Specifications and programs for computer software validation

Three software products developed during the study are reported and include: (1) FORTRAN Automatic Code Evaluation System, (2) the Specification Language System, and (3) the Array Index Validation System

Testing self-timed circuits using partial scan

Journal ArticleThis paper presents a partial scan method for testing both the control and data path parts of macromodule based self-timed circuits for stuck-at faults. Compared with other proposed test methods for testing control paths in self-timed circuits, this technique offers better fault coverage under a stuck-at input model than methods using self-checking properties, and requires fewer storage elements to be made scanable than full scan approaches with similar fault coverage. A new method is proposed to test the sequential network in the control path in this partial scan environment. The partial scan approach has also been applied to datapaths, where structural analysis is used to select which latches should be made scannable to break cycles in the circuit. Experimental data is presented to show that high fault coverage is possible using this method with only a subset of storage elements in the control and data paths being made scannable

Testing mixed-signal cores: a practical oscillation-based test in an analog macrocell

A formal set of design decisions can aid in using oscillation-based test (OBT) for analog subsystems in SoCs. The goal is to offer designers testing options that do not have significant area overhead, performance degradation, or test time. This work shows that OBT is a potential candidate for IP providers to use in combination with functional test techniques. We have shown how to modify the basic concept of OBT to come up with a practical method. Using our approach, designers can use OBT to pave the way for future developments in SoC testing, and it is simple to extend this idea to BIST.European Union 2635

Synthesis of multiple-input change asynchronous finite state machines

Asynchronous finite state machines (AFSMS) have been limited because multiple-input changes have been disallowed. In this paper, we present an architecture and synthesis system to overcome this limitation. The AFSM marks potentially hazardous state transitions, and prevents output during them. A synthesis tool to create the AFS M incorporates novel algorithms to detect the hazardous states

Feedback and generalized logic

Although the distinction between software and hardware is a posteriori, there is an a priori distinction that masquerades as the software—hardware distinction. This is the distinction between procedure interconnection, the semantics of flow chart diagrams, which is known to be described by the regular expression calculus; and system interconnection, the semantics of network diagrams, which is described by a certain logical calculus, dual to a calculus of regular expressions. This paper presents a proof of the duality in a special case, and gives the interpretation of the logical calculus for sequential machine interconnection. A minimal realization theorem for feedback systems is proved, which specializes to known open loop minimal realization theorems

Sequential Circuit Design for Embedded Cryptographic Applications Resilient to Adversarial Faults

In the relatively young field of fault-tolerant cryptography, the main research effort has focused exclusively on the protection of the data path of cryptographic circuits. To date, however, we have not found any work that aims at protecting the control logic of these circuits against fault attacks, which thus remains the proverbial Achilles’ heel. Motivated by a hypothetical yet realistic fault analysis attack that, in principle, could be mounted against any modular exponentiation engine, even one with appropriate data path protection, we set out to close this remaining gap. In this paper, we present guidelines for the design of multifault-resilient sequential control logic based on standard Error-Detecting Codes (EDCs) with large minimum distance. We introduce a metric that measures the effectiveness of the error detection technique in terms of the effort the attacker has to make in relation to the area overhead spent in implementing the EDC. Our comparison shows that the proposed EDC-based technique provides superior performance when compared against regular N-modular redundancy techniques. Furthermore, our technique scales well and does not affect the critical path delay

A partial scan methodology for testing self-timed circuits

technical reportThis paper presents a partial scan method for testing control sections of macromodule based self-timed circuits for stuck-at faults. In comparison with other proposed test methods for self-timed circuits, this technique offers better fault coverage than methods using self-checking techniques, and requires fewer storage elements to be made scannable than full scan approaches with similar fault coverage. A new method is proposed to test the sequential network in this partial scan environment. Experimental data is presented to show that high fault coverage is possible using this method with only a subset of storage elements being made scannable

Hazards, Critical Races, and Metastability

The various modes of failure of asynchronous sequential logic circuits due to timing problems are considered. These are hazards, critical races and metastable states. It is shown that there is a mechanism common to all forms of hazards and to metastable states. A similar mechanism, with added complications, is shown to characterize critical races. Means for defeating various types of hazards and critical races through the use of one sided delay constraints are introduced. A method is described for determining from a flow table situations in which metastable states may be entered. A circuit technique for defeating metastability problems in self timed systems is presented. It is shown that the use of simulation for verifying the correctness of a circuit with given bounds on the branch delays cannot be relied upon to expose all timing problems. An example is presented that refutes the conjecture that replacing pure delays with inertial delays can only eliminate glitches. Key Words asynchronous, critical race, delays, dynamic hazards, essential hazards, inertial delays, metastability, pure delays, sequential logic, timing problems, timing simulation