Multi-stage noise shaping (MASH) delta-sigma modulators for wideband and multi-standard applications

Imperial Users onl

Time-encoding analog-to-digital converters : bridging the analog gap to advanced digital CMOS? Part 2: architectures and circuits

The scaling of CMOS technology deep into the nanometer range has created challenges for the design of highperformance analog ICs: they remain large in area and power consumption in spite of process scaling. Analog circuits based on time encoding [1], [2], where the signal information is encoded in the waveform transitions instead of its amplitude, have been developed to overcome these issues. While part one of this overview article [3] presented the basic principles of time encoding, this follow-up article describes and compares the main time-encoding architectures for analog-to-digital converters (ADCs) and discusses the corresponding design challenges of the circuit blocks. The focus is on structures that avoid, as much as possible, the use of traditional analog blocks like operational amplifiers (opamps) or comparators but instead use digital circuitry, ring oscillators, flip-flops, counters, an so on. Our overview of the state of the art will show that these circuits can achieve excellent performance. The obvious benefit of this highly digital approach to realizing analog functionality is that the resulting circuits are small in area and more compatible with CMOS process scaling. The approach also allows for the easy integration of these analog functions in systems on chip operating at "digital" supply voltages as low as 1V and lower. A large part of the design process can also be embedded in a standard digital synthesis flow

Extended-Range Second-Order Incremental Sigma-Delta ADC

A single-stage two-steps Extended-Range Second-Order Incremental ADC in 0.13um CMOS technology is presented here which achieves a Signal-to-Noise and Distortion Ratio (SNDR) as large as 73 dB. The proposed architecture of Extended-Range ADC based on Second-order multi-bit CIFF Incremental ADC reuses the IADC structure for coarse (input signal) as well as fine (residue) quantization without need of employment of explicit second ADC thereby minimizing power consumption and area occupancy. With a clock frequency of 80 MHz, the complete ERADC achieves in extracted simulation a peak SNDR of 73 dB at a data rate of 3.2 MS/s (25 clock cycles per conversion).A single-stage two-steps Extended-Range Second-Order Incremental ADC in 0.13um CMOS technology is presented here which achieves a Signal-to-Noise and Distortion Ratio (SNDR) as large as 73 dB. The proposed architecture of Extended-Range ADC based on Second-order multi-bit CIFF Incremental ADC reuses the IADC structure for coarse (input signal) as well as fine (residue) quantization without need of employment of explicit second ADC thereby minimizing power consumption and area occupancy. With a clock frequency of 80 MHz, the complete ERADC achieves in extracted simulation a peak SNDR of 73 dB at a data rate of 3.2 MS/s (25 clock cycles per conversion)

Cascaded feedforward sigma-delta modulator for wide bandwidth applications

[[abstract]]A new sigma-delta modulator architecture for wide bandwidth application called cascaded feedforward sigma-delta modulator is proposed in this paper. This sigma-delta modulator is similar to the conventional feedforward summation sigma-delta modulator. The conventional feedforward summation sigma-delta modulator uses multi-bit feedback and therefore a multi-bit digital-to-analog converter (DAC) is needed. Due to the nonlinearity of the multi-bit DAC, it is difficult to be implemented. On the other hand the proposed approach uses 1.5-bit feedback, and thus the implementation of the analog part is much easier than the conventional one. Since the 1.5-bit feedback will cause coarse quantization errors, error cancellation must be done in the digital part. Here an adaptive filter with least mean square algorithm is used to reduce the nonlinear effect. The simulation results show that the signal to noise plus distortion ratio (SNDR) of this architecture is very close to that of the ideal feedforward summation sigma-delta modulator with multi-bit DAC and can be used for the wide bandwidth application.[[notice]]補正完

Precise linear signal generation with nonideal components and deterministic dynamic element matching

A dynamic element matching (DEM) approach to ADC testing is introduced. Two variants of this method are introduced and compared; a deterministic DEM method and a random DEM method. With both variants, a highly non-ideal DAC is used to generate an excitation for a DUT that has effective linearity that far exceeds that of the DAC. Simulation results show that both methods can be used for testing of ADCs. The deterministic DEM (DDEM) offers potential for a substantial reduction in the number of samples when compared with a random DEM approach with the same measurement accuracy. It is shown that the concept of usinf DEM for signal generation in a test environment finds applications well-beyond ADC testing. The DDEM approach offers potential for use in both production test and BIST environments