Aerospace medicine and biology: A continuing bibliography with indexes, supplement 130, July 1974

This special bibliography lists 291 reports, articles, and other documents introduced into the NASA scientific and technical information system in June 1974

Statistical Reliability Estimation of Microprocessor-Based Systems

What is the probability that the execution state of a given microprocessor running a given application is correct, in a certain working environment with a given soft-error rate? Trying to answer this question using fault injection can be very expensive and time consuming. This paper proposes the baseline for a new methodology, based on microprocessor error probability profiling, that aims at estimating fault injection results without the need of a typical fault injection setup. The proposed methodology is based on two main ideas: a one-time fault-injection analysis of the microprocessor architecture to characterize the probability of successful execution of each of its instructions in presence of a soft-error, and a static and very fast analysis of the control and data flow of the target software application to compute its probability of success. The presented work goes beyond the dependability evaluation problem; it also has the potential to become the backbone for new tools able to help engineers to choose the best hardware and software architecture to structurally maximize the probability of a correct execution of the target softwar

Self-Adaptive Autoreclosing Scheme usingI Artificial Neural Network and Taguchi's Methodology in Extra High Voltage Transmission Systems

Conventional automatic reclosures blindly operate for permanent, semi-permanent or transient faults on an overhead line without any discrimination after allowing some estimated time delay. Reclosing onto a line with uncleared fault often results in, not only loss of stability and synchronism but also damage to system equipments, as a consequence. The thesis focuses on methods to discriminate a temporary fault from a permanent one, and accurately determine fault extinctiontime in an extra high voltage (EHV) transmission line in a bid to develop a self-adaptive automatic reclosing scheme. The fault identification prior to reclosing is based on optimized artificial neural network associated with three training algorithms, namely, Standard Error Back-Propagation, Levenberg Marquardt and Resilient Back-Propagation algorithms. In addition, Taguchi's methodology is employed in optimizing the parameters of each algorithm used for training, and in deciding the number of hidden neurons of the neural network. To get data for training the neural networks, a range of faults are simulated on two case studies -single machine -infinite bus model (connected via EHVtransmission line) and a benchmark IEEE 9-bus electric system. The spectra of the fault voltage data are analyzed using Fast Fourier Transform, and it has been found out that the DC, the fundamental and the first four harmonic components can sufficiently and uniquely represent the condition of each fault. In each case study, the neural network is fed with the normalized energies of the DC, the fundamental and the first four harmonics of the faulted voltages, effectively trained with a set of training data, and verified with a dedicated testing data obtained from fault voltage signals generated on IEEE 14-bus electric system model. The results show the efficacy of the developed adaptive automatic reclosing scheme. This effectively means it is possible to avoid reclosing before any fault on a transmission line (be it temporary or permanent) is totally cleared

New Fault Detection, Mitigation and Injection Strategies for Current and Forthcoming Challenges of HW Embedded Designs

