12,491 research outputs found

    Color Engineering of Silicon Nitride Surfaces to Characterize the Polydopamine Refractive Index

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    A simple methodology to generate polydopamine (PDA) surfaces featured with color due to thin-film interference phenomena is presented. It is based on depositing ultra-thin films of polydopamine on a Si/Si 3 N 4 wafer that exhibits an interferential reflectance maximum right at the visible/UV boundary (∼400 nm). Therefore, a small deposit of PDA modifies the optical path, in such manner that the wavelength of the maximum of reflectance red shifts. Because the human eye is very sensitive to any change of the light spectral distribution at the visible region, very small film thickness changes (∼30 nm) are enough to notably modify the perceived color. Consequently, a controlled deposit of PDA, tune the color along the whole visible spectrum. Additionally, good quality of PDA deposits allowed us to determine the refractive index of polydopamine by ellipsometry spectroscopy. This data can be crucial in confocal skin microscopic techniques, presently used in diagnosis of skin tumors.Fil: Vega Moreno, Milena Amparo. Universidad de Salamanca; EspañaFil: Martín del Valle, Eva M.. Universidad de Salamanca; EspañaFil: Perez, Maximiliano Sebastian. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad Tecnológica Nacional. Facultad Regional Haedo; ArgentinaFil: Pecharromán, Carlos. Consejo Superior de Investigaciones Científicas. Instituto de Ciencia de los Materiales de Barcelona; EspañaFil: Marcelo, Gema. Universidad de Salamanca; Españ

    In Situ Growth Rate Measurement of Selective LPCVD of Tungsten

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    The reflectance measurement during the selective deposition of W on Si covered with an insulator grating is proven tobe a convenient method to monitor the W deposition. The reflectance change during deposition allows the in situ measurementof the deposition rate. The influence of surface roughening due to either the W growth or an etching pretreatmentof the wafer is modeled, as well as the effect of selectivity loss and lateral overgrowth

    Analysis of the land surface heterogeneity and its impact on atmospheric variables and the aerodynamic and thermodynamic roughness lengths

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    The land surface heterogeneity has a very significant impact on atmospheric variables (air temperature T-a, wind speed u, and humidity q), the aerodynamic roughness length z(0m), thermodynamic roughness length z(0h), and the excess resistance to heat transfer kB(-1). First, in this study the land surface heterogeneity has been documented through the comparison of surface reflectance r(0), surface temperature T-0, net radiation flux R-n, and sensible heat flux H partitioning over the different land cover types in the experimental areas of the Global Energy and Water Cycle Experiment (GEWEX) Asian Monsoon Experiment on the Tibetan Plateau (GAME/Tibet), the Coordinated Enhanced Observing Period (CEOP) Asia-Australia Monsoon Project on the Tibetan Plateau (CAMP/Tibet), the Heihe Basin Field Experiment (HEIFE), the Arid Environment Comprehensive Monitoring Plan, 95 (AECMP' 95), and the Dun Huang Experiment (DHEX). The results show that the surface heterogeneity was very significant in the areas of the HEIFE, the AECMP' 95, and the DHEX and that it was less significant in the areas of CAMP/Tibet and GAME/Tibet. Second, the vertical profiles of T-a, u, and q in the near-surface layer and above the blending height z(b) have been analyzed using the atmospheric boundary layer (ABL) tower data, radiosonde data, and tethered balloon data observed during the HEIFE, the DHEX, and the CAMP/Tibet. The results show that the land surface heterogeneity leads in the near-surface layer to different vertical profiles of u, T-a, and q overlying the surfaces of the Gobi and the oasis in the areas of the HEIFE and DHEX. The values of u, T-a, and q become well mixed above a height of about 300 m at the HEIFE and 150 m at the DHEX. z(0m), z(0h), and kB(-1) over the different land surfaces have also been determined in this study. The results show that the land surface heterogeneity leads to different aerodynamic and thermodynamic parameters over the areas of the HEIFE, the AECMP' 95, and the GAME/Tibe

    Martian surface weathering studies

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    The nature of the Martian surface was characterized by means of its reflectance properties. The Mariner 9 photography was used to establish terrain units which were crossed by the Mariner 6 and 7 paths. The IR reflectance measured by the IR spectrometers on these spacecraft was to be used to indicate the nature of the surface within these units. There is an indication of physical size and/or compositional variation between units but too many natural parameters can vary (size, shape, composition, adsorbed phases, reradiation, atmospheric absorbtion, temperature gradients, etc.) to be certain what effect is causing those variations observed. It is suggested that the characterization could be fruitfully pursued by a group which was dedicated to peeling back the layers of minutia affecting IR reflectance

    Quasi-specular reflection from particulate media

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    Specular reflection is known to play an important role in many fields of scattering applications, e.g., in remote sensing, computer graphics, optimization of visual appearance of industrial products. Usually it can be assumed that the object has a solid surface and that the properties of the surface will dictate the behavior of the specular component. In this study I will show that media consisting of wavelength-sized particles can also have a quasi-specular reflection in cases where there is ordered structure in the media. I will also show that the quasi-specular reflection in particulate media is more than just a surface effect, and planar particle arrangement below the very surface can give arise to quasi-specular reflection. This study shows that the quasi-specular reflection may contribute in some cases in the backscattering direction, together with coherent backscattering and shadow-hiding effects

    A comparative study of image processing thresholding algorithms on residual oxide scale detection in stainless steel production lines

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    The present work is intended for residual oxide scale detection and classification through the application of image processing techniques. This is a defect that can remain in the surface of stainless steel coils after an incomplete pickling process in a production line. From a previous detailed study over reflectance of residual oxide defect, we present a comparative study of algorithms for image segmentation based on thresholding methods. In particular, two computational models based on multi-linear regression and neural networks will be proposed. A system based on conventional area camera with a special lighting was installed and fully integrated in an annealing and pickling line for model testing purposes. Finally, model approaches will be compared and evaluated their performance..Universidad de Málaga. Campus de Excelencia Internacional Andalucía Tech

    Reflectance of Polytetrafluoroethylene (PTFE) for Xenon Scintillation Light

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    Gaseous and liquid xenon particle detectors are being used in a number of applications including dark matter search and neutrino-less double beta decay experiments. Polytetrafluoroethylene (PTFE) is often used in these detectors both as electrical insulator and as a light reflector to improve the efficiency of detection of scintillation photons. However, xenon emits in the vacuum ultraviolet wavelength region (175 nm) where the reflecting properties of PTFE are not sufficiently known. In this work we report on measurements of PTFE reflectance, including its angular distribution, for the xenon scintillation light. Various samples of PTFE, manufactured by different processes (extruded, expanded, skived and pressed) have been studied. The data were interpreted with a physical model comprising both specular and diffuse reflections. The reflectance obtained for these samples ranges from about 47% to 66% for VUV light. Fluoropolymers, namely ETFE, FEP and PFA were also measured
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