Ring oscillator clocks and margins

How much margin do we have to add to the delay lines of a bundled-data circuit? This paper is an attempt to give a methodical answer to this question, taking into account all sources of variability and the existing EDA machinery for timing analysis and sign-off. The paper is based on the study of the margins of a ring oscillator that substitutes a PLL as clock generator. A timing model is proposed that shows that a 12% margin for delay lines can be sufficient to cover variability in a 65nm technology. In a typical scenario, performance and energy improvements between 15% and 35% can be obtained by using a ring oscillator instead of a PLL. The paper concludes that a synchronous circuit with a ring oscillator clock shows similar benefits in performance and energy as those of bundled-data asynchronous circuits.Peer ReviewedPostprint (author's final draft

Yield-driven power-delay-optimal CMOS full-adder design complying with automotive product specifications of PVT variations and NBTI degradations

We present the detailed results of the application of mathematical optimization algorithms to transistor sizing in a full-adder cell design, to obtain the maximum expected fabrication yield. The approach takes into account all the fabrication process parameter variations specified in an industrial PDK, in addition to operating condition range and NBTI aging. The final design solutions present transistor sizing, which depart from intuitive transistor sizing criteria and show dramatic yield improvements, which have been verified by Monte Carlo SPICE analysis

Statistical Power Supply Dynamic Noise Prediction in Hierarchical Power Grid and Package Networks

One of the most crucial high performance systems-on-chip design challenge is to front their power supply noise sufferance due to high frequencies, huge number of functional blocks and technology scaling down. Marking a difference from traditional post physical-design static voltage drop analysis, /a priori dynamic voltage drop/evaluation is the focus of this work. It takes into account transient currents and on-chip and package /RLC/ parasitics while exploring the power grid design solution space: Design countermeasures can be thus early defined and long post physical-design verification cycles can be shortened. As shown by an extensive set of results, a carefully extracted and modular grid library assures realistic evaluation of parasitics impact on noise and facilitates the power network construction; furthermore statistical analysis guarantees a correct current envelope evaluation and Spice simulations endorse reliable result

Development of reliability methodology for systems engineering. Volume II - Application - Design reliability analysis of a 250 volt-ampere static inverter Final report

Design stage reliability analysis application to static inverte

Voltage noise analysis with ring oscillator clocks

Voltage noise is the main source of dynamic variability in integrated circuits and a major concern for the design of Power Delivery Networks (PDNs). Ring Oscillators Clocks (ROCs) have been proposed as an alternative to mitigate the negative effects of voltage noise as technology scales down and power density increases. However, their effectiveness highly depends on the design parameters of the PDN, power consumption patterns of the system and spatial locality of the ROCs within the clock domains. This paper analyzes the impact of the PDN parameters and ROC location on the robustness to voltage noise. The capability of reacting instantaneously to unpredictable voltage droops makes ROCs an attractive solution, which allows to reduce the amount of decoupling capacitance without downgrading performance. Tolerance to voltage noise and related benefits can be increased by using multiple ROCs and reducing the size of the clock domains. The analysis shows that up to 83% of the margins for voltage noise and up to 27% of the leakage power can be reduced by using local ROCs.Peer ReviewedPostprint (author's final draft

Reliability analysis of timing channel circuits in a static inverter

Timing channel circuit reliability in static inverte

A software controlled voltage tuning system using multi-purpose ring oscillators

This paper presents a novel software driven voltage tuning method that utilises multi-purpose Ring Oscillators (ROs) to provide process variation and environment sensitive energy reductions. The proposed technique enables voltage tuning based on the observed frequency of the ROs, taken as a representation of the device speed and used to estimate a safe minimum operating voltage at a given core frequency. A conservative linear relationship between RO frequency and silicon speed is used to approximate the critical path of the processor. Using a multi-purpose RO not specifically implemented for critical path characterisation is a unique approach to voltage tuning. The parameters governing the relationship between RO and silicon speed are obtained through the testing of a sample of processors from different wafer regions. These parameters can then be used on all devices of that model. The tuning method and software control framework is demonstrated on a sample of XMOS XS1-U8A-64 embedded microprocessors, yielding a dynamic power saving of up to 25% with no performance reduction and no negative impact on the real-time constraints of the embedded software running on the processor

Power Side Channels in Security ICs: Hardware Countermeasures

Power side-channel attacks are a very effective cryptanalysis technique that can infer secret keys of security ICs by monitoring the power consumption. Since the emergence of practical attacks in the late 90s, they have been a major threat to many cryptographic-equipped devices including smart cards, encrypted FPGA designs, and mobile phones. Designers and manufacturers of cryptographic devices have in response developed various countermeasures for protection. Attacking methods have also evolved to counteract resistant implementations. This paper reviews foundational power analysis attack techniques and examines a variety of hardware design mitigations. The aim is to highlight exposed vulnerabilities in hardware-based countermeasures for future more secure implementations