Tesis por compendio[EN] Relevance of electronics towards safety of common devices has only been growing, as an ever growing stake of the functionality is assigned to them. But of course, this comes along the constant need for higher performances to fulfill such functionality requirements, while keeping power and budget low. In this scenario, industry is struggling to provide a technology which meets all the performance, power and price specifications, at the cost of an increased vulnerability to several types of known faults or the appearance of new ones. To provide a solution for the new and growing faults in the systems, designers have been using traditional techniques from safety-critical applications, which offer in general suboptimal results. In fact, modern embedded architectures offer the possibility of optimizing the dependability properties by enabling the interaction of hardware, firmware and software levels in the process. However, that point is not yet successfully achieved. Advances in every level towards that direction are much needed if flexible, robust, resilient and cost effective fault tolerance is desired. The work presented here focuses on the hardware level, with the background consideration of a potential integration into a holistic approach. The efforts in this thesis have focused several issues: (i) to introduce additional fault models as required for adequate representativity of physical effects blooming in modern manufacturing technologies, (ii) to provide tools and methods to efficiently inject both the proposed models and classical ones, (iii) to analyze the optimum method for assessing the robustness of the systems by using extensive fault injection and later correlation with higher level layers in an effort to cut development time and cost, (iv) to provide new detection methodologies to cope with challenges modeled by proposed fault models, (v) to propose mitigation strategies focused towards tackling such new threat scenarios and (vi) to devise an automated methodology for the deployment of many fault tolerance mechanisms in a systematic robust way. The outcomes of the thesis constitute a suite of tools and methods to help the designer of critical systems in his task to develop robust, validated, and on-time designs tailored to his application.[ES] La relevancia que la electrónica adquiere en la seguridad de los productos ha crecido inexorablemente, puesto que cada vez ésta copa una mayor influencia en la funcionalidad de los mismos. Pero, por supuesto, este hecho viene acompañado de una necesidad constante de mayores prestaciones para cumplir con los requerimientos funcionales, al tiempo que se mantienen los costes y el consumo en unos niveles reducidos. En este escenario, la industria está realizando esfuerzos para proveer una tecnología que cumpla con todas las especificaciones de potencia, consumo y precio, a costa de un incremento en la vulnerabilidad a múltiples tipos de fallos conocidos o la introducción de nuevos. Para ofrecer una solución a los fallos nuevos y crecientes en los sistemas, los diseñadores han recurrido a técnicas tradicionalmente asociadas a sistemas críticos para la seguridad, que ofrecen en general resultados sub-óptimos. De hecho, las arquitecturas empotradas modernas ofrecen la posibilidad de optimizar las propiedades de confiabilidad al habilitar la interacción de los niveles de hardware, firmware y software en el proceso. No obstante, ese punto no está resulto todavía. Se necesitan avances en todos los niveles en la mencionada dirección para poder alcanzar los objetivos de una tolerancia a fallos flexible, robusta, resiliente y a bajo coste. El trabajo presentado aquí se centra en el nivel de hardware, con la consideración de fondo de una potencial integración en una estrategia holística. Los esfuerzos de esta tesis se han centrado en los siguientes aspectos: (i) la introducción de modelos de fallo adicionales requeridos para la representación adecuada de efectos físicos surgentes en las tecnologías de manufactura actuales, (ii) la provisión de herramientas y métodos para la inyección eficiente de los modelos propuestos y de los clásicos, (iii) el análisis del método óptimo para estudiar la robustez de sistemas mediante el uso de inyección de fallos extensiva, y la posterior correlación con capas de más alto nivel en un esfuerzo por recortar el tiempo y coste de desarrollo, (iv) la provisión de nuevos métodos de detección para cubrir los retos planteados por los modelos de fallo propuestos, (v) la propuesta de estrategias de mitigación enfocadas hacia el tratamiento de dichos escenarios de amenaza y (vi) la introducción de una metodología automatizada de despliegue de diversos mecanismos de tolerancia a fallos de forma robusta y sistemática. Los resultados de la presente tesis constituyen un conjunto de herramientas y métodos para ayudar al diseñador de sistemas críticos en su tarea de desarrollo de diseños robustos, validados y en tiempo adaptados a su aplicación.[CA] La rellevància que l'electrònica adquireix en la seguretat dels productes ha crescut inexorablement, puix cada volta més aquesta abasta una major influència en la funcionalitat dels mateixos. Però, per descomptat, aquest fet ve acompanyat d'un constant necessitat de majors prestacions per acomplir els requeriments funcionals, mentre es mantenen els costos i consums en uns nivells reduïts. Donat aquest escenari, la indústria està fent esforços per proveir una tecnologia que complisca amb totes les especificacions de potència, consum i preu, tot a costa d'un increment en la vulnerabilitat a diversos tipus de fallades conegudes, i a la introducció de nous tipus. Per oferir una solució a les noves i creixents fallades als sistemes, els dissenyadors han recorregut a tècniques tradicionalment associades a sistemes crítics per a la seguretat, que en general oferixen resultats sub-òptims. De fet, les arquitectures empotrades modernes oferixen la possibilitat d'optimitzar les propietats de confiabilitat en habilitar la interacció dels nivells de hardware, firmware i software en el procés. Tot i això eixe punt no està resolt encara. Es necessiten avanços a tots els nivells en l'esmentada direcció per poder assolir els objectius d'una tolerància a fallades flexible, robusta, resilient i a baix cost. El treball ací presentat se centra en el nivell de hardware, amb la consideració de fons d'una potencial integració en una estratègia holística. Els esforços d'esta tesi s'han centrat en els següents aspectes: (i) la introducció de models de fallada addicionals requerits per a la representació adequada d'efectes físics que apareixen en les tecnologies de fabricació actuals, (ii) la provisió de ferramentes i mètodes per a la injecció eficient del models proposats i dels clàssics, (iii) l'anàlisi del mètode òptim per estudiar la robustesa de sistemes mitjançant l'ús d'injecció de fallades extensiva, i la posterior correlació amb capes de més alt nivell en un esforç per retallar el temps i cost de desenvolupament, (iv) la provisió de nous mètodes de detecció per cobrir els reptes plantejats pels models de fallades proposats, (v) la proposta d'estratègies de mitigació enfocades cap al tractament dels esmentats escenaris d'amenaça i (vi) la introducció d'una metodologia automatitzada de desplegament de diversos mecanismes de tolerància a fallades de forma robusta i sistemàtica. Els resultats de la present tesi constitueixen un conjunt de ferramentes i mètodes per ajudar el dissenyador de sistemes crítics en la seua tasca de desenvolupament de dissenys robustos, validats i a temps adaptats a la seua aplicació.Espinosa García, J. (2016). New Fault Detection, Mitigation and Injection Strategies for Current and Forthcoming Challenges of HW Embedded Designs [Tesis doctoral no publicada]. Universitat Politècnica de València. https://doi.org/10.4995/Thesis/10251/73146TESISCompendi

