Testing two-phase transition signaling based self-timed circuits in a synthesis environment

Journal ArticleThe problem of testing self-timed circuits generated by an automatic synthesis system is studied. Two-phase transition signalling is assumed and the circuits are targetted for an asynchronous macromodule based implementation as in [?, ?, ?, ?]. The partitioning of the circuits into control blocks, function blocks, and predicate (conditional) blocks, originally conceived for synthesis purpose, is found to be very elegant and appropriate for test generation. The problem of data dependent control flow is solved by introducing a new macromodule called SCANSELECT (SELECT with scan). Algorithms for test generation are based on the Petri-net like representation of the physical circuit. The techniques are illustrated on the high-level synthesis system called SHILPA being developed by the Author's

ACT: A DFT tool for self-timed circuits

Journal ArticleThis paper presents a Design for Testability (DFT) tool called ACT (Asynchronous Circuit Testing) which uses a partial scan technique to make macro-module based selftimed circuits testable. The ACT tool is the first oFits kind for testing macro-module based self-timed circuits. ACT modifies designs automatically to incorporate partial scan and provides a complete path from schematic capturie to physical layout. It also has a test generation system to generate vectors for the testable design and to compute fault coverage of the generated tests. The test generatioin system includes a module for doing critical hazard free (.est generation using a new 6-valued algebra. ACT has been hilt around commercial tools from Viewlogic and Cascade. A Viewlogic schematic is used as the design entry point and Cascade tools are used for technology mapping

DFT for fast testing of self-timed control circuits

Journal ArticleIn this paper, we present a methodology to perform fast testing of the control path of self-timed circuits [91]. The speedup is achieved by testing all the execution paths in the control simultaneously. The circuits considered in this paper are those designed using an OCCAM based circuit compiler 121. This Compiler translates an OCCAM program description into an interconnection of pre-existing self-timed macro-modules (2, 10]. The method proposed involves modifying certain modules and structures in such a way that the circuits obtained by translation using these modified modules are testable in above mentioned way

Testing self-timed circuits using partial scan

Journal ArticleThis paper presents a partial scan method for testing both the control and data path parts of macromodule based self-timed circuits for stuck-at faults. Compared with other proposed test methods for testing control paths in self-timed circuits, this technique offers better fault coverage under a stuck-at input model than methods using self-checking properties, and requires fewer storage elements to be made scanable than full scan approaches with similar fault coverage. A new method is proposed to test the sequential network in the control path in this partial scan environment. The partial scan approach has also been applied to datapaths, where structural analysis is used to select which latches should be made scannable to break cycles in the circuit. Experimental data is presented to show that high fault coverage is possible using this method with only a subset of storage elements in the control and data paths being made scannable

A partial scan methodology for testing self-timed circuits

technical reportThis paper presents a partial scan method for testing control sections of macromodule based self-timed circuits for stuck-at faults. In comparison with other proposed test methods for self-timed circuits, this technique offers better fault coverage than methods using self-checking techniques, and requires fewer storage elements to be made scannable than full scan approaches with similar fault coverage. A new method is proposed to test the sequential network in this partial scan environment. Experimental data is presented to show that high fault coverage is possible using this method with only a subset of storage elements being made scannable

Self-timed circuits using DCVSL semi-bundled delay wrappers

Journal ArticleWe present a technique for generating robust self-timed completion signals for general dynamic datapath circuits. The wrapper circuit is based on our previous domino semi-bundled delay (SBD) circuits, but uses DCVSL circuits in the wrapper for higher performance. We describe the basic SBD-DCVSL building blocks in the template with respect to their circuit structures and operational behavior. These DCVSL SBD circuits show better performance, exhibit reduced overhead, and require reduced operating margins for the matched delay compared with the domino version. The DCVSL wrapper can also identify a class of delay faults in the data path

A comparison of modular self-timed design styles

technical reportState-machine sequencing methods in modular 2-phase and 4-phase asynchronous handshake control are compared. Design styles are discussed, and the sequencers are tested against each other using a medium-scale minicomputer test design implemented in FPGAs. Seven 4-phase sequencers are tested. In these comparisons, 2- phase control is faster than 4-phase. Within the 4-phase designs, speed is enhanced when work is overlapped with handshake restoration. Performance of asynchronous and synchronous designs is compared

Relative timing

Journal ArticleRelative Timing is introduced as an informal method for aggressive asynchronous design. It is demonstrated on three example circuits (C-Element, FIFO, and RAPPID Tag Unit), facilitating transformations from speed-independent circuits to burst-mode, relative timed, and pulse-mode circuits. Relative timing enables improved performance, area, power and testability in all three cases

Some recent asynchronous system design methodologies

Journal ArticleWe present an in-depth study of some techniques for asynchronous system design, analysis, and verification. After defining basic terminology, we take one simple example - a four-phase t o two-phase converter - and present its design using (a) classical flow-tables; (b) Signal Transition Graphs of [8]; and (c) Trace Theory of [15]. We then present necessary and sufficient conditions for Delay Insensitivity, proposed by [38], and illustrate it on our example. Finally, we present the work of [13] on the verification of asynchronous circuits, and illustrate it on the circuits derived in the paper. The following points are emphasized: (i) presentation of techniques at more depth than in a general survey; (ii) illustration of all t h e aspects discussed on a common example; (hi) comparative study of the works presented. Many interesting works had to be left out, solely because of our lack of space and time

CAD directions for high performance asynchronous circuits

Journal ArticleThis paper describes a novel methodology for high performance asynchronous design based on timed circuits and on CAD support for their synthesis using Relative Timing. This methodology was developed for a prototype iA32 instruction length decoding and steering unit called RAPPID ("Revolving Asynchronous Pentium® Processor Instruction Decoder") that was fabricated and tested successfully. Silicon results show significant advantages - in particular, performance of 2.5-4.5 instructions per nS - with manageable risks using this design technology. RAPPID achieves three times faster performa the power and requiring a minor area penalty as a comparable 400MHz clocked circuit. Relative Timing is based on user-defined and automatically extracted relative tinning assumptions between signal transitions in a circuit and its environment. It supports the specification, synthesis, and verification of high-performance asynchronous circuits, such as pulse-mode circuits, that can be derived from an initial speed-independent specification. Relative timing presents a "middle-ground" between clocked and asynchronous circuits, and is a fertile area for CAD development. We discuss possible directions for future CAD development