Design of Low Power and Power Scalable Pipelined ADC Using Current Modulated Power Scale

This work represents a power scalable pipelined ADC, which achieves low power variation depends upon the sampling rate and enables variation in throughput. The keys to power scalability at high sampling rates were current modulation-based architecture and the development of novel rapid power-on Op-amp, which can completely and quickly power on/off by the feedback approach. The result achieved in this design is as high as 50 Msps and as low as 1 ksps, keeping some important parameters of ADC as ENOB and SNDR are almost constant. Power variation in ADC has a flexible range from 7.5 µW to 17 mW, which is lower power consumption than previous works

Calibration techniques in nyquist A/D converters

In modern systems signal processing is performed in the digital domain. Contrary to analog circuits, digital signal processing offers more robustness, programmability, error correction and storage possibility. The trend to shift the A/D converter towards the input of the system requires A/D converters with more dynamic range and higher sampling speeds. This puts extreme demands on the A/D converter and potentially increases the power consumption. Calibration Techniques in Nyquist A/D Converters analyses different A/D-converter architectures with an emphasis on the maximum achievable power efficiency. It is shown that in order to achieve high speed and high accuracy at high power efficiency, calibration is required. Calibration reduces the overall power consumption by using the available digital processing capability to relax the demands on critical power hungry analog components. Several calibration techniques are analyzed. The calibration techniques presented in this book are applicable to other analog-to-digital systems, such as those applied in integrated receivers. Further refinements will allow using analog components with less accuracy, which will then be compensated by digital signal processing. The presented methods allow implementing this without introducing a speed or power penalty

Low power high speed and high accuracy design methodologies for pipeline Analog-to-Digital converters

Different aspects of power optimization of a high-speed, high-accuracy pipeline Analog-to-Digital Converters (ADCs) are considered to satisfy the current and future needs of portable communication devices. First power optimized design strategies for the amplifiers are introduced. Closed form expressions of power w.r.t settling requirements are presented to facilitate a fair comparison and selection of the amplifier structure. Next a new low offset dynamic comparator has been designed. Simulation based sensitivity analysis is performed to demonstrate the robustness of the new comparator with respect to stray capacitances, common mode voltage errors and timing errors. With simplified amplifier power model along with the use of dynamic comparators, a method to optimize the power consumption of a pipeline ADC with kT/C noise constraint is also developed. The total power dependence on capacitor scaling and stage resolution is investigated for a near-optimal solution.;After considering the power requirements of a pipeline ADC, design and statistical modeling of over-range protection requirements is investigated. Closed form statistical expressions for the over-range requirements are developed to assist in the allocation of the error budgets to different pipeline blocks. A new over-range protection algorithm is also developed that relaxes the amplifier design and power requirements.;Finally, two new CMOS Schmitt trigger designs are proposed which can be used as clock inputs for the pipeline ADC. In the new designs, sizing of the feedback inverters is used for independent trip point control. The new designs have also a modest reduction in sensitivity to process variations along with immunity to the kick-back noise without the addition of path delay

