectromechanical (NEM) relays can effectively eliminate leakage energy losses, reduce the interconnect dynamic energy, operate at temperatures &gt;225 °C and tolerate radiation doses in excess of 100 Mrad, while hybrid FPGAs comprising both complementary metal-oxide-semiconductor (CMOS) transistors and NEM relays (NEM-CMOS) have the potential to realize improvements in performance and energy efficiency. Large-scale integration of NEM relays, however, poses a significant engineering challenge due to the presence of moving parts. We discuss the design of FPGAs utilizing NEM relays based on a heterogeneous 3-D integration scheme, and carry out a scaling study to quantify key metrics related to performance and energy efficiency in both NEM-only and NEM-CMOS FPGAs. We show how the integration scheme has a profound effect on these metrics by changing the length of global wires. The scaling regime beyond which net performance and energy benefits is seen in NEM-CMOS over a baseline 90 nm CMOS technology is defined by an effective relay beam length of 0.5 μm , on-resistance of 200 kΩ , and a via pitch of 0.4 μm , all achievable with existing process technology. For ultra-low energy applications that are not performance critical, NEM-only FPGAs can provide close to 15× improvement in energy efficiency.QC 20180412</p