A VISION-BASED QUALITY INSPECTION SYSTEM FOR FABRIC DEFECT DETECTION AND CLASSIFICATION

Published ThesisQuality inspection of textile products is an important issue for fabric manufacturers. It is desirable to produce the highest quality goods in the shortest amount of time possible. Fabric faults or defects are responsible for nearly 85% of the defects found by the garment industry. Manufacturers recover only 45 to 65% of their profits from second or off-quality goods. There is a need for reliable automated woven fabric inspection methods in the textile industry. Numerous methods have been proposed for detecting defects in textile. The methods are generally grouped into three main categories according to the techniques they use for texture feature extraction, namely statistical approaches, spectral approaches and model-based approaches. In this thesis, we study one method from each category and propose their combinations in order to get improved fabric defect detection and classification accuracy. The three chosen methods are the grey level co-occurrence matrix (GLCM) from the statistical category, the wavelet transform from the spectral category and the Markov random field (MRF) from the model-based category. We identify the most effective texture features for each of those methods and for different fabric types in order to combine them. Using GLCM, we identify the optimal number of features, the optimal quantisation level of the original image and the optimal intersample distance to use. We identify the optimal GLCM features for different types of fabrics and for three different classifiers. Using the wavelet transform, we compare the defect detection and classification performance of features derived from the undecimated discrete wavelet and those derived from the dual-tree complex wavelet transform. We identify the best features for different types of fabrics. Using the Markov random field, we study the performance for fabric defect detection and classification of features derived from different models of Gaussian Markov random fields of order from 1 through 9. For each fabric type we identify the best model order. Finally, we propose three combination schemes of the best features identified from the three methods and study their fabric detection and classification performance. They lead generally to improved performance as compared to the individual methods, but two of them need further improvement

Using the Dual-Tree Complex Wavelet Transform for Improved Fabric Defect Detection

Published ArticleThe dual-tree complex wavelet transform (DTCWT) solves the problems of shift variance and low directional selectivity in two and higher dimensions found with the commonly used discrete wavelet transform (DWT). It has been proposed for applications such as texture classification and content-based image retrieval. In this paper, the performance of the dual-tree complex wavelet transform for fabric defect detection is evaluated. As experimental samples, the fabric images from TILDA, a textile texture database from the Workgroup on Texture Analysis of the German Research Council (DFG), are used. The mean energies of real and imaginary parts of complex wavelet coefficients taken separately are identified as effective features for the purpose of fabric defect detection. Then it is shown that the use of the dual-tree complex wavelet transform yields greater performance as compared to the undecimated wavelet transform (UDWT) with a detection rate of 4.5% to 15.8% higher depending on the fabric type

MULTIRIDGELETS FOR TEXTURE ANALYSIS

Directional wavelets have orientation selectivity and thus are able to efficiently represent highly anisotropic elements such as line segments and edges. Ridgelet transform is a kind of directional multi-resolution transform and has been successful in many image processing and texture analysis applications. The objective of this research is to develop multi-ridgelet transform by applying multiwavelet transform to the Radon transform so as to attain attractive improvements. By adapting the cardinal orthogonal multiwavelets to the ridgelet transform, it is shown that the proposed cardinal multiridgelet transform (CMRT) possesses cardinality, approximate translation invariance, and approximate rotation invariance simultaneously, whereas no single ridgelet transform can hold all these properties at the same time. These properties are beneficial to image texture analysis. This is demonstrated in three studies of texture analysis applications. Firstly a texture database retrieval study taking a portion of the Brodatz texture album as an example has demonstrated that the CMRT-based texture representation for database retrieval performed better than other directional wavelet methods. Secondly the study of the LCD mura defect detection was based upon the classification of simulated abnormalities with a linear support vector machine classifier, the CMRT-based analysis of defects were shown to provide efficient features for superior detection performance than other competitive methods. Lastly and the most importantly, a study on the prostate cancer tissue image classification was conducted. With the CMRT-based texture extraction, Gaussian kernel support vector machines have been developed to discriminate prostate cancer Gleason grade 3 versus grade 4. Based on a limited database of prostate specimens, one classifier was trained to have remarkable test performance. This approach is unquestionably promising and is worthy to be fully developed

An integrated method of feature extraction and objective evaluation of fabric pilling

A pilled fabric image consists of sub-images of different frequency components, and the fabric texture and the pilling information are in different frequency bands. Interference from fabric background texture affects the accuracy of computer-aided pilling ratings. A new approach for pilling evaluation based on the multi-scale two-dimensional dualtree complex wavelet transform (CWT) is presented in this paper to extract the pilling information from pilled fabric images. The CWT method can effectively decompose the pilled fabric image with six orientations at different scales and reconstruct fabric background texture and pilling sub-images. This study used an energy analysis method to search for an optimum image decomposition scale and dynamically discriminate pilling image from noise, fabric texture, fabric surface unevenness, and illuminative variation in the pilled fabric image. For pilling objective rating, six parameters were extracted from the pilling image to describe pill properties. A Levenberg-Marquardt backpropagation neural rule was used as a classifier to classify the pilling grade. The proposed method was evaluated using knitted, woven, and nonwoven pilled fabric images photographed with a digital camera.<br /

Using the Dual-Tree Complex Wavelet Transform for Improved Fabric Defect Detection

The dual-tree complex wavelet transform (DTCWT) solves the problems of shift variance and low directional selectivity in two and higher dimensions found with the commonly used discrete wavelet transform (DWT). It has been proposed for applications such as texture classification and content-based image retrieval. In this paper, the performance of the dual-tree complex wavelet transform for fabric defect detection is evaluated. As experimental samples, the fabric images from TILDA, a textile texture database from the Workgroup on Texture Analysis of the German Research Council (DFG), are used. The mean energies of real and imaginary parts of complex wavelet coefficients taken separately are identified as effective features for the purpose of fabric defect detection. Then it is shown that the use of the dual-tree complex wavelet transform yields greater performance as compared to the undecimated wavelet transform (UDWT) with a detection rate of 4.5% to 15.8% higher depending on the fabric type

N-way modeling for wavelet filter determination in Multivariate Image Analysis

Additional information may be found in the online version of this article at the publisher’s web site[EN] When trying to analyze spatial relationships in image analysis, wavelets appear as one of the state-of-the-art tools. However, image analysis is a problem-dependent issue, and different applications might require different wavelets in order to gather the main sources of variation in the acquired images with respect to the specific task to be performed. This paper provides a methodology based on N-way modeling for properly selecting the best wavelet choice to use or at least to provide a range of possible wavelet choices (in terms of families, filters, and decomposition levels), for each image and problem at hand. The methodology has been applied on two different data sets with exploratory and monitoring objectives. 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