226 research outputs found

    Efficient state reduction methods for PLA-based sequential circuits

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    Experiences with heuristics for the state reduction of finite-state machines are presented and two new heuristic algorithms described in detail. Results on machines from the literature and from the MCNC benchmark set are shown. The area of the PLA implementation of the combinational component and the design time are used as figures of merit. The comparison of such parameters, when the state reduction step is included in the design process and when it is not, suggests that fast state-reduction heuristics should be implemented within FSM automatic synthesis systems

    Custom Integrated Circuits

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    Contains reports on twelve research projects.Analog Devices, Inc.International Business Machines, Inc.Joint Services Electronics Program (Contract DAAL03-86-K-0002)Joint Services Electronics Program (Contract DAAL03-89-C-0001)U.S. Air Force - Office of Scientific Research (Grant AFOSR 86-0164)Rockwell International CorporationOKI Semiconductor, Inc.U.S. Navy - Office of Naval Research (Contract N00014-81-K-0742)Charles Stark Draper LaboratoryNational Science Foundation (Grant MIP 84-07285)National Science Foundation (Grant MIP 87-14969)Battelle LaboratoriesNational Science Foundation (Grant MIP 88-14612)DuPont CorporationDefense Advanced Research Projects Agency/U.S. Navy - Office of Naval Research (Contract N00014-87-K-0825)American Telephone and TelegraphDigital Equipment CorporationNational Science Foundation (Grant MIP-88-58764

    A unified approach for the synthesis of self-testable finite state machines

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    Conventionally self-test hardware is added after synthesis is completed. For highly sequential circuits like controllers this design method either leads to high hardware overheads or compromises fault coverage. In this paper we outline a unified approach for considering self-test hardware like pattern generators and signature registers during synthesis. Three novel target structures are presented, and a method for designing parallel self-testable circuits is discussed in more detail. For a collection of benchmark circuits we show that hardware overheads for self-testable circuits can be significantly reduced this way without sacrificing testability

    Optimized synthesis of self-testable finite state machines

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    A synthesis procedure for self-testable finite state machines is presented. Testability comes under consideration when the behavioral description of the circuit is being transformed into a structural description. To this end, a novel state encoding algorithm, as well as a modified self-test architecture, is developed. Experimental results show that this approach leads to a significant reduction of hardware overhead. Self-testing circuits generally employ linear feedback shift registers for pattern generation. The impact of choosing a particular feedback polynomial on the state encoding is discussed

    Custom Integrated Circuits

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    Contains reports on nine research projects.Analog Devices, Inc.International Business Machines CorporationJoint Services Electronics Program Contract DAAL03-89-C-0001U.S. Air Force - Office of Scientific Research Contract AFOSR 86-0164BDuPont CorporationNational Science Foundation Grant MIP 88-14612U.S. Navy - Office of Naval Research Contract N00014-87-K-0825American Telephone and TelegraphDigital Equipment CorporationNational Science Foundation Grant MIP 88-5876

    Custom Integrated Circuits

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    Contains reports on ten research projects.Analog Devices, Inc.IBM CorporationNational Science Foundation/Defense Advanced Research Projects Agency Grant MIP 88-14612Analog Devices Career Development Assistant ProfessorshipU.S. Navy - Office of Naval Research Contract N0014-87-K-0825AT&TDigital Equipment CorporationNational Science Foundation Grant MIP 88-5876

    Division-based versus general decomposition-based multiple-level logic synthesis

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    During the last decade, many different approaches have been proposed to solve the multiple-level synthesis problem with different minimum functionally complete systems of primitive logic blocks. The most popular of them is the division-based approach. However, modem microelectronic technology provides a large variety of building blocks which considerably differ from those typically considered. The traditional methods are therefore not suitable for synthesis with many modem building blocks. Furthermore, they often fail to find global optima for complex designs and leave unconsidered some important design aspects. Some of their weaknesses can be eliminated without leaving the paradigm they are based on, other ones are more fundamental. A paradigm which enables efficient exploitation of the opportunities created by the microelectronic technology is the general decomposition paradigm. The aim of this paper is to analyze and compare the general decomposition approach and the division-based approach. The most important advantages of the general decomposition approach are its generality (any network of any building blocks can be considered) and totality (all important design aspects can be considered) as well as handling the incompletely specified functions in a natural way. In many cases, the general decomposition approach gives much better results than the traditional approaches
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