HybMT: Hybrid Meta-Predictor based ML Algorithm for Fast Test Vector Generation

Testing an integrated circuit (IC) is a highly compute-intensive process. For today's complex designs, tests for many hard-to-detect faults are typically generated using deterministic test generation (DTG) algorithms. Machine Learning (ML) is being increasingly used to increase the test coverage and decrease the overall testing time. Such proposals primarily reduce the wasted work in the classic Path Oriented Decision Making (PODEM) algorithm without compromising on the test quality. With variants of PODEM, many times there is a need to backtrack because further progress cannot be made. There is thus a need to predict the best strategy at different points in the execution of the algorithm. The novel contribution of this paper is a 2-level predictor: the top level is a meta predictor that chooses one of several predictors at the lower level. We choose the best predictor given a circuit and a target net. The accuracy of the top-level meta predictor was found to be 99\%. This leads to a significantly reduced number of backtracking decisions compared to state-of-the-art ML-based and conventional solutions. As compared to a popular, state-of-the-art commercial ATPG tool, our 2-level predictor (HybMT) shows an overall reduction of 32.6\% in the CPU time without compromising on the fault coverage for the EPFL benchmark circuits. HybMT also shows a speedup of 24.4\% and 95.5\% over the existing state-of-the-art (the baseline) while obtaining equal or better fault coverage for the ISCAS'85 and EPFL benchmark circuits, respectively.Comment: 9 pages, 7 figures and 7 tables. Changes from the previous version: We performed more experiments with different regressor models and also proposed a new neural network model, HybNN. We report the results for the EPFL benchmark circuits (most recent and large) and compare our results against a popular commercial ATPG too

VeriSFQ - A Semi-formal Verification Framework and Benchmark for Single Flux Quantum Technology

In this paper, we propose a semi-formal verification framework for single-flux quantum (SFQ) circuits called VeriSFQ, using the Universal Verification Methodology (UVM) standard. The considered SFQ technology is superconducting digital electronic devices that operate at cryogenic temperatures with active circuit elements called the Josephson junction, which operate at high switching speeds and low switching energy - allowing SFQ circuits to operate at frequencies over 300 gigahertz. Due to key differences between SFQ and CMOS logic, verification techniques for the former are not as advanced as the latter. Thus, it is crucial to develop efficient verification techniques as the complexity of SFQ circuits scales. The VeriSFQ framework focuses on verifying the key circuit and gate-level properties of SFQ logic: fanout, gate-level pipeline, path balancing, and input-to-output latency. The combinational circuits considered in analyzing the performance of VeriSFQ are: Kogge-Stone adders (KSA), array multipliers, integer dividers, and select ISCAS'85 combinational benchmark circuits. Methods of introducing bugs into SFQ circuit designs for verification detection were experimented with - including stuck-at faults, fanout errors, unbalanced paths, and functional bugs like incorrect logic gates. In addition, we propose an SFQ verification benchmark consisting of combinational SFQ circuits that exemplify SFQ logic properties and present the performance of the VeriSFQ framework on these benchmark circuits. The portability and reusability of the UVM standard allows the VeriSFQ framework to serve as a foundation for future SFQ semi-formal verification techniques.Comment: 7 pages, 6 figures, 4 tables; submitted, accepted, and presented at ISQED 2019 (20th International Symposium on Quality Electronic Design) on March 7th, 2019 in Santa Clara, CA, US

Immunotronics - novel finite-state-machine architectures with built-in self-test using self-nonself differentiation

A novel approach to hardware fault tolerance is demonstrated that takes inspiration from the human immune system as a method of fault detection. The human immune system is a remarkable system of interacting cells and organs that protect the body from invasion and maintains reliable operation even in the presence of invading bacteria or viruses. This paper seeks to address the field of electronic hardware fault tolerance from an immunological perspective with the aim of showing how novel methods based upon the operation of the immune system can both complement and create new approaches to the development of fault detection mechanisms for reliable hardware systems. In particular, it is shown that by use of partial matching, as prevalent in biological systems, high fault coverage can be achieved with the added advantage of reducing memory requirements. The development of a generic finite-state-machine immunization procedure is discussed that allows any system that can be represented in such a manner to be "immunized" against the occurrence of faulty operation. This is demonstrated by the creation of an immunized decade counter that can detect the presence of faults in real tim

The dynamic neural field approach to cognitive robotics

This tutorial presents an architecture for autonomous robots to generate behavior in joint action tasks. To efficiently interact with another agent in solving a mutual task, a robot should be endowed with cognitive skills such as memory, decision making, action understanding and prediction. The proposed architecture is strongly inspired by our current understanding of the processing principles and the neuronal circuitr underlying these functionalities in the primate brain. As a mathematical framework, we use a coupled system of dynamic neural fields, each representing the basic functionality of neuronal populations in different brain areas. It implements goal-directed behavior in joint action as a continuous process that builds on the interpretation of observed movements in terms of the partner’s action goal. We validate the architecture in two experimental paradigms: (1) a joint search task; (2) a reproduction of an observed or inferred end state of a grasping–placing sequence. We also review some of the mathematical results about dynamic neural fields that are important for the implementation work.European Commission fp6-IST2, project no. 00374

AUTOMATIC TEST GENERATION BASED ON CONSTRAINTS

It seems to be a very hard task to enhance the properties of widespreadly used automatic test pattern generation algorithms. Experiences show that achievements are sometimes not worth the effort. In the authors' opinion this fact stems from the basically 'algorithm oriented' nature of research made in the past. A new experimental framework is presented for the problem, considering network representation and search control algorithms as equally important parts. The network is represented by object- oriented data-flow networks, the search control algorithm is based on constraint satisfaction, and a special kind of dependency directed backtracking which we call constraint slackening. Similar methods were proved to be very useful in automatic system diagnosis by DAVIS (1985) and others, although have not been introduced to testing yet. This paper summarises the basic notions of constraint satisfaction, the potential advantages of using it for building test generation systems, and shows implementational details of a test generation system, based on constraints. Experiences of the run-time tests show that constraint-based test generation can be highly efficient

Resilience-Performance Tradeoff Analysis of a Deep Neural Network Accelerator

Nowadays, Deep Neural Networks (DNNs) are one of the most computationally-intensive algorithms because of the (i) huge amount of data to be transferred from/to the memory, and (ii) the huge amount of matrix multiplications to compute. These issues motivate the design of custom DNN hardware accelerators. These accelerators are widely used for low-latency safety-critical applications such as object detection in autonomous cars. Safety-critical applications have to be resilient with respect to hardware faults and Deep Learning (DL) accelerators are subjected to hardware faults that can cause functional failures, potentially leading to catastrophic consequences. Although DNNs possess a certain level of intrinsic resilience, it varies depending on the hardware on which they are run. The intent of the paper is to assess the resilience of a systolic-array-based DNN accelerator in the presence of hardware faults, in order to identify the architectural parameters that may mainly impact the DNN resilience