Design and debugging of multi-step analog to digital converters

With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. The trend of increasing integration level for integrated circuits has forced the A/D converter interface to reside on the same silicon in complex mixed-signal ICs containing mostly digital blocks for DSP and control. However, specifications of the converters in various applications emphasize high dynamic range and low spurious spectral performance. It is nontrivial to achieve this level of linearity in a monolithic environment where post-fabrication component trimming or calibration is cumbersome to implement for certain applications or/and for cost and manufacturability reasons. Additionally, as CMOS integrated circuits are accomplishing unprecedented integration levels, potential problems associated with device scaling – the short-channel effects – are also looming large as technology strides into the deep-submicron regime. The A/D conversion process involves sampling the applied analog input signal and quantizing it to its digital representation by comparing it to reference voltages before further signal processing in subsequent digital systems. Depending on how these functions are combined, different A/D converter architectures can be implemented with different requirements on each function. Practical realizations show the trend that to a first order, converter power is directly proportional to sampling rate. However, power dissipation required becomes nonlinear as the speed capabilities of a process technology are pushed to the limit. Pipeline and two-step/multi-step converters tend to be the most efficient at achieving a given resolution and sampling rate specification. This thesis is in a sense unique work as it covers the whole spectrum of design, test, debugging and calibration of multi-step A/D converters; it incorporates development of circuit techniques and algorithms to enhance the resolution and attainable sample rate of an A/D converter and to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover and compensate for the errors continuously. The power proficiency for high resolution of multi-step converter by combining parallelism and calibration and exploiting low-voltage circuit techniques is demonstrated with a 1.8 V, 12-bit, 80 MS/s, 100 mW analog to-digital converter fabricated in five-metal layers 0.18-µm CMOS process. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. Microscopic particles present in the manufacturing environment and slight variations in the parameters of manufacturing steps can all lead to the geometrical and electrical properties of an IC to deviate from those generated at the end of the design process. Those defects can cause various types of malfunctioning, depending on the IC topology and the nature of the defect. To relive the burden placed on IC design and manufacturing originated with ever-increasing costs associated with testing and debugging of complex mixed-signal electronic systems, several circuit techniques and algorithms are developed and incorporated in proposed ATPG, DfT and BIST methodologies. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. With the use of dedicated sensors, which exploit knowledge of the circuit structure and the specific defect mechanisms, the method described in this thesis facilitates early and fast identification of excessive process parameter variation effects. The expectation-maximization algorithm makes the estimation problem more tractable and also yields good estimates of the parameters for small sample sizes. To allow the test guidance with the information obtained through monitoring process variations implemented adjusted support vector machine classifier simultaneously minimize the empirical classification error and maximize the geometric margin. On a positive note, the use of digital enhancing calibration techniques reduces the need for expensive technologies with special fabrication steps. Indeed, the extra cost of digital processing is normally affordable as the use of submicron mixed signal technologies allows for efficient usage of silicon area even for relatively complex algorithms. Employed adaptive filtering algorithm for error estimation offers the small number of operations per iteration and does not require correlation function calculation nor matrix inversions. The presented foreground calibration algorithm does not need any dedicated test signal and does not require a part of the conversion time. It works continuously and with every signal applied to the A/D converter. The feasibility of the method for on-line and off-line debugging and calibration has been verified by experimental measurements from the silicon prototype fabricated in standard single poly, six metal 0.09-µm CMOS process

Design of a Cost-Efficient Reconfigurable Pipeline ADC

Power budget is very critical in the design of battery-powered implantable biomedical instruments. High speed, high resolution and low power usually cannot be achieved at the same time. Therefore, a tradeoff must be made to compromise every aspect of those features. As the main component of the bioinstrument, high conversion rate, high resolution ADC consumes most of the power. Fortunately, based on the operation modes of the bioinstrument, a reconfigurable ADC can be used to solve this problem. The reconfigurable ADC will operate at 10-bit 40 MSPS for the diagnosis mode and at 8-bit 2.5 MSPS for the monitor mode. The ADC will be completely turned off if no active signal comes from sensors or if an off command is received from the antenna. By turning off the sample hold stage and the first two stages of the pipeline ADC, a significant power saving is achieved. However, the reconfigurable ADC suffers from two drawbacks. First, the leakage signals through the extra off-state switches in the third stage degrade the performance of the data converter. This situation tends to be even worse for high speed and high-resolution applications. An interference elimination technique has been proposed in this work to solve this problem. Simulation results show a significant attenuation of the spurious tones. Moreover, the transistors in the OTA tend to operate in weak inversion region due to the scaling of the bias current. The transistor in subthreshold is very slow due to the small transit frequency. In order to get a better tradeoff between the transconductance efficiency and the transit frequency, reconfigurable OTAs and scalable bias technique are devised to adjust the operating point from weak inversion to moderate inversion. The figure of merit of the reconfigurable ADC is comparable to the previously published conventional pipeline ADCs. For the 10-bit, 40 MSPS mode, the ADC attains a 56.9 dB SNDR for 35.4 mW power consumption. For the 8-bit 2.5 MSPS mode, the ADC attains a 49.2 dB SNDR for 7.9 mW power consumption. The area for the core layout is 1.9 mm2 for a 0.35 micrometer process

Sampled charge reuse for power reduction in switched capacitor data converters

Advances in semiconductor fabrication have enabled the shrinking of digital systems dramatically over the years. Although digital circuitry benefits tremendously from the constant shrinking of the device sizes, the benefits for analog circuits are not quite so dramatic. Low power is of critical importance in all mobile devices. Any reduction in power in the embedded analog-to-digital converters (ADCs) in such devices can help prolong the battery life. A technique is proposed that can be used to reduce power dissipation in ADCs that use switched-capacitor gain stages. It is shown for a pipeline ADC that the signal charge stored across the feedback capacitor from the first stage can be reused in the second stage at the end of the first stage\u27s amplify phase. The extra overhead of an extra capacitor is justified by the power savings of the proposed scheme;A well known approach for reducing the power dissipation in pipelined ADCs is the scaling down of capacitors progressively down the pipeline stream. The proposed technique combines the scaling of the capacitors with charge reuse. This combination inherits the power saving benefits of capacitor scaling and adds to the power saving by sharing the capacitor in two consecutive stages. Due to the highest power budget allocated to the first two stages, the sharing 2 is limited to the first two stages. Additionally, it is shown that the charge reuse results in reducing the total capacitive load driven by a stage\u27s opamp, potentially reducing the current requirements of the opamp;The proposed technique has been adapted for use in cyclic ADCs. The proposed technique reuses the charge from the first cycle in the next. This approach helps to reduce the die area of the capacitors in the switched capacitor network by up to 50%. Consequently, the power consumption requirement of the operational amplifier can be reduced. This is achieved while maintaining the thermal noise performance and conversion rate of the conventional structure. A 10-bit, 2.3MHz cyclic ADC using the new structure is implemented in 0.5mum CMOS. Spectre simulation results show a THD of -76dB and SFDR of -74.95dB

A very low power and low signal 5 bit 50 M samples/s double sampling pipelined ADC for Monolithic Active Pixel Sensors in high energy physics and biomedical imaging applications

International audienc

Design of a low power switched-capacitor pipeline analog-to-digital converter

An Analog to Digital Converter (ADC) is a circuit which converts an analog signal into digital signal. Real world is analog, and the data processed by the computer or by other signal processing systems is digital. Therefore, the need for ADCs is obvious. In this thesis, several novel designs used to improve ADCs operation speed and reduce ADC power consumption are proposed. First, a high speed switched source follower (SSF) sample and hold amplifier without feedthrough penalty is implemented and simulated. The SSF sample and hold amplifier can achieve 6 Bit resolution with sampling rate at 10Gs/s. Second, a novel rail-to-rail time domain comparator used in successive approximation register ADC (SAR ADC) is implemented and simulated. The simulation results show that the proposed SAR ADC can only consume 1.3 muW with a 0.7 V power supply. Finally, a prototype pipeline ADC is implemented and fabricated in an IBM 90nm CMOS process. The proposed design is validated using measurement on a fabricated silicon IC, and the proposed 10-bit ADC achieves a peak signal-to-noise- and-distortion-ratio (SNDR) of 47 dB. This SNDR translates to a figure of merit (FOM) of 2.6N/conversion-step with a 1.2 V power supply

A low power and low signal 4 bit 50MS/s double sampling pipelined ADC for monolithie active pixel sensors

A 4 bit very low power and low incoming signal analog to digital converter (ADC) using a double sampling switched capacitor technique, designed for use in CMOS monolithic active pixels sensor readout, has been implemented in 0.35μm CMOS technology. A non-resetting sample and hold stage is integrated to amplify the incoming signal by 4. This first stage compensates both the amplifier offset effect and the input common mode voltage fluctuations. The converter is composed of a 2.5 bit pipeline stage followed by a 2 bit flash stage. This prototype consists of 4 ADC double-channels; each one is sampling at 50MS/s and dissipates only 2.6mW at 3.3V supply voltage. A bias pulsing stage is integrated in the circuit. Therefore, the analog part is switched OFF or ON in less than 1μs. The size for the layout is 80μm*0.9mm. This corresponds to the pitch of 4 pixel columns, each one is 20μm wide

A low power and low signal 4 bit 50MS/s double sampling pipelined ADC for Monolithic Active Pixel Sensors

International audienceA 4 bit very low power and low incoming signal analog to digital converter (ADC) using a double sampling switched capacitor technique, designed for use in CMOS monolithic active pixels sensor readout, has been implemented in 0.35μm CMOS technology. A non-resetting sample and hold stage is integrated to amplify the incoming signal by 4. This first stage compensates both the amplifier offset effect and the input common mode voltage fluctuations. The converter is composed of a 2.5 bit pipeline stage followed by a 2 bit flash stage. This prototype consists of 4 ADC double-channels; each one is sampling at 50MS/s and dissipates only 2.6mW at 3.3V supply voltage. A bias pulsing stage is integrated in the circuit. Therefore, the analog part is switched OFF or ON in less than 1μs. The size for the layout is 80μm*0.9mm. This corresponds to the pitch of 4 pixel columns, each one is 20μm wide