Transient fault behavior in a microprocessor: A case study

An experimental analysis is described which studies the susceptibility of a microprocessor based jet engine controller to upsets caused by current and voltage transients. A design automation environment which allows the run time injection of transients and the tracing from their impact device to the pin level is described. The resulting error data are categorized by the charge levels of the injected transients by location and by their potential to cause logic upsets, latched errors, and pin errors. The results show a 3 picoCouloumb threshold, below which the transients have little impact. An Arithmetic and Logic Unit transient is most likely to result in logic upsets and pin errors (i.e., impact the external environment). The transients in the countdown unit are potentially serious since they can result in latched errors, thus causing latent faults. Suggestions to protect the processor against these errors, by incorporating internal error detection and transient suppression techniques, are also made

Statistical Reliability Estimation of Microprocessor-Based Systems

What is the probability that the execution state of a given microprocessor running a given application is correct, in a certain working environment with a given soft-error rate? Trying to answer this question using fault injection can be very expensive and time consuming. This paper proposes the baseline for a new methodology, based on microprocessor error probability profiling, that aims at estimating fault injection results without the need of a typical fault injection setup. The proposed methodology is based on two main ideas: a one-time fault-injection analysis of the microprocessor architecture to characterize the probability of successful execution of each of its instructions in presence of a soft-error, and a static and very fast analysis of the control and data flow of the target software application to compute its probability of success. The presented work goes beyond the dependability evaluation problem; it also has the potential to become the backbone for new tools able to help engineers to choose the best hardware and software architecture to structurally maximize the probability of a correct execution of the target softwar

On-Line Instruction-checking in Pipelined Microprocessors

Microprocessors performances have increased by more than five orders of magnitude in the last three decades. As technology scales down, these components become inherently unreliable posing major design and test challenges. This paper proposes an instruction-checking architecture to detect erroneous instruction executions caused by both permanent and transient errors in the internal logic of a microprocessor. Monitoring the correct activation sequence of a set of predefined microprocessor control/status signals allow distinguishing between correctly and not correctly executed instruction

Cross-layer system reliability assessment framework for hardware faults

System reliability estimation during early design phases facilitates informed decisions for the integration of effective protection mechanisms against different classes of hardware faults. When not all system abstraction layers (technology, circuit, microarchitecture, software) are factored in such an estimation model, the delivered reliability reports must be excessively pessimistic and thus lead to unacceptably expensive, over-designed systems. We propose a scalable, cross-layer methodology and supporting suite of tools for accurate but fast estimations of computing systems reliability. The backbone of the methodology is a component-based Bayesian model, which effectively calculates system reliability based on the masking probabilities of individual hardware and software components considering their complex interactions. Our detailed experimental evaluation for different technologies, microarchitectures, and benchmarks demonstrates that the proposed model delivers very accurate reliability estimations (FIT rates) compared to statistically significant but slow fault injection campaigns at the microarchitecture level.Peer ReviewedPostprint (author's final draft

Micro-threading and FPGA implementation of a RISC microprocessor : a thesis presented in partial fulfilment of the requirements for the degree of Master of Science in Computer Science at Massey University, Palmerston North, New Zealand

Appendix E removed due to copyright restrictions. Articles are available in the print copy held in the libraryThis thesis is the outcome of research in two areas of computer technology: microprocessor and multi-processor architectures (specifically from the perspective of how differently they tolerate highly-latent and non-deterministic events), and hardware design of complex digital systems containing both datapath and control (particularly microprocessors). This thesis starts by pointing out that in order to achieve high processing speeds, current popular superscalar microprocessors (e.g. Intel Pentiums, Digital Alpha, etc) rely heavily on the technique of speculating the outcome of instruction flow in order to predict the behaviour of non-deterministic computing operations (as in loading operands from high-latency memory into the processor). This is fine only if the speculation is correct. But, what if it isn't? If the speculation fails, this would mean that the processor has to abandon its current decision (which now proved to be the wrong one) for the instruction flow path taken and to start all over again with the other path (the actual correct one). This is a waste of valuable processing time and hardware resources and a reduction of performance when speculation fails. Therefore, these processors can achieve high performance only when the majority of speculations are successful (being able to predict the right path). In an attempt to overcome the above shortcomings, the first part of this thesis is an investigation of the novel vector micro-threading architecture as an alternative approach to the current superscalar-based speculative microprocessor designs. Micro-threading is based on the not-so-novel multithreading technique, which avoids speculation altogether and instead, starts running a different thread of instructions while waiting for the non-determinism to be resolved. This utilizes the chip resources more efficiently without waste of any processing power. The rest of this thesis focuses on the baseline RISC processor platform, the MIPS R2000, which is reviewed first then partially synthesized from the RTL (Register Transfer Level) description using VHDL and then simulated and tested. This is conducted in order for future research to build upon and add the micro-threading architectural add-ons and modifications. Keywords: Micro-threading, Latency Tolerance, FPGA Synthesis, RISC Architecture, MIPS R2000 processor, VHDL

Frontend frequency-voltage adaptation for optimal energy-delay/sup 2/

In this paper, we present a clustered, multiple-clock domain (CMCD) microarchitecture that combines the benefits of both clustering and globally asynchronous locally synchronous (GALS) designs. We also present a mechanism for dynamically adapting the frequency and voltage of the frontend of the CMCD with the goal to optimize the energy-delay/sup 2/ product (ED2P). Our mechanism has minimal hardware cost, is entirely self-adjustable, does not depend on any thresholds, and achieves results close to optimal. We evaluate it on 16 SPEC 2000 applications and report 17.5% ED2P reduction on average (80% of the upper bound).Peer ReviewedPostprint (published version

Functional Verification of Power Electronic Systems

This project is the final work of the degree in Industrial Electronics and Automatic Engineering. It has global concepts of electronics but it focuses in power electronic systems. There is a need for reliable testing systems to ensure the good functionality of power electronic systems. The constant evolution of this products requires the development of new testing techniques. This project aims to develop a new testing system to accomplish the functional verification of a new power electronic system manufactured on a company that is in the power electronic sector . This test system consists on two test bed platforms, one to test the control part of the systems and the other one to test their functionality. A software to perform the test is also designed. Finally, the testing protocol is presented. This design is validated and then implemented on a buck converter and an inverter that are manufactured at the company. The results show that the test system is reliable and is capable of testing the functional verification of the two power electronic system successfully. In summary, this design can be introduced in the power electronic production process to test the two products ensuring their reliability in the market