A Dual-Rate Model Predictive Controller for Fieldbus Based Distributed Control Systems

In modern Distributed Control Systems (DCS), an industrial computer network protocol known as fieldbus is used in chemical, petro-chemical and other process industries for real-time communication between digital controllers, sensors, actuators and other smart devices. In a closed-loop digital control system, data is transferred from sensor to controller and controller to actuator cyclically in a timely but discontinuous fashion at a specific rate known as sampling-rate or macrocycle through fieldbus. According to the current trend of fieldbus technology, in most industrial control systems, the sampling-rate or macrocycle is fixed at the time of system configuration. This fixed sampling-rate makes it impossible to use a multi-rate controller that can automatically switch between multiple sampling-rates at run time to gain some advantages, such as network bandwidth conservation, energy conservation and reduction of mechanical wear in actuators. This thesis is concerned about design and implementation of a dual-rate controller which automatically switches between the two sampling-rates depending on system’s dynamic state. To be more precise, the controller uses faster sampling-rate when the process goes through transient states and slower sampling-rate when the process is at steady-state operation. The controller is based on a Model Predictive Control (MPC) algorithm and a Kalman filter based observer. This thesis starts with theoretical development of the dual-rate controller design. Subsequently, the developed controller is implemented on a Siemens PCS 7 system for controlling a physical process. The investigation has concluded that this control strategy can indeed lead to conservation of network bandwidth, energy savings in field devices and reduction of wear in mechanical actuators in fieldbus based distributed control systems

MOCAST 2021

The 10th International Conference on Modern Circuit and System Technologies on Electronics and Communications (MOCAST 2021) will take place in Thessaloniki, Greece, from July 5th to July 7th, 2021. The MOCAST technical program includes all aspects of circuit and system technologies, from modeling to design, verification, implementation, and application. This Special Issue presents extended versions of top-ranking papers in the conference. The topics of MOCAST include:Analog/RF and mixed signal circuits;Digital circuits and systems design;Nonlinear circuits and systems;Device and circuit modeling;High-performance embedded systems;Systems and applications;Sensors and systems;Machine learning and AI applications;Communication; Network systems;Power management;Imagers, MEMS, medical, and displays;Radiation front ends (nuclear and space application);Education in circuits, systems, and communications

Coherent Interactions in Rare-Earth-Ion-Doped Crystals for Applications in Quantum Information Science

This thesis describes investigations of the use of cryogenically cooled rare-earth-ion-doped crystals for quantum information processing and quantum optics. Several aspects of the coherent interaction between light and rare-earth ions in solids are addressed. Quantum information science has given physicists new views of quantum mechanics. The transmission of quantum states has already found practical use and full scale quantum computers may one day perform computations and simulations that would be impossible on a conventional computer. The work presented in this thesis can be seen as a part of a broad effort to learn how to control and manipulate quantum mechanical systems, which will become necessary as science and technology continue to push ever deeper into the nanoscopic world. Coherent radiation, such as laser light, provides us with an ideal tool for these investigations and, along the way, we may also learn more about the quantum nature of light. Rare-earth ions in inorganic crystals have several unusual properties that are interesting for applications within quantum information science, including long coherence times and long-lived ground state sublevels that can be used for storage of quantum and classical information. As part of the work presented in this thesis, new materials have been investigated with respect to these properties, and ways to enhance the useful properties of the materials were explored. In one investigation, the lifetime of information stored in the ground state population distribution of Tm3 ions in YAG was shown to increase by several orders of magnitude with the application of a magnetic field. It is demonstrated how the optical inhomogeneous absorption profile can be prepared, so that the light only interacts with a selected group of ions, absorbing on a specific transition. Narrow absorbing structures, with widths approaching the optical homogeneous linewidth, have been prepared with no absorption in the surrounding spectral interval. This thesis addresses the use of such structures as hardware for quantum bits. Tailored pulses, capable of inducing controlled changes in the quantum states of the ions (qubits), even in the presence of unknown variations of coupling strengths and frequencies, have been realised experimentally and used for multiple transfer of ions between energy levels. Ion-ion interactions, which can be used for performing quantum logic operations, have been investigated in some detail. Techniques for selecting strongly interacting ions, by transferring weakly interacting ions to auxiliary states, have been demonstrated. A scheme for storing the quantum state of light in a solid, using photon-echo-like techniques, is proposed and analysed. In the proposed scheme, an optical wave packet is absorbed and subsequently re-emitted by an inhomogeneous absorption profile, which is tailored and externally controlled by the application of an electric field Additionally, an accumulated photon echo experiment has been performed using faint optical pulses. The experiment can be viewed as a demonstration of delayed self-interference of a single photon and as a demonstration of how a single photon can act as two of the fields in a photon